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    • 11. 发明授权
    • Low voltage data path in memory array
    • 存储器阵列中的低电压数据通路
    • US07450454B1
    • 2008-11-11
    • US11746126
    • 2007-05-09
    • Maciej BajkowskiHamed GhassemiHuy B. Nguyen
    • Maciej BajkowskiHamed GhassemiHuy B. Nguyen
    • G11C7/00
    • G11C7/1051G11C7/106G11C7/1069
    • A data path of a memory is from an array of the memory, through a sense amplifier, through NOR gates, through N channel transistors, and through a latch that provides an output. The sense amplifier provides complementary data to the NOR gates which provide an output to the N channel transistors. The NOR gates provide outputs to the latch. This has the affect of providing outputs to gates of one inverter and drains of another inverter. Additional P channel transistors are in series with the inverters of the latch. The P channel transistor that is in series with the inverters whose drains are receiving the signal is made to be nonconductive by the output of the NOR gate to block current flow to the N channel transistor that is providing the input to the latch. The blocking of the current reduces the amount of current that the N channel transistor has to sink. This enables the N channel transistor, even at a reduced voltage, to be sufficiently conductive to flip the state of the latch.
    • 存储器的数据路径来自存储器的阵列,通过读出放大器,通过NOR门,通过N沟道晶体管,以及通过提供输出的锁存器。 读出放大器向NOR门提供互补数据,这些数字向N沟道晶体管提供输出。 NOR门向锁存器提供输出。 这具有向一个逆变器的栅极和另一个逆变器的漏极提供输出的影响。 附加的P沟道晶体管与锁存器的反相器串联。 与漏极接收信号的反相器串联的P沟道晶体管被非门的输出导通,以阻止向提供输入到锁存器的N沟道晶体管的电流流动。 电流的阻塞减小了N沟道晶体管必须吸收的电流量。 这使得即使在降低的电压下,N沟道晶体管也能充分导通以翻转锁存器的状态。
    • 12. 发明申请
    • CIRCUIT FOR USE IN A MULTIPLE BLOCK MEMORY
    • 用于多个块存储器的电路
    • US20080186797A1
    • 2008-08-07
    • US11672279
    • 2007-02-07
    • Hamed GhassemiHuy B. Nguyen
    • Hamed GhassemiHuy B. Nguyen
    • G11C8/00
    • G11C7/1051G06F12/0893G11C7/106G11C8/12G11C2207/2245
    • A portion of a memory may include a first memory block, comprising a first memory cell coupled to a first memory data line, a second memory block, comprising a second memory cell coupled to a second memory data line, and a latch, having a first terminal and a second terminal. The portion of the memory may further include a first N-channel transistor, having a first current electrode coupled to the first terminal of the latch, having a second current electrode coupled to a first power supply voltage, and having a control electrode coupled to the first memory data line. The portion of the memory may further include a second N-channel transistor, having a first current electrode coupled to the first terminal of the latch, having a second current electrode coupled to the first power supply voltage, and having a control electrode coupled to the second memory data line.
    • 存储器的一部分可以包括第一存储器块,其包括耦合到第一存储器数据线的第一存储器单元,第二存储器块,包括耦合到第二存储器数据线的第二存储器单元,以及锁存器, 终端和第二终端。 存储器的部分还可以包括第一N沟道晶体管,其具有耦合到锁存器的第一端的第一电流电极,具有耦合到第一电源电压的第二电流电极,并且具有耦合到 第一个内存数据线。 存储器的部分还可以包括第二N沟道晶体管,其具有耦合到锁存器的第一端的第一电流电极,具有耦合到第一电源电压的第二电流电极,并且具有耦合到第一电源电压的控制电极 第二存储器数据线。