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    • 15. 发明授权
    • Apparatus and method for measuring minority carrier lifetimes in semiconductor materials
    • 用于测量半导体材料中少数载流子寿命的装置和方法
    • US06275060B1
    • 2001-08-14
    • US09283738
    • 1999-04-01
    • Richard K. AhrenkielSteven W. Johnston
    • Richard K. AhrenkielSteven W. Johnston
    • G01R3126
    • H01L22/14G01R31/2656G01R31/2831H01L2924/0002H01L2924/00
    • An apparatus for determining the minority carrier lifetime of a semiconductor sample includes a positioner for moving the sample relative to a coil. The coil is connected to a bridge circuit such that the impedance of one arm of the bridge circuit is varied as sample is positioned relative to the coil. The sample is positioned relative to the coil such that any change in the photoconductance of the sample created by illumination of the sample creates a linearly related change in the input impedance of the bridge circuit. In addition, the apparatus is calibrated to work at a fixed frequency so that the apparatus maintains a consistently high sensitivity and high linearity for samples of different sizes, shapes, and material properties. When a light source illuminates the sample, the impedance of the bridge circuit is altered as excess carriers are generated in the sample, thereby producing a measurable signal indicative of the minority carrier lifetimes or recombination rates of the sample.
    • 用于确定半导体样品的少数载流子寿命的装置包括用于相对于线圈移动样品的定位器。 线圈连接到桥式电路,使得当样品相对于线圈定位时,桥接电路的一个臂的阻抗变化。 样品相对于线圈定位,使得通过样品照明产生的样品的光电导的任何变化产生桥接电路的输入阻抗的线性相关变化。 此外,该装置被校准为以固定频率工作,使得该装置对于不同尺寸,形状和材料性质的样品保持一致的高灵敏度和高线性度。 当光源照亮样品时,桥接电路的阻抗随着在样品中产生过量载体而改变,从而产生指示样品的少数载流子寿命或复合速率的可测量信号。