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    • 11. 发明授权
    • In-situ end point detection for semiconductor wafer polishing
    • 用于半导体晶片抛光的原位终点检测
    • US06514775B2
    • 2003-02-04
    • US10008935
    • 2001-11-09
    • Haiguang ChenShing Lee
    • Haiguang ChenShing Lee
    • H01L2100
    • B24B37/013B24B49/12
    • The present invention relates to in-situ techniques for determining process end points in semiconductor wafer polishing processes. Generally, the technique involves utilizing a scanning inspection machine having multiple pair of lasers and sensors located at different angles for detecting signals caused to emanate from an inspected specimen. The detection techniques determine the end points by differentiating between various material properties within a wafer. An accompanying algorithm is used to obtain an end point detection curve that represents a composite representation of the signals obtained from each of the detectors of the inspection machine. This end point detection curve is then used to determine the process end point. Note that computation of the algorithm is performed during the polishing process so that the process end point can be determined without interruptions that diminish process throughputs.
    • 本发明涉及用于确定半导体晶片抛光工艺中的工艺终点的现场技术。 通常,该技术涉及利用具有多对激光器和位于不同角度的传感器的扫描检查机,以检测从检查样品发出的信号。 检测技术通过区分晶片内的各种材料特性来确定端点。 使用伴随的算法来获得终点检测曲线,其表示从检查机的每个检测器获得的信号的复合表示。 然后使用该终点检测曲线来确定过程终点。 请注意,在抛光过程中执行算法的计算,以便可以确定过程终点而不会导致过程吞吐量降低的中断。
    • 13. 发明授权
    • EAMR head having improved optical coupling efficiency
    • EAMR头具有改善的光耦合效率
    • US08325569B1
    • 2012-12-04
    • US13169720
    • 2011-06-27
    • Zhong ShiZhongyan WangShing LeeHongxing Yuan
    • Zhong ShiZhongyan WangShing LeeHongxing Yuan
    • G11B11/00
    • G11B5/6088G11B5/314G11B2005/0021
    • A method and system provide an EAMR transducer having an air-bearing surface (ABS) that resides near a media during use. The EAMR transducer includes a write pole, coil(s), a near field transducer (NFT), a waveguide, and a reflective grating. The write pole writes to a region of the media. The coil(s) energize the write pole. The NFT is proximate to the ABS and focuses the energy onto the media. The waveguide is configured to direct the energy from the laser toward the NFT at an incident angle with respect to the ABS. A first portion of the energy reflects off of the ABS at a reflected angle. The reflective grating receives the first portion of the energy at the reflected angle from the ABS and reflects a second portion of the energy toward the ABS. The NFT resides between at least part of the waveguide and the reflective grating.
    • 一种方法和系统提供具有在使用期间驻留在介质附近的空气轴承表面(ABS)的EAMR换能器。 EAMR传感器包括写极,线圈,近场换能器(NFT),波导和反射光栅。 写入磁极写入媒体的一个区域。 线圈使写入极点通电。 NFT靠近ABS,将能量聚焦在媒体上。 波导被配置为以相对于ABS的入射角将来自激光器的能量引向NFT。 能量的第一部分以反射角反射离开ABS。 反射光栅从ABS接收以反射角度的能量的第一部分,并将能量的第二部分反射向ABS。 NFT位于波导和反射光栅的至少一部分之间。
    • 14. 发明申请
    • SYSTEMS AND METHODS FOR MEASUREMENT OF A SPECIMEN WITH VACUUM ULTRAVIOLET LIGHT
    • 用真空紫外线灯测量样品的系统和方法
    • US20090279088A1
    • 2009-11-12
    • US12506019
    • 2009-07-20
    • John FieldenGary JanikShing Lee
    • John FieldenGary JanikShing Lee
    • G01J4/00
    • G03F7/70933G03F7/70916
    • Various systems for measurement of a specimen are provided. One system includes a first optical subsystem, which is disposed within a purged environment. The purged environment may be provided by a differential purging subsystem. The first optical subsystem performs measurements using vacuum ultraviolet light. This system also includes a second optical subsystem, which is disposed within a non-purged environment. The second optical subsystem performs measurements using non-vacuum ultraviolet light. Another system includes two or more optical subsystems configured to perform measurements of a specimen using vacuum ultraviolet light. The system also includes a purging subsystem configured to maintain a purged environment around the two or more optical subsystems. The purging subsystem is also configured to maintain the same level of purging in both optical subsystems. Some systems also include a cleaning subsystem configured to remove contaminants from a portion of a specimen prior to measurements at vacuum ultraviolet wavelengths.
    • 提供了用于测量样本的各种系统。 一个系统包括设置在净化环境中的第一光学子系统。 净化的环境可以由差动清洗子系统提供。 第一个光学子系统使用真空紫外线进行测量。 该系统还包括第二光学子系统,其被布置在非净化环境中。 第二光学子系统使用非真空紫外光进行测量。 另一系统包括两个或更多个配置成使用真空紫外光进行样本测量的光学子系统。 该系统还包括净化子系统,该净化子系统配置为保持围绕两个或更多个光学子系统的净化环境。 清洗子系统还被配置为在两个光学子系统中保持相同的清洗水平。 一些系统还包括清洁子系统,被配置为在真空紫外线波长测量之前从试样的一部分去除污染物。
    • 16. 发明申请
    • System and method for composting-free disposal of organic wastes
    • 无机废弃物处理有机废物的系统和方法
    • US20050155931A1
    • 2005-07-21
    • US10759947
    • 2004-01-15
    • Shing Lee
    • Shing Lee
    • B09B3/00C02F3/00C02F9/14C05F11/08
    • B09B3/00
    • A system for composting-free disposal of organic waste and method thereof included a heating apparatus, a pretreatment apparatus, and a decomposition apparatus. The heating apparatus heats the pretreatment apparatus and the decomposition apparatus. The organic waste is separated into a slurry and a surface oil-water mixed liquid by the pretreatment apparatus. Microbial enzymes and raw material are added into the slurry to become a mixture. The mixture is then decomposed and sterilized by the decomposition apparatus to become a composting-free organic fertilizer product. All these procedures can be carried out within 3 to 24 hours. The system and the method thereof provides an efficiently fast, space-saving way to deal with organic waste and achieve environmental protection and sanitation.
    • 无机垃圾处理系统及其方法包括加热装置,预处理装置和分解装置。 加热装置加热预处理装置和分解装置。 有机废物通过预处理装置分离成浆料和表面油水混合液体。 将微生物酶和原料加入到浆料中成为混合物。 然后将该混合物通过分解装置分解灭菌,成为无堆肥的有机肥料产品。 所有这些程序可以在3到24小时内进行。 该系统及其方法提供了有效快速,节省空间的方式来处理有机废物,实现环境保护和卫生。