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11. 发明授权

US08218646B2 Moving image encoding apparatus, moving image encoding method, and program 有权
标题翻译：运动图像编码装置，运动图像编码方法和程序
公开(公告)号：US08218646B2
公开(公告)日：2012-07-10
申请号：US12192275
申请日：2008-08-15
申请人： Takeshi Murakami , Ryuichi Kanda
发明人： Takeshi Murakami , Ryuichi Kanda
IPC分类号： H04N11/02
CPC分类号： H04N19/124 , H04N19/149 , H04N19/15 , H04N19/159 , H04N19/172 , H04N19/194 , H04N19/61
摘要： A moving image encoding apparatus includes a first-step encoding section for executing a plurality of times first-step encoding by use of different quantization control variables; a code-amount estimation section for estimating, for all the quantization control variables, an amount of codes generated for each frame by making use of a plurality of results of the encoding; a code-amount allocation section for allocating an amount of codes for each frame on the basis of results of the estimation; and a second-step encoding section for executing second-step encoding on the basis of the amount of codes allocated to each frame. The first-step encoding section changes the number of times of execution of the encoding in accordance with the attribute of each frame, and omits a portion of processes contained in the coding process in the second and subsequent executions of the encoding process.
摘要翻译：运动图像编码装置包括：第一步编码部分，用于通过使用不同的量化控制变量执行多次第一步编码; 码量估计部分，用于通过利用所述编码的多个结果，针对所有的量化控制变量来估计针对每一帧产生的代码量; 码量分配部分，用于根据估计结果分配每帧的码量; 以及第二步编码部分，用于基于分配给每个帧的代码量来执行第二步编码。第一步编码单元根据每帧的属性改变编码的执行次数，并且在编码处理的第二次和随后的执行中省略包含在编码处理中的处理的一部分。

12. 发明申请

US20110234090A1 PLATINUM COMPLEX COMPOUND AND ORGANIC ELECTROLUMINESCENT DEVICE 有权
标题翻译：铂复合化合物和有机电致发光器件
公开(公告)号：US20110234090A1
公开(公告)日：2011-09-29
申请号：US13153687
申请日：2011-06-06
申请人： Toshihiro ISE , Tatsuya Igarashi , Ikuo Kinoshita , Takeshi Murakami
发明人： Toshihiro ISE , Tatsuya Igarashi , Ikuo Kinoshita , Takeshi Murakami
IPC分类号： H01J1/63 , C07F15/00
CPC分类号： H01L51/0087 , C07D401/14 , C07D403/14 , C07F15/0086 , C09K11/06 , C09K2211/1022 , C09K2211/1029 , C09K2211/1044 , C09K2211/1059 , C09K2211/185 , C09K2211/186 , C09K2211/188 , H01L51/0054 , H01L51/0058 , H01L51/006 , H01L51/0071 , H01L51/0078 , H01L51/0081 , H01L51/0085 , H01L51/5016 , H05B33/14 , Y10S428/917
摘要： An organic electroluminescent device is provided and has at least one organic layer between a pair of electrodes. The organic compound contains a compound represented by the following formula (I): Z1 and Z2 each represents a nitrogen-containing aromatic 6-membered ring coordinating to platinum atom at the nitrogen atom, Q represents a nitrogen-containing aromatic 5-membered ring having one or two nitrogen atoms, L1 and L2 each represents a single bond or a divalent group, and n represents 0 or 1.
摘要翻译：提供有机电致发光器件，并且在一对电极之间具有至少一个有机层。有机化合物含有下式（I）表示的化合物：Z1和Z2各自表示与氮原子上的铂原子配位的含氮芳香族6元环，Q表示含氮芳香族五元环，一个或两个氮原子，L1和L2各自表示单键或二价基团，n表示0或1。

13. 发明授权

US07952071B2 Apparatus and method for inspecting sample surface 有权
标题翻译：用于检查样品表面的装置和方法
公开(公告)号：US07952071B2
公开(公告)日：2011-05-31
申请号：US12162071
申请日：2007-01-24
申请人： Nobuharu Noji , Yoshihiko Naito , Hirosi Sobukawa , Masahiro Hatakeyama , Kenji Terao , Takeshi Murakami , Katsuya Okumura , Tatsuhiko Higashiki
发明人： Nobuharu Noji , Yoshihiko Naito , Hirosi Sobukawa , Masahiro Hatakeyama , Kenji Terao , Takeshi Murakami , Katsuya Okumura , Tatsuhiko Higashiki
IPC分类号： G01N23/00
CPC分类号： H01J37/29 , H01J37/045 , H01J2237/2446
摘要： Provided is a defect inspection apparatus and an inspection (or evaluation) method with highly improved accuracy, which would not be provided by the prior art, in the defect inspection apparatus used in a manufacturing process of a semiconductor device.Provided is a method for inspecting a sample surface with a projection type electron beam inspection apparatus, comprising the steps of: forming such an irradiation area on the sample surface by an electron beam generated from an electron gun 21 that has approximately a circular or elliptical shape of a size larger than a pattern on the sample surface; irradiating the electron beam substantially onto a center of the pattern on the sample surface; and forming an image on an electron detection plane of a detector from secondary electrons emanating from the sample surface in response to the irradiation of the electron beam for inspecting the sample surface.
摘要翻译：提供了在半导体器件的制造工艺中使用的缺陷检查装置中，现有技术不能提供高精度的缺陷检查装置和检查（或评价）方法。提供一种用投影型电子束检查装置检查样品表面的方法，包括以下步骤：通过由具有大致圆形或椭圆形的电子枪21产生的电子束在样品表面上形成这样的照射区域尺寸大于样品表面上的图案; 将电子束基本上照射到样品表面上的图案的中心; 以及响应于用于检查样品表面的电子束的照射，从从样品表面发射的二次电子在检测器的电子检测平面上形成图像。

14. 发明申请

US20100237243A1 Testing apparatus using charged particles and device manufacturing method using the testing apparatus 有权
公开(公告)号：US20100237243A1
公开(公告)日：2010-09-23
申请号：US12789070
申请日：2010-05-27
申请人： Nobuharu Noji , Tohru Satake , Hirosi Sobukawa , Toshifumi Kimba , Masahiro Hatakeyama , Shoji Yoshikawa , Takeshi Murakami , Kenji Watanabe , Tsutomu Karimata , Kenichi Suematsu , Yutaka Tabe , Ryo Tajima , Keiichi Tohyama
发明人： Nobuharu Noji , Tohru Satake , Hirosi Sobukawa , Toshifumi Kimba , Masahiro Hatakeyama , Shoji Yoshikawa , Takeshi Murakami , Kenji Watanabe , Tsutomu Karimata , Kenichi Suematsu , Yutaka Tabe , Ryo Tajima , Keiichi Tohyama
IPC分类号： G01N23/22
CPC分类号： H01J37/20 , G01N23/2204 , G01N23/225 , H01J37/05 , H01J37/28 , H01J2237/202 , H01J2237/2441 , H01J2237/2446 , H01J2237/2801 , H01J2237/2817 , H01L21/6833 , H01L2223/54466
摘要： A system for further enhancing speed, i.e. improving throughput in a SEM-type inspection apparatus is provided. An inspection apparatus for inspecting a surface of a substrate produces a crossover from electrons emitted from an electron beam source 25•1, then forms an image under a desired magnification in the direction of a sample W to produce a crossover. When the crossover is passed, electrons as noises are removed from the crossover with an aperture, an adjustment is made so that the crossover becomes a parallel electron beam to irradiate the substrate in a desired sectional form. The electron beam is produced such that the unevenness of illuminance is 10% or less. Electrons emitted from the sample W are detected by a detector 25•11.

15. 发明授权

US07771845B2 Organic electroluminescent device 有权
标题翻译：有机电致发光器件
公开(公告)号：US07771845B2
公开(公告)日：2010-08-10
申请号：US11374148
申请日：2006-03-14
申请人： Satoshi Sano , Tatsuya Igarashi , Toshihiro Ise , Takeshi Murakami , Seiji Ichijima
发明人： Satoshi Sano , Tatsuya Igarashi , Toshihiro Ise , Takeshi Murakami , Seiji Ichijima
IPC分类号： H01L51/54 , C09K11/06
CPC分类号： H01L51/5012 , H01L51/0081 , H01L51/0087 , H01L51/5016 , Y10S428/917
摘要： An organic electroluminescent device contains: a pair of electrodes; and an organic compound layer containing a light-emitting layer, the organic compound layer being between the electrodes, wherein the organic compound layer contains a platinum complex including specific structure.
摘要翻译：有机电致发光器件包括：一对电极; 和含有发光层的有机化合物层，有机化合物层在电极之间，其中有机化合物层含有具有特定结构的铂络合物。

16. 发明授权

US07758971B2 Organic electroluminescent device 有权
标题翻译：有机电致发光器件
公开(公告)号：US07758971B2
公开(公告)日：2010-07-20
申请号：US11410000
申请日：2006-04-25
申请人： Tatsuya Igarashi , Takeshi Murakami , Ikuo Kinoshita
发明人： Tatsuya Igarashi , Takeshi Murakami , Ikuo Kinoshita
IPC分类号： H01L51/54
CPC分类号： H01L51/5016 , C09K11/06 , C09K2211/1011 , C09K2211/1014 , C09K2211/1029 , C09K2211/1044 , C09K2211/1059 , C09K2211/185 , C09K2211/186 , C09K2211/188 , H01L51/0085 , H01L51/0087 , H05B33/14 , Y10S428/917
摘要： An organic electroluminescent device comprising: a pair of electrodes comprising a positive electrode and a negative electrode; and a plurality of organic compound layers including a light emitting layer between the pair of electrodes, wherein at least one layer containing a metal complex having a tridentate or more ligand is provided between the light emitting layer and the negative electrode.
摘要翻译：一种有机电致发光器件，包括：一对电极，包括正极和负极; 以及在所述一对电极之间包括发光层的多个有机化合物层，其中在所述发光层和所述负极之间设置至少一层含有具有三齿或更多配位体的金属络合物的层。

17. 发明授权

US07659409B2 3-Hydroxy-3-(2-thienyl) propionamides and production method thereof, and production method of 3-amino-1-(2-thienyl)-1-propanols using the same 失效
标题翻译： 3-羟基-3-（2-噻吩基）丙酰胺及其制备方法和使用其的3-氨基-1-（2-噻吩基）-1-丙醇的制备方法
公开(公告)号：US07659409B2
公开(公告)日：2010-02-09
申请号：US10944055
申请日：2004-09-20
申请人： Jun Takehara , Jingping Qu , Kazuaki Kanno , Hiroshi Kawabata , Yasumasa Dekishima , Makoto Ueda , Kyoko Endo , Takeshi Murakami , Tomoko Sasaki , Hisatoshi Uehara , Youichi Matsumoto , Shihomi Suzuki
发明人： Jun Takehara , Jingping Qu , Kazuaki Kanno , Hiroshi Kawabata , Yasumasa Dekishima , Makoto Ueda , Kyoko Endo , Takeshi Murakami , Tomoko Sasaki , Hisatoshi Uehara , Youichi Matsumoto , Shihomi Suzuki
IPC分类号： C07D333/22
CPC分类号： C07D333/16 , B01J31/1805 , B01J31/2295 , B01J2231/643 , B01J2531/80 , B01J2531/821
摘要： The object of the present invention is to provide 3-hydroxy-3-(2-thienyl)propionamides useful as synthesis intermediates of pharmaceutical preparations and the like and a method for obtaining optically active 3-amino-1-(2-thienyl)-1-propanols using the same with high reaction yield, high optical yield and industrially low cost.According to the present invention, 3-amino-1-(2-thienyl)-1-propanols are obtained by carrying out asymmetric reduction of a β-ketocarbonyl compound having thiophene ring in the presence of a catalyst constituted from a compound of a group VIII or IX metal in the periodic table (e.g., a ruthenium compound) and an asymmetric ligand represented by a specified optically active diamine derivative (e.g., a diphenylethylenediamine derivative), or using a cell, a treated product of said cell or the like of a microorganism, and as occasion demands, carrying out amidation of the ester group and then carrying out reduction of the amido group. (each of the substituents is as described in claim 1).
摘要翻译：本发明的目的是提供可用作药物制剂等的合成中间体的3-羟基-3-（2-噻吩基）丙酰胺和获得光学活性3-氨基-1-（2-噻吩基）使用相同的1-丙醇，反应产率高，光学收率高，工业成本低。根据本发明，3-氨基-1-（2-噻吩基）-1-丙醇通过在由组合的化合物构成的催化剂存在下进行具有噻吩环的β-酮羰基化合物的不对称还原而得到 VIII或IX族金属（例如钌化合物）和由特定光学活性二胺衍生物（例如二苯基乙二胺衍生物）表示的不对称配体，或使用电池，所述电池等的处理产物微生物，根据需要，进行酯基的酰胺化，然后进行酰胺基的还原。（每个取代基如权利要求1所述）。

18. 发明授权

US07569838B2 Electron beam inspection system and inspection method and method of manufacturing devices using the system 有权
公开(公告)号：US07569838B2
公开(公告)日：2009-08-04
申请号：US12068484
申请日：2008-02-07
申请人： Kenji Watanabe , Hirosi Sobukawa , Nobuharu Noji , Tohru Satake , Shoji Yoshikawa , Tsutomu Karimata , Mamoru Nakasuji , Masahiro Hatakeyama , Takeshi Murakami , Yuichiro Yamazaki , Ichirota Nagahama , Takamitsu Nagai , Kazuyoshi Sugihara
发明人： Kenji Watanabe , Hirosi Sobukawa , Nobuharu Noji , Tohru Satake , Shoji Yoshikawa , Tsutomu Karimata , Mamoru Nakasuji , Masahiro Hatakeyama , Takeshi Murakami , Yuichiro Yamazaki , Ichirota Nagahama , Takamitsu Nagai , Kazuyoshi Sugihara
IPC分类号： H01J37/00 , H01J37/30
CPC分类号： H01J37/28 , H01J37/224 , H01J37/244 , H01J2237/006 , H01J2237/20221 , H01J2237/2445 , H01J2237/2817
摘要： An electron beam inspection system of the image projection type includes a primary electron optical system for shaping an electron beam emitted from an electron gun into a rectangular configuration and applying the shaped electron beam to a sample surface to be inspected. A secondary electron optical system converges secondary electrons emitted from the sample. A detector converts the converged secondary electrons into an optical image through a fluorescent screen and focuses the image to a line sensor. A controller controls the charge transfer time of the line sensor at which the picked-up line image is transferred between each pair of adjacent pixel rows provided in the line sensor in association with the moving speed of a stage for moving the sample.

19. 发明申请

US20090046113A1 Uneven streaks evaluation device, uneven streaks evaluation method, storage medium, and color filter manufacturing method 审中-公开
标题翻译：不均匀条纹评估装置，不均匀条纹评估方法，存储介质和滤色器制造方法
公开(公告)号：US20090046113A1
公开(公告)日：2009-02-19
申请号：US12220852
申请日：2008-07-29
申请人： Takeshi Murakami , Eiji Yamada
发明人： Takeshi Murakami , Eiji Yamada
IPC分类号： G09G5/02 , G06K9/40 , G03F1/00
CPC分类号： G06K9/40 , G06T5/002 , G09G3/006
摘要： A present uneven streaks evaluation device includes an evaluation data generation section for generating evaluation data, serving as an index for evaluating cyclic uneven streaks occurring on an evaluation target surface, in accordance with image data obtained by imaging the evaluation target surface to which light is emitted, wherein a one-dimensional projection processing section carries out a one-dimensional projection process with respect to light distribution included in the image data so that a projection direction is a direction including a vector of a direction in which uneven streaks occur, a power spectrum calculation section calculates a power spectrum in accordance with the light distribution having been subjected to the one-dimensional projection process, an integration processing section calculates an interval integral value of a preset cycle in accordance with the calculated power spectrum, and a noise component removing section removes a noise component included in the calculated interval integral value.
摘要翻译：本发明的不均匀条纹评价装置包括：评价数据生成部，其根据通过对发光的评价对象面进行成像而获得的图像数据，生成评价数据，作为用于评价在评价对象面上发生的循环不均匀条纹的指标其中，一维投影处理部对图像数据中包含的光分布进行一维投影处理，使得投影方向为包括发生不均匀条纹的方向的矢量的方向，功率谱计算部根据经过一维投影处理的光分布来计算功率谱，积分处理部根据计算出的功率谱计算预设周期的间隔积分值，噪声分量除去部去除包含的噪声成分计算间隔积分值。

20. 发明申请

US20080315090A1 Objective lens, electron beam system and method of inspecting defect 审中-公开
公开(公告)号：US20080315090A1
公开(公告)日：2008-12-25
申请号：US12219802
申请日：2008-07-29
申请人： Mamoru Nakasuji , Tohru Satake , Hirosi Sobukawa , Takeshi Murakami , Kenji Watanabe , Nobuharu Noji
发明人： Mamoru Nakasuji , Tohru Satake , Hirosi Sobukawa , Takeshi Murakami , Kenji Watanabe , Nobuharu Noji
IPC分类号： G01N23/00
CPC分类号： H01J37/141 , H01J2237/1534 , H01J2237/28
摘要： An electron beam system or a method for manufacturing a device using the electron beam system in which an electron beam can be irradiated at a high current density and a ratio of transmittance of a secondary electron beam of an image projecting optical system can be improved and which can be compact in size. The surface of the sample S is divided into plural stripe regions which in turn are divided into rectangle-shaped main fields. The main field is further divided into plural square-shaped subfields. The irradiation with the electron beams and the formation of a two-dimensional image are repeated in a unit of the subfields. A magnetic gap formed by the inner and outer magnetic poles of the objective lens is formed on the side of the sample, and an outer side surface and an inner side surface of each of the inner magnetic pole and the outer magnetic pole, respectively, forming the magnetic gap have each part of a conical shape with a convex having an angle of 45° or greater with respect to the optical axis.

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