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    • 16. 发明申请
    • Mass Spectrometer
    • 质谱仪
    • US20120104247A1
    • 2012-05-03
    • US13262217
    • 2009-03-31
    • Kiyoshi OgawaMitsutoshi Setou
    • Kiyoshi OgawaMitsutoshi Setou
    • H01J49/26
    • H01J49/0004G01N1/06G01N1/286H01J49/0459
    • A sample stage (2) on which a sample (4) is placed can be reciprocally moved along a guide (5) by a driving mechanism (6). A cutter (9) which is moved in an X-Y plane by a driving mechanism (10) is placed at a sample cutting position (B). When the sample stage (2) is moved to the sample cutting position (B) and the cutter is driven with the height of the sample stage (2) being appropriately adjusted, an upper portion of the sample 4 is horizontally cut off with a predetermined thickness and a new sample analysis surface which was inside the sample 4 is exposed. Hence, by repeating a mass analysis for a predetermined measurement area at an analysis position (C) and a partial cutting of the sample 4 at the sample cutting position (B), it is possible to achieve a three-dimensional mass analysis imaging of the sample (4) without removing the sample (4) from the sample stage (2).
    • 其上放置有样品(4)的样品台(2)可以通过驱动机构(6)沿引导件(5)往复运动。 通过驱动机构(10)在X-Y平面中移动的切割器(9)被放置在样品切割位置(B)。 当样品台(2)移动到样品切割位置(B)并且在适当调节样品台(2)的高度的情况下驱动切割器时,样品4的上部以预定的 厚度和样品4内部的新的样品分析表面露出。 因此,通过在样本切断位置(B)的分析位置(C)和样本4的部分切割重复对于预定测量区域的质量分析,可以实现三维质量分析成像 样品(4),而不从样品台(2)中移除样品(4)。
    • 17. 发明授权
    • Ion trap mass spectrometer
    • 离子阱质谱仪
    • US07683316B2
    • 2010-03-23
    • US12117311
    • 2008-05-08
    • Kengo TakeshitaKiyoshi Ogawa
    • Kengo TakeshitaKiyoshi Ogawa
    • H01J49/42
    • H01J49/42
    • The number of times of repetition of mass spectrometry analysis for integrating mass profiles is reduced to facilitate reduction in measurement time-period and increase a signal intensity. In a state when ions are trapped by a high-frequency electric field formed within an ion trap, a rectangular-wave high-frequency voltage to be applied from a main voltage generation section to a ring electrode is temporarily stopped, and next ions are introduced from an ion entrance port into the ion trap in a state when only a static electric field exists within the ion trap. The high-frequency voltage application is re-started while at least a part of previously-trapped ions remain within the ion trap, to trap the newly-introduced ions in addition to the previous ions so as to increase an amount of ions to be accumulated, and the accumulated ions are subjected to the mass spectrometry analysis.
    • 减少用于积分质量分布的质谱分析重复次数,以便减少测量时间段并增加信号强度。 在离子被离子阱内形成的高频电场捕获的状态下,暂时停止从主电压产生部向环状电极施加的矩形波高频电压,并将下一个离子引入 在离子阱内仅存在静电场的状态下从离子入口进入离子阱。 高频电压施加被重新启动,而至少一部分先前捕获的离子保留在离子阱内,以除去先前的离子以捕获新引入的离子,以增加要积聚的离子的量 ,并对积分的离子进行质谱分析。
    • 18. 发明授权
    • Ion trap mass spectrometry
    • 离子阱质谱法
    • US07582866B2
    • 2009-09-01
    • US11866794
    • 2007-10-03
    • Osamu FuruhashiKengo TakeshitaKiyoshi Ogawa
    • Osamu FuruhashiKengo TakeshitaKiyoshi Ogawa
    • H01J49/42H01J49/26
    • H01J49/424H01J49/0059H01J49/427
    • Disclosed is an ion trap mass spectrometer for MSn analysis, which comprises a frequency-driven ion trap section operable to trap sample ions and isolate a precursor ion from the sample ions, while setting an ion-trapping RF voltage waveform at a first frequency providing a first low-mass cutoff (LMCO) value, and, then after setting the ion-trapping RF voltage waveform at a second frequency greater than the first frequency to provide a second LMCO value less than the first LMCO value, without changing an amplitude of the ion-trapping RF voltage waveform, to irradiate the precursor ion in a trapped state with light so as to photodissociate the precursor ion into fragment ions; and an analyzer section operable to subject the fragment ions ejected from the ion trap section, to mass spectrometry so as to obtain information about a molecular structure of the precursor ion. The ion trap mass spectrometer of the present invention can maximize a mass range coverable in one cycle of MSn analysis.
    • 公开了一种用于MSn分析的离子阱质谱仪,其包括频率驱动的离子阱部分,其可操作以捕获样品离子并将前体离子与样品离子隔离,同时将第一频率处的离子捕获RF电压波形设置为提供 第一低质量截止值(LMCO)值,然后在大于第一频率的第二频率设置离子捕获RF电压波形之后,提供小于第一LMCO值的第二LMCO值,而不改变 离子捕获RF电压波形,用光照射处于捕获状态的前体离子,以将前体离子光致离解成碎片离子; 以及分析器部,其可操作以使从离子阱部分喷射的碎片离子进行质谱分析,以获得关于前体离子的分子结构的信息。 本发明的离子阱质谱仪可以在MSn分析的一个循环中使质量范围最大化。