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    • 17. 发明授权
    • System and method of providing error detection and correction capability in an integrated circuit using redundant logic cells of an embedded FPGA
    • 使用嵌入式FPGA的冗余逻辑单元在集成电路中提供错误检测和校正能力的系统和方法
    • US07373567B2
    • 2008-05-13
    • US10709754
    • 2004-05-26
    • John M. CohnChristopher B. ReynoldsSebastian T. VentronePaul S. Zuchowski
    • John M. CohnChristopher B. ReynoldsSebastian T. VentronePaul S. Zuchowski
    • G01R31/28
    • G01R31/318519G01R31/318558G06F11/261H03K19/00392
    • A system and method of providing error detection and correction capability in an IC using redundant logic cells and an embedded field programmable gate array (FPGA). The system and method provide error correction (EC) to enable a defective logic function implemented within an IC chip design to be replaced, wherein at least one embedded FPGA is provided in the IC chip to perform a logic function. If a defective logic function is identified in the IC design, the embedded FPGA is programmed to correctly perform the defective logic function. All inputs in an input cone of logic of the defective logic function are identified and are directed into the embedded FPGA, such that the embedded FPGA performs the logic function of the defective logic function. All outputs in an output cone of logic of the defective logic function are identified, and the output of the FPGA is directed to the output cone of logic of the defective logic function, such that logic EC is provided within the embedded FPGA structure of the IC chip.
    • 一种使用冗余逻辑单元和嵌入式现场可编程门阵列(FPGA)在IC中提供错误检测和校正能力的系统和方法。 该系统和方法提供纠错(EC),以使得能够替换在IC芯片设计中实现的故障逻辑功能,其中在IC芯片中提供至少一个嵌入式FPGA以执行逻辑功能。 如果在IC设计中识别到故障逻辑功能,嵌入式FPGA将被编程为正确执行故障逻辑功能。 识别故障逻辑功能逻辑输入锥中的所有输入,并将其引导到嵌入式FPGA中,使嵌入式FPGA执行故障逻辑功能的逻辑功能。 识别故障逻辑功能的逻辑输出锥中的所有输出,并将FPGA的输出引导到故障逻辑功能的逻辑输出锥,使得在IC的嵌入式FPGA结构内提供逻辑EC 芯片。
    • 18. 发明授权
    • System and method of providing error detection and correction capability in an integrated circuit using redundant logic cells of an embedded FPGA
    • 使用嵌入式FPGA的冗余逻辑单元在集成电路中提供错误检测和校正能力的系统和方法
    • US07644327B2
    • 2010-01-05
    • US12049166
    • 2008-03-14
    • John M. CohnChristopher B. ReynoldsSebastian T. VentronePaul S. Zuchowski
    • John M. CohnChristopher B. ReynoldsSebastian T. VentronePaul S. Zuchowski
    • G01R31/28
    • G01R31/318519G01R31/318558G06F11/261H03K19/00392
    • A system and method of providing error detection and correction capability in an IC using redundant logic cells and an embedded field programmable gate array (FPGA). The system and method provide error correction (EC) to enable a defective logic function implemented within an IC chip design to be replaced, wherein at least one embedded FPGA is provided in the IC chip to perform a logic function. If a defective logic function is identified in the IC design, the embedded FPGA is programmed to correctly perform the defective logic function. All inputs in an input cone of logic of the defective logic function are identified and are directed into the embedded FPGA, such that the embedded FPGA performs the logic function of the defective logic function. All outputs in an output cone of logic of the defective logic function are identified, and the output of the FPGA is directed to the output cone of logic of the defective logic unction, such that logic EC is provided within the embedded FPGA structure of the IC chip.
    • 一种使用冗余逻辑单元和嵌入式现场可编程门阵列(FPGA)在IC中提供错误检测和校正能力的系统和方法。 该系统和方法提供纠错(EC),以使得能够替换在IC芯片设计中实现的故障逻辑功能,其中在IC芯片中提供至少一个嵌入式FPGA以执行逻辑功能。 如果在IC设计中识别到故障逻辑功能,嵌入式FPGA将被编程为正确执行故障逻辑功能。 识别故障逻辑功能逻辑输入锥中的所有输入,并将其引导到嵌入式FPGA中,使嵌入式FPGA执行故障逻辑功能的逻辑功能。 识别有缺陷逻辑功能的逻辑输出锥中的所有输出,并将FPGA的输出引导到故障逻辑逻辑的逻辑输出锥,使得在IC的嵌入式FPGA结构内提供逻辑EC 芯片。
    • 20. 发明授权
    • FPGA blocks with adjustable porosity pass thru
    • 具有可调节孔隙度的FPGA块通过
    • US07105385B2
    • 2006-09-12
    • US10731296
    • 2003-12-09
    • Christopher B. ReynoldsSebastian T. VentroneAngela Weil
    • Christopher B. ReynoldsSebastian T. VentroneAngela Weil
    • H01L21/82H01L21/3205H01L21/44G06F9/45
    • G06F17/5068H01L27/11803
    • A field programmable gate array is described for use in a semiconductor chip such as a VLSI chip. The array is provided with variable wire-through porosity to allow for optimum chip-level routing through the array. This is achieved by dividing the array into blocks which can be individually assessed for required porosity. Then blocks that have been prefabricated with differing porosities are placed in the macro to optimize local chip level routing. The routing of wires is determined by developing a chip floor plan to include early timing allocation and a proposed placement of the array. The floor plan is then overlaid with critical logical wiring nets. From this, an initial selection of blocks is made based on proposed wiring density, and the macro is assembled with the blocks strategically placed therein. The procedure is likewise applicable to other types of densely obstructed cores embedded with a chip.
    • 描述了用于诸如VLSI芯片的半导体芯片中的现场可编程门阵列。 该阵列具有可变的线穿孔孔,以允许通过阵列的最佳芯片级布线。 这是通过将阵列划分成可以单独评估所需孔隙度的块来实现的。 然后将具有不同孔隙度的预制块放置在宏中以优化本地芯片级布线。 通过开发芯片平面图来确定导线的布线,以包括早期的时序分配和阵列的建议放置。 然后将平面图重叠在关键的逻辑布线网上。 由此,基于所提出的布线密度进行块的初始选择,并且宏与被策略地放置在其中的块组装。 该程序同样适用于嵌入芯片的其他类型的密集阻塞的芯。