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    • 17. 发明授权
    • Active faceted mirror system for lithography
    • 用于光刻的主动分面镜系统
    • US07136214B2
    • 2006-11-14
    • US10986076
    • 2004-11-12
    • Erik LoopstraStephen Roux
    • Erik LoopstraStephen Roux
    • G02B26/00
    • G02B27/0977G02B7/1827G02B27/0905G03F7/70116G03F7/702G03F7/70291
    • An active faceted mirror system is disclosed. The active faceted mirror system includes a set of active facet mirror devices, a base plate and a set of pins for mounting the active facet mirror devices to the base plate. Each of the active facet mirror devices includes a mirror substrate with a reflective surface and a bearing hole on the reverse side for mounting. Additionally, each of the active facet mirror devices includes at least three actuator targets located on the back side of the mirror substrate, a jewel bearing and a flexure for supporting the mirror substrate. The base plate includes a series of bearing holes for mounting the active facet mirror devices and at least three actuators for each of the active facet mirror devices. A set of facet controllers located on the base plate can be used to control the positioning of the active facet mirror devices to produce a desired illumination effect.
    • 公开了一种主动刻面镜系统。 主动分面镜系统包括一组主动分面镜装置,底板和一组用于将活动小面镜装置安装到基板的销。 每个活性刻面镜装置包括具有反射表面的反射镜基板和用于安装的反面上的轴承孔。 此外,每个活动刻面镜装置包括位于镜基板背面的至少三个致动器目标,宝石轴承和用于支撑镜面基板的挠曲件。 基板包括用于安装主动分面镜装置的一系列轴承孔和用于每个主动分面镜装置的至少三个致动器。 可以使用位于基板上的一组小面控制器来控制活动小面镜装置的定位以产生期望的照明效果。
    • 18. 发明申请
    • Correcting variations in the intensity of light within an illumination field without distorting the telecentricity of the light
    • 校正照明场中光强度的变化,而不会使光的远心变形
    • US20060077372A1
    • 2006-04-13
    • US10962550
    • 2004-10-13
    • Stephen RouxErik LoopstraMichael Nelson
    • Stephen RouxErik LoopstraMichael Nelson
    • G03B27/72
    • G03F7/70558G03F7/70066
    • An apparatus for changing an aggregate intensity of a light within an illumination field of a photolithography system comprising a blade structure and a first actuator. The blade structure is configured to be positioned along an optical path of the photolithography system between an illumination system of the photolithography system and a reticle stage of the photolithography system so that, when the illumination system provides the light having the illumination field, the blade structure is substantially at a center of the illumination field and a first portion of the light within the illumination field impinges upon the blade structure. The blade structure is either translucent to a wavelength of the light or opaque to the wavelength. The first portion of the light has a first area. The first actuator is coupled between a first portion of the blade structure and a frame of the photolithography system and is configured to move at least the first portion of the blade structure in a first direction so that, when the illumination system provides the light having the illumination field, a second portion of the light within the illumination field impinges upon the blade structure. The second portion of the light has a second area. The second area is different from the first area.
    • 一种用于改变包括叶片结构和第一致动器的光刻系统的照明场内的光聚集强度的装置。 刀片结构被配置为沿着光刻系统的光路定位在光刻系统的照明系统和光刻系统的光罩台之间,使得当照明系统提供具有照明场的光时,叶片结构 基本上在照明场的中心,并且照明场内的光的第一部分撞击在叶片结构上。 叶片结构对于光的波长是半透明的或对于波长是不透明的。 光的第一部分具有第一区域。 第一致动器耦合在叶片结构的第一部分和光刻系统的框架之间,并且构造成在第一方向上至少移动叶片结构的第一部分,使得当照明系统提供具有 照明场,照明场内的光的第二部分照射在叶片结构上。 光的第二部分具有第二区域。 第二个区域与第一个区域不同。
    • 19. 发明申请
    • Lithographic apparatus and method for calibrating the same
    • 平版印刷设备及其校准方法
    • US20060023194A1
    • 2006-02-02
    • US10899295
    • 2004-07-27
    • Erik LoopstraLeon LevasierRene Oesterholt
    • Erik LoopstraLeon LevasierRene Oesterholt
    • G03B27/58
    • G03F7/70775G03F7/70458G03F7/70516G03F9/7011G03F9/7019
    • Lithographic apparatus includes a substrate table and a motion control system for controlling a movement of the substrate table. The motion control system includes at least 3 position detectors constructed for detecting a position of the substrate table. For measuring a position and orientation of the substrate table, each position detector comprises an optical encoder of a single dimensional or multi dimensional type, the optical encoders being arranged for providing together at least 6 position values, at least one position value being provided for each of the 3 dimensions. 3 or more of the at least 3 optical encoders being connected to the substrate table at different locations in the 3 dimensional coordinate system. The motion control system is arranged to calculate the position of the substrate table in the 3 dimensional coordinate system from a subset of at least 3 of the 6 position values and to calculate an orientation of the substrate table with respect to the coordinate system from another subset of at least 3 of the 6 position values. Further, a method for calibrating the position detectors is described.
    • 光刻设备包括用于控制衬底台的移动的衬底台和运动控制系统。 运动控制系统包括构造用于检测衬底台的位置的至少3个位置检测器。 为了测量衬底台的位置和取向,每个位置检测器包括一维或多维类型的光学编码器,光学编码器被布置为一起提供至少6个位置值,为每个位置值提供至少一个位置值 的三维。 所述至少3个光学编码器中的3个或更多个在所述三维坐标系中的不同位置连接到所述基板台。 运动控制系统被布置为从6个位置值中的至少3个的子集计算三维坐标系中的衬底台的位置,并且从另一个子集计算相对于坐标系的衬底台的取向 至少6个位置值中的3个。 此外,描述了用于校准位置检测器的方法。