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    • 13. 发明申请
    • Flaps closer apparatus
    • 打开更近的装置
    • US20050091944A1
    • 2005-05-05
    • US10976608
    • 2004-10-29
    • James Goodman
    • James Goodman
    • B31B50/48B65B7/20
    • B65B7/20
    • A flaps closing apparatus for closing full flap boxes is provided. The apparatus includes a flaps closing assembly with a first brake mechanism and closing bars with a second brake mechanism. The first brake mechanism controls the vertical motion of the flaps closing assembly with respect to the flaps closing apparatus. The second brake mechanism holds the closing bars in an angled configuration and at a first predetermined vertical position permits the bars to pivot to a horizontal configuration. A flap sealing assembly includes a pair of compression plates positioned outside the flaps closing assembly. A compression plate actuating mechanism draws the compression plates inwardly to urge side flaps of the full flap box into contact with sides of the full flap box at a second predetermined vertical position. A vertical movement mechanism lowers and raises the apparatus.
    • 提供一种用于关闭整个皮瓣盒的折片关闭装置。 该装置包括具有第一制动机构的挡板关闭组件和具有第二制动机构的关闭杆。 第一制动机构控制翼片关闭组件相对于翼片关闭装置的垂直运动。 第二制动机构将闭合杆保持成倾斜的构造,并且在第一预定垂直位置允许杆枢转到水平构型。 翼片密封组件包括位于翼片关闭组件外侧的一对压板。 压缩板致动机构向内拉动压板以促使完整挡板的侧翼在第二预定垂直位置处与完全挡板的侧面接触。 垂直移动机构降低并升高装置。
    • 14. 发明授权
    • Method and apparatus for switchably selecting an integrated circuit operating mode
    • 用于切换选择集成电路工作模式的方法和装置
    • US06466048B1
    • 2002-10-15
    • US09862339
    • 2001-05-23
    • James Goodman
    • James Goodman
    • H03K1900
    • G06F21/74G01R31/31704G01R31/31719G01R31/318558G01R31/318588
    • A method and circuit for preventing external access to secure data of an integrated circuit while supporting DFT is disclosed. In accordance with the method the integrated circuit is automatically placed into the test mode at integrated circuit power-up from a power-down state. At power up, secure data is other than present within a secure data-path of the integrated circuit. Access is provided to the secure data path via a second data path coupled with the first secure data-path. Via the access path, data other than secure data is provided to the integrated circuit, the data for performing test functions of the integrated circuit operating in the test mode. Once data other than secure data is provided to first secure data path, the test mode is terminated and access via other than the secure ports is disabled. The test mode is only re-entered by powering down the integrated circuit and re-initializing it.
    • 公开了一种用于在支持DFT的同时防止外部访问集成电路的安全数据的方法和电路。 根据该方法,集成电路在从掉电状态的集成电路上电时自动进入测试模式。 在上电时,安全数据不同于存在于集成电路的安全数据路径内。 经由与第一安全数据路径耦合的第二数据路径向安全数据路径提供访问。 通过访问路径,除了安全数据之外的数据被提供给集成电路,用于执行在测试模式下操作的集成电路的测试功能的数据。 一旦将安全数据以外的数据提供给第一安全数据路径,则终止测试模式,并且禁用除安全端口之外的访问。 测试模式只能通过关闭集成电路并重新初始化来重新输入。