专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

11. 发明专利

JPH03148089A DETECTOR OF TOTAL-REFLECTION FLUORESCENCE X-RAY ANALYZING APPARATUS 失效
公开(公告)号：JPH03148089A
公开(公告)日：1991-06-24
申请号：JP28820889
申请日：1989-11-06
申请人： HORIBA LTD
发明人： KIRA AKIMICHI , OKADA YOSHIAKI , WAKIYAMA YOSHIHIRO
IPC分类号： G01N23/223 , G01T1/36 , G01T7/00
摘要： PURPOSE:To omit a collimator and to improve sensitivity by forming a material constituting a detector within a range wherein scattering X rays are projected and fluorescence X rays are generated with the same element as a target material of an X-ray tube which projects primary X rays into a sample. CONSTITUTION:An X-ray tube 1, a cathode filament 2, a cap 4, an electrode 9 and the like are formed of molybdenum. A detector 11 is also formed of molybdenum like a target material 3 of the X-ray tube 1. Primary X rays 13 which are emitted from the X-ray tube 1 are inputted into a sample 12 at a total reflection angle, and scattering X rays generated from the sample 12 are inputted into the cap 4. Even if the scattering X rays excite the cap 4 and the electrode 9 and fluorescence X rays are generated, the fluorescence X rays become the same kind as the primary X rays. Therefore, the spectrum of the fluorescence X rays which are generated by the excitation of an element to be measured and the spectrum of the fluorescence X rays which are generated by the excitation from the cap 4 and the electrode 9 have the almost different wavelength regions. Thus the effect on the measurement of the element to be measured becomes almost negligible, and the use of a collimator is omitted.

12. 发明专利

JPH0833358B2 失效
公开(公告)号：JPH0833358B2
公开(公告)日：1996-03-29
申请号：JP28689089
申请日：1989-11-03
申请人： HORIBA LTD
发明人： OKADA YOSHIAKI , WAKYAMA YOSHIHIRO
IPC分类号： G01N23/223

13. 发明专利

JPH0735707A FLUORESCENT X-RAY ANALYZER 失效
公开(公告)号：JPH0735707A
公开(公告)日：1995-02-07
申请号：JP19919993
申请日：1993-07-17
申请人： HORIBA LTD
发明人： SATO YOSHIMICHI , KOMATANI SHINTARO , OKADA YOSHIAKI , WAKIYAMA YOSHIHIRO
IPC分类号： G01N23/223 , G01N23/00
摘要： PURPOSE:To obtain a fluorescent X-ray analyzer which can be operated by single key operation by providing keys dedicated for execution of a program stored at a memory section thereby reducing the troublesome key operation. CONSTITUTION:Program function is assigned especially to a key 26 among the function keys 24-26 on a keyboard 4. When an operating program is generated, a program key F9 is depressed to start a program mode and then the input operation of a series of operating programs is repeated thus storing a plurality of operating programs at a memory section. When a specific program thus stored is executed, the program key F9 is depressed to display a program list from which a program to be executed is selected and then an execution key F2 is depressed. Consequently, the specific operating program stored at the memory section is executed and a desired analysis is conducted. Frequently used operating programs are assigned to a user key F11.

14. 发明专利

JPH03148056A TOTAL-REFLECTION X-RAY FLUORESCENCE ANALYSIS APPARATUS 失效
公开(公告)号：JPH03148056A
公开(公告)日：1991-06-24
申请号：JP28689089
申请日：1989-11-03
申请人： HORIBA LTD
发明人： OKADA YOSHIAKI , WAKIYAMA YOSHIHIRO
IPC分类号： G01N23/223
摘要： PURPOSE:To make it possible to perform highly accurate measurement by providing a sample on a stage in order to measure the position of linear X rays beforehand when the sample is not placed on the stage, and obtaining the specified total reflection angle only by measuring the position of the reflected X rays. CONSTITUTION:At first, the X rays directly emitted from an X-ray tube 1 is detected with an X-ray position detecting unit 9 under the state wherein a sample 4 is not provided on a stage 3. Thereafter, the sample 4 is provided on the stage 3. The X rays are projected on the sample 4 from the X-ray tube 1 through a slit 2. The most part of the X rays is reflected from the sample 4. The reflected X rays are detected with the unit 9. Here, the distance from the point at which the X rays from the X-ray tube 1 is projected for the sample 4 to the unit 9 is made to be L, and the distance between the directly projected X rays on the unit 9 and the detecting position of the reflected X rays is made to be (d). Then a total reflection angle theta from the sample 4 is obtained by the expression in the figure. The detected result is processed in a personal computer 8 by using the expression. The data are sent into a sample-position controlling circuit 10. The stage 3 is driven so as to satisfy the specified total reflection angle, and the attitude of the sample 4 is controlled.

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式