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    • 12. 发明授权
    • Device and method for beam adjustment in an optical beam path
    • 光束路径中光束调整的装置和方法
    • US08319970B2
    • 2012-11-27
    • US12073360
    • 2008-03-04
    • Holger BirkMarcus DybaHilmar GugelVolker Seyfried
    • Holger BirkMarcus DybaHilmar GugelVolker Seyfried
    • G01N21/55
    • G02B21/06
    • A device for beam adjustment in an optical beam path, having at least two mutually independent light sources providing respective beams of a high or extremely high resolution microscope, the beams of the light sources superposed in a common illumination beam path. The device includes a calibration sample with the aid of which the pupil position and/or focal position of the beams can be checked. The device also includes a sample holder arranged to bring the calibration sample into and out of the common illumination beam path at the site or in the vicinity of an intermediate image. A corresponding method is described. In accordance with the device and method, it is possible to undertake the beam adjustment independently of the actual use, that is to say, in the case of a high resolution microscope, independently of the examination sample and/or the recording of images.
    • 一种用于光束路径中的光束调节的装置,具有至少两个相互独立的光源,其提供高分辨率或极高分辨率显微镜的各个光束,所述光源的光束叠加在公共照明光束路径中。 该装置包括校准样品借助于此可以检查光束的光瞳位置和/或焦点位置。 该装置还包括样本保持器,其被布置成使得校准样品进入和离开中间图像的位置处或附近的公共照明光束路径。 描述相应的方法。 根据该装置和方法,可以独立于实际使用进行光束调节,也就是说,在高分辨率显微镜的情况下,独立于检查样本和/或图像的记录。
    • 13. 发明申请
    • ACOUSTO-OPTICAL SYSTEM, MICROSCOPE AND METHOD OF USE OF THE ACOUSTO-OPTICAL SYSTEM
    • 光学系统,显微镜和使用光学系统的方法
    • US20110304900A1
    • 2011-12-15
    • US13151055
    • 2011-06-01
    • Bernd WidzgowskiHolger BirkVolker Seyfried
    • Bernd WidzgowskiHolger BirkVolker Seyfried
    • G02F1/11G02F1/33G02F1/00
    • G02F1/113G02B21/0032G02B21/0076
    • An acousto-optical system is described comprising at least one acousto-optical element having at least one transducer that is attached to a crystal, a driver unit for generating at least one acoustic signal for driving acousto-optical elements modifying light transmitted through the acousto-optical element and comprising at least one digital data processing unit, at least one digital-to-analog converter transforming the digital combination signal into an initial analog driver signal, and an amplifier for amplifying the initial analog driver signal to become said analog electronic driver signal. Further, a microscope and a method of operating the acousto-optical element is are described. Various objectives are achieved like more flexibility, real time compensation for non-linearity and reducing the number, size, costs and energy consumption of electronic components.
    • 描述了一种声光学系统,其包括至少一个具有至少一个连接到晶体的换能器的声光元件,驱动单元,用于产生用于驱动声光元件的至少一个声信号,所述声光信号修改透过声 - 光学元件,并且包括至少一个数字数据处理单元,将数字组合信号变换为初始模拟驱动器信号的至少一个数模转换器,以及用于放大初始模拟驱动器信号以成为所述模拟电子驱动器信号的放大器 。 此外,描述了显微镜和操作声光元件的方法。 实现了各种目标,如更灵活,非线性的实时补偿和减少电子元件的数量,尺寸,成本和能耗。
    • 17. 发明授权
    • Apparatus for the detection of light in a scanning microscope
    • 用于在扫描显微镜中检测光的装置
    • US08503076B2
    • 2013-08-06
    • US12600646
    • 2008-05-06
    • Holger BirkVolker Seyfried
    • Holger BirkVolker Seyfried
    • G02B21/00
    • G01J1/44G01J1/46G01J3/2803G02B21/0032G02B21/0096H01L31/107
    • A light detector for use in a line scanning microscope and a microscope comprising such a light detector are described. The light detector comprises a line array of avalanche semiconductor detectors; and an electronic trigger circuit that is adapted to operate the avalanche semiconductor detectors in at least one of a Geiger mode with internal charge amplification and in a linear mode. The trigger circuit further comprises a parallel counter that is designed to read out in parallel light pulses detected by the avalanche semiconductor detectors. The parallel counter is adapted to accumulate the light pulses detected by the avalanche semiconductor detectors over a preset counting time.
    • 描述在线扫描显微镜中使用的光检测器和包括这种光检测器的显微镜。 光检测器包括雪崩半导体检测器的线阵列; 以及电子触发电路,其适于以具有内部电荷放大和线性模式的Geiger模式中的至少一个来操作雪崩半导体检测器。 触发电路还包括并行计数器,其被设计为平行地读出由雪崩半导体检测器检测到的光脉冲。 并行计数器适于在预设的计数时间内积累由雪崩半导体检测器检测的光脉冲。