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11. 发明专利

JP2005265673A Characteristic evaluation method and characteristic evaluation apparatus for organic material 有权
标题翻译：有机材料的特征评价方法及特征评价装置
公开(公告)号：JP2005265673A
公开(公告)日：2005-09-29
申请号：JP2004079879
申请日：2004-03-19
申请人： Nippon Hoso Kyokai , 日本放送協会
发明人： AIHARA SATOSHI , OKAWA YUJI , MATSUBARA TOMOKI
IPC分类号： G01N21/62 , G01N27/416
摘要： PROBLEM TO BE SOLVED: To provide a characteristic evaluation method and a characteristic evaluation apparatus for organic materials, which eliminate the influence of interaction between an organic material and a metal interface and the influence caused by deterioration of a film surface of the organic material, and can accuratly evaluate electric properties of the organic material. SOLUTION: Positive voltage v is applied to a transparent electrode of an element sample 3 set in a vacuum container 1 by a power source in a source meter 13, and an electronic gun 2 is set so that electron beams are applied on an organic thin film to be measured. The cathode of the electronic gun 2 is grounded. This applied voltage v is scanned, and the current value from the transparent electrode which varies depending on the respective voltage values is measured by the source meter 13. Further, light beams from a condenser lens system 11 is incident upon the back surface side of the element sample 3 (the side of the transparent substrate), in addition to the application of the electron beams, to obtain the applied voltage-current properties of the organic thin film to be measured when light is applied on the element sample 3. COPYRIGHT: (C)2005,JPO&NCIPI
摘要翻译：要解决的问题：为了提供有机材料的特性评价方法和特征评价装置，其消除了有机材料与金属界面的相互作用的影响以及由有机材料的膜表面的劣化引起的影响材料，并可以准确地评估有机材料的电性能。
解决方案：通过源计量器13中的电源将正电压v施加到设置在真空容器1中的元件样品3的透明电极，并且设置电子枪2，使得电子束施加在有机薄膜要测量。电子枪2的阴极接地。对该施加电压v进行扫描，根据各个电压值对来自透明电极的电流值进行扫描，由源计数器13测定。此外，聚光透镜系统11的光束入射到元件样品3（透明基板的一侧），除了施加电子束之外，以便在元件样品3上施加光时获得所测量的有机薄膜的施加的电压 - 电流特性。
版权所有（C）2005，JPO＆NCIPI

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