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    • 11. 发明申请
    • SEMICONDUCTOR MEMORY DEVICE HAVING SHARED BIT LINE SENSE AMPLIFIER SCHEME AND DRIVING METHOD THEREOF
    • 具有共享位线检测放大器方案的半导体存储器件及其驱动方法
    • US20090219768A1
    • 2009-09-03
    • US12466180
    • 2009-05-14
    • Dong-Keun KimChang-Ho Do
    • Dong-Keun KimChang-Ho Do
    • G11C7/00
    • G11C7/12G11C7/06G11C7/065G11C7/18G11C11/4091G11C11/4094G11C11/4097G11C2207/002
    • A semiconductor memory device has a shared bit line sense amplifier. The semiconductor memory device includes: a bit line sense amplifier for amplifying data applied on bit line pair; an upper bit line disconnection unit for selectively disconnecting the bit line sense amplifier from bit line pair of an upper cell array in response to an upper bit line disconnection signal; a lower bit line disconnection unit for selectively disconnecting the bit line sense amplifier from bit line pair of a lower cell array in response to a lower bit line disconnection signal; an upper bit line equalization unit for equalizing the bit line pair of the upper cell array in response to the lower bit line disconnection signal; and a lower bit line equalization unit for equalizing the bit line pair of the lower cell array in response to the upper bit line disconnection signal.
    • 半导体存储器件具有共享位线读出放大器。 半导体存储器件包括:位线读出放大器,用于放大施加在位线对上的数据; 高位线断路单元,用于响应于高位线断开信号,选择性地将位线读出放大器与上单元阵列的位线对断开; 低位线断开单元,用于响应于较低位线断开信号,选择性地将位线读出放大器与下单元阵列的位线对断开; 高位线均衡单元,用于响应于较低位线断开信号对上位单元阵列的位线对进行均衡; 以及低位线均衡单元,用于响应于高位线断开信号来均衡下单元阵列的位线对。
    • 12. 发明授权
    • Semiconductor memory device
    • 半导体存储器件
    • US07532530B2
    • 2009-05-12
    • US11528521
    • 2006-09-28
    • Dong-Keun Kim
    • Dong-Keun Kim
    • G11C7/02
    • G11C7/18G11C7/1078G11C7/1096G11C7/12G11C11/4074G11C11/4094G11C11/4096G11C11/4097
    • A semiconductor memory device can reduce a data writing time. The semiconductor memory device includes a bit line sense amplifier connected to a pair of bit lines. A pair of first local lines id connected to the pair of bit lines by a first switching unit. A pair of second local lines is connected to the pair of first local lines by a second switching unit. A writing driver drives the second local lines using a normal-driving voltage in response to a data signal through a global line. The writing driver drives the second local lines using an over-driving voltage having a higher level than that of the normal-driving voltage during a predetermined period.
    • 半导体存储器件可以减少数据写入时间。 半导体存储器件包括连接到一对位线的位线读出放大器。 通过第一切换单元连接到该对位线的一对第一本地线路id。 一对第二本地线路通过第二切换单元与一对第一本地线路连接。 写入驱动器响应于通过全局线的数据信号,使用正常驱动电压来驱动第二本地线路。 写入驱动器在预定时段内使用具有比正常驱动电压高的电平的过驱动电压来驱动第二本地线路。
    • 14. 发明申请
    • Semiconductor memory device
    • 半导体存储器件
    • US20050248672A1
    • 2005-11-10
    • US10877880
    • 2004-06-25
    • Dong-Keun KimChang-Ho Do
    • Dong-Keun KimChang-Ho Do
    • G11C11/4091G11C7/12G11C7/18H04N5/3745H04N5/335
    • G11C7/18G11C7/12
    • A semiconductor memory device having a shared bit line sense amplifier structure is provided. The semiconductor memory device includes: a plurality of cell arrays each of which has a plurality of bit line pairs, in which the cell arrays includes a first cell array disposed at an edge portion of a cell region and a second cell array disposed adjacent to the first cell array; a first precharging unit for precharging some bit line pairs of the first or second cell array; a second precharging unit for precharging the other bit line pairs of the first cell array; and an auxiliary precharging unit for assisting a precharge operation of the second precharging unit.
    • 提供具有共享位线读出放大器结构的半导体存储器件。 半导体存储器件包括:多个单元阵列,每个单元阵列具有多个位线对,其中单元阵列包括设置在单元区域的边缘部分处的第一单元阵列和邻近单元阵列设置的第二单元阵列 第一个单元格阵列; 用于对所述第一或第二单元阵列的某些位线对进行预充电的第一预充电单元; 第二预充电单元,用于对第一单元阵列的其它位线对进行预充电; 以及用于辅助第二预充电单元的预充电操作的辅助预充电单元。
    • 15. 发明授权
    • Phase-change memory device
    • 相变存储器件
    • US08139415B2
    • 2012-03-20
    • US12488637
    • 2009-06-22
    • Dong-Keun Kim
    • Dong-Keun Kim
    • G11C16/04
    • G11C8/10G11C8/14G11C13/0004
    • A phase-change memory device is capable of reducing current consumption and preventing performance deterioration caused due to line load by improving a process of selecting memory cells for a write/read operation. The phase-change memory device has a plurality of cell matrixes and includes word line decoding units that are each shared by a plurality of cell matrixes arranged in a row direction and are configured to activate one of global row signals according to a first row address, local row switch units that are provided to the respective cell matrixes and are configured to connect local current lines to corresponding word lines in response to the activated global row signal, bus connecting units that are provided to the respective cell matrixes and are configured to connect the local current lines to global current lines, and enabling units configured to activate one of the global current lines according to a second row address.
    • 相变存储器件能够通过改善对写入/读取操作选择存储单元的处理来降低电流消耗并防止由于线路负载引起的性能劣化。 相变存储器件具有多个单元矩阵,并且包括字线解码单元,每个字线解码单元由行行方向排列的多个单元矩阵共享,并且被配置为根据第一行地址激活全局行信号之一, 本地行开关单元,其被提供给相应的单元矩阵,并且被配置为响应于激活的全局行信号将局部当前行连接到对应的字线,提供给相应的单元矩阵的总线连接单元被配置为将 局部当前线路到全局当前线路,以及启用被配置为根据第二行地址激活全局当前线路之一的单元。