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    • 12. 发明申请
    • Operation methods for a non-volatile memory cell in an array
    • 阵列中非易失性存储单元的操作方法
    • US20060140000A1
    • 2006-06-29
    • US11020269
    • 2004-12-27
    • Yi LiaoChih YehWen Tsai
    • Yi LiaoChih YehWen Tsai
    • G11C16/04G11C16/06
    • G11C11/5671G11C16/0475G11C16/0483
    • A method of reducing gate disturb in a charge-trapping layer memory cell by applying different Vpass voltages to different sides of a selected wordline. A higher Vpass voltage is used to pass higher source/drain voltage and a lower Vpass voltage is used to pass a lower source/drain voltage. By controlling the Vpass voltages on different sides of a selected wordline, it is possible to reduce a vertical field that is established in a gate region when the Vpass voltages are applied. A reduced vertical field results in suppressed gate disturb. The method also includes a novel bit-line biasing scheme that may further reduce the vertical field and thereby may further suppress gate disturb, particularly in an array of memory cells.
    • 一种通过在选定字线的不同侧面施加不同的Vpass电压来减少电荷俘获层存储单元中的门扰动的方法。 较高的Vpass电压用于传递较高的源极/漏极电压,较低的Vpass电压用于通过较低的源极/漏极电压。 通过控制所选字线的不同侧的Vpass电压,可以减小施加Vpass电压时在栅极区域中建立的垂直场。 减小的垂直场导致抑制的门扰动。 该方法还包括新颖的位线偏置方案,其可以进一步减小垂直场,从而可进一步抑制门扰动,特别是在存储器单元阵列中。
    • 18. 发明申请
    • Operation Methods For A Non-Volatile Memory Cell In An Array
    • 阵列中非易失性存储单元的操作方法
    • US20080008005A1
    • 2008-01-10
    • US11856457
    • 2007-09-17
    • Yi LIAOChih YehWen Tsai
    • Yi LIAOChih YehWen Tsai
    • G11C11/34
    • G11C11/5671G11C16/0475G11C16/0483
    • A method of reducing gate disturb in a charge-trapping layer memory cell by applying different Vpass voltages to different sides of a selected wordline. A higher Vpass voltage is used to pass higher source/drain voltage and a lower Vpass voltage is used to pass a lower source/drain voltage. By controlling the Vpass voltages on different sides of a selected wordline, it is possible to reduce a vertical field that is established in a gate region when the Vpass voltages are applied. A reduced vertical field results in suppressed gate disturb. The method also includes a novel bit-line biasing scheme that may further reduce the vertical field and thereby may further suppress gate disturb, particularly in an array of memory cells.
    • 一种通过在选定字线的不同侧面施加不同的Vpass电压来减少电荷俘获层存储单元中的门扰动的方法。 较高的Vpass电压用于传递较高的源极/漏极电压,较低的Vpass电压用于通过较低的源极/漏极电压。 通过控制所选字线的不同侧的Vpass电压,可以减小施加Vpass电压时在栅极区域中建立的垂直场。 减小的垂直场导致抑制的门扰动。 该方法还包括新颖的位线偏置方案,其可以进一步减小垂直场,从而可进一步抑制门扰动,特别是在存储器单元阵列中。