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    • 11. 发明授权
    • Method for forming self-aligned thermal isolation cell for a variable resistance memory array
    • 用于形成用于可变电阻存储器阵列的自对准热隔离单元的方法
    • US07531825B2
    • 2009-05-12
    • US11463824
    • 2006-08-10
    • Erh-Kun LaiChiahua HoKuang Yeu Hsieh
    • Erh-Kun LaiChiahua HoKuang Yeu Hsieh
    • H01L47/00G11C11/56
    • H01L45/06H01L45/1233H01L45/1293H01L45/144H01L45/1683
    • A non-volatile method with a self-aligned RRAM element. The method includes a lower electrode element, generally planar in form, having an inner contact surface. At the top of the device is a upper electrode element, spaced from the lower electrode element. A containment structure extends between the upper electrode element and the lower electrode element, and this element includes a sidewall spacer element having an inner surface defining a generally funnel-shaped central cavity, terminating at a terminal edge to define a central aperture; and a spandrel element positioned between the sidewall spacer element and the lower electrode, having an inner surface defining a thermal isolation cell, the spandrel inner walls being spaced radially outward from the sidewall spacer terminal edge, such that the sidewall spacer terminal edge projects radially inward from the spandrel element inner surface. ARRAM element extends between the lower electrode element and the upper electrode, occupying at least a portion of the sidewall spacer element central cavity and projecting from the sidewall spacer terminal edge toward and making contact with the lower electrode. In this manner, the spandrel element inner surface is spaced from the RRAM element to define a thermal isolation cell adjacent the RRAM element.
    • 具有自对准RRAM元素的非易失性方法。 该方法包括具有内部接触表面的大体平面形状的下部电极元件。 在装置的顶部是与下部电极元件间隔开的上部电极元件。 容纳结构在上电极元件和下电极元件之间延伸,并且该元件包括侧壁间隔元件,其具有限定大致漏斗形中心腔的内表面,终止于端边缘以限定中心孔; 以及位于所述侧壁间隔元件和所述下电极之间的突出元件,具有限定了热隔离单元的内表面,所述凸起内壁与所述侧壁间隔件终端边缘径向向外间隔开,使得所述侧壁间隔件末端边缘径向向内突出 从弹簧元件内表面。 ARRAM元件在下电极元件和上电极之间延伸,占据侧壁间隔元件中心空腔的至少一部分并且从侧壁间隔件终端边缘朝向和与下电极接触。 以这种方式,伞形元件内表面与RRAM元件间隔开以限定与RRAM元件相邻的热隔离单元。
    • 14. 发明申请
    • Resistor Random Access Memory Cell Device
    • 电阻随机存取存储单元装置
    • US20100197119A1
    • 2010-08-05
    • US12755897
    • 2010-04-07
    • Erh Kun LaiChiahua HoKuang Yeu Hsieh
    • Erh Kun LaiChiahua HoKuang Yeu Hsieh
    • H01L21/20
    • H01L45/122G11C11/5678G11C13/0004H01L27/2436H01L45/06H01L45/144H01L45/1625H01L45/1641H01L45/1683
    • A memory cell device has a bottom electrode and a top electrode, a plug of memory material in contact with the bottom electrode, and a cup-shaped conductive member having a rim that contacts the top electrode and an opening in the bottom that contacts the memory material. Accordingly, the conductive path in the memory cells passes from the top electrode through the conductive cup-shaped member, and through the plug of phase change material to the bottom electrode. Also, methods for making the memory cell device include steps of forming a bottom electrode island including an insulative element and a stop element over a bottom electrode, forming a separation layer surrounding the island, removing the stop element to form a hole over the insulative element in the separation layer, forming a conductive film in the hole and an insulative liner over conductive film, etching to form a cup-shaped conductive film having a rim and to form an opening through the insulative liner and the bottom of the cup-shaped conductive film to the surface of the bottom electrode, forming a plug of phase change memory material in the opening, and forming a top electrode in contact with the rim of the cup-shaped conductive film.
    • 存储单元装置具有底部电极和顶部电极,与底部电极接触的存储器材料的插头以及具有接触顶部电极的边缘和接触存储器的底部开口的杯形导电构件 材料。 因此,存储单元中的导电路径从顶部电极通过导电杯状构件,并通过相变材料的塞子到达底部电极。 此外,用于制造存储单元器件的方法包括在底部电极上形成包括绝缘元件和止动元件的底部电极岛的步骤,形成围绕岛的分离层,去除止动元件以在绝缘元件上方形成孔 在分离层中,在孔中形成导电膜,在导电膜上形成绝缘衬垫,进行蚀刻以形成具有边缘的杯形导电膜,并且通过绝缘衬垫和杯状导电体的底部形成开口 在底部电极的表面形成薄膜,在开口中形成相变记忆材料塞,形成与杯状导电膜的边缘接触的顶部电极。
    • 16. 发明授权
    • Memory device and manufacturing method
    • 存储器件及制造方法
    • US07554144B2
    • 2009-06-30
    • US11279945
    • 2006-04-17
    • Erh-Kun LaiChiahua HoKuang Yeu Hsieh
    • Erh-Kun LaiChiahua HoKuang Yeu Hsieh
    • H01L29/417
    • H01L45/1226H01L45/06H01L45/1253H01L45/14H01L45/144H01L45/145H01L45/146H01L45/147H01L45/16
    • A memory device includes first and second electrodes separated by an insulating member comprising upwardly and inwardly tapering surfaces connected by a surface segment. A bridge, comprising memory material, such as a phase change material, switchable between electrical property states by the application of energy, is positioned across the surface segment and in contact with the electrodes to define an inter-electrode path defined at least in part by the length of the surface segment. According to a method for making a memory cell device, the tapering surfaces may be created by depositing a dielectric material cap using a high density plasma (HDP) deposition procedure. The electrodes and the dielectric material cap may he planarized to create the surface segment on the dielectric material. At least one of the dielectric material depositing step and the planarizing step may be controlled so that the length of the surface and segment is within a chosen dimensional range, such as between 10 nm and 100 nm.
    • 存储器件包括由绝缘构件隔开的第一和第二电极,包括由表面段连接的向上和向内的渐缩表面。 包括可通过施加能量在电性能状态之间切换的记忆材料(例如相变材料)的桥被定位在表面段上并与电极接触以限定至少部分地由 表面段的长度。 根据制造存储单元器件的方法,可以通过使用高密度等离子体(HDP)沉积程序沉积介电材料盖而产生锥形表面。 电极和电介质材料盖可以被平坦化以在电介质材料上产生表面段。 可以控制介电材料沉积步骤和平坦化步骤中的至少一个,使得表面和段的长度在选定的尺寸范围内,例如在10nm和100nm之间。
    • 18. 发明申请
    • METHODS AND APPARATUS FOR THERMALLY ASSISTED PROGRAMMING OF A MAGNETIC MEMORY DEVICE
    • 用于磁性记忆装置的热辅助编程的方法和装置
    • US20070258284A1
    • 2007-11-08
    • US11381939
    • 2006-05-05
    • Chiahua HoKuang-Yeu Hsieh
    • Chiahua HoKuang-Yeu Hsieh
    • G11C11/14
    • G11C11/16G11C11/1675
    • A magnetic memory device comprises a magnetic memory cell that includes a pinned layer and a free layer separated from the pinned layer by an insulating layer. The magnetic memory device also comprises a thermal plate in contact with the free layer. The magnetic memory device can be configured so that a first current flows through the thermal plate heating the thermal plate. The magnetic behavior of the free layer can be altered due to the heating caused by the first current, making it easier to switch the orientation and magnetization of the free layer. A second current can then flow through a bit line near the free layer generating a magnetic field sufficient to switch the orientation of magnetization of the free layer.
    • 磁存储器件包括磁存储单元,其包括被钉扎层和通过绝缘层与被钉扎层分离的自由层。 磁存储装置还包括与自由层接触的热板。 磁存储器件可以被配置成使得第一电流流过加热板的加热板。 由于由第一电流引起的加热,自由层的磁性能可以改变,从而更容易切换自由层的取向和磁化。 然后,第二电流可以流过自由层附近的位线,产生足以切换自由层的磁化取向的磁场。
    • 19. 发明申请
    • Memory device and manufacturing method
    • 存储器件及制造方法
    • US20070241371A1
    • 2007-10-18
    • US11279945
    • 2006-04-17
    • Erh-Kun LaiChiahua HoKuang Hsieh
    • Erh-Kun LaiChiahua HoKuang Hsieh
    • H01L29/772H01L21/8239
    • H01L45/1226H01L45/06H01L45/1253H01L45/14H01L45/144H01L45/145H01L45/146H01L45/147H01L45/16
    • A memory device includes first and second electrodes separated by an insulating member comprising upwardly and inwardly tapering surfaces connected by a surface segment. A bridge, comprising memory material, such as a phase change material, switchable between electrical property states by the application of energy, is positioned across the surface segment and in contact with the electrodes to define an inter-electrode path defined at least in part by the length of the surface segment. According to a method for making a memory cell device, the tapering surfaces may be created by depositing a dielectric material cap using a high density plasma (HDP) deposition procedure. The electrodes and the dielectric material cap may he planarized to create the surface segment on the dielectric material. At least one of the dielectric material depositing step and the planarizing step may be controlled so that the length of the surface and segment is within a chosen dimensional range, such as between 10 nm and 100 nm.
    • 存储器件包括由绝缘构件隔开的第一和第二电极,包括由表面段连接的向上和向内的渐缩表面。 包括可通过施加能量在电性能状态之间切换的记忆材料(例如相变材料)的桥被定位在表面段上并与电极接触以限定至少部分地由 表面段的长度。 根据制造存储单元器件的方法,可以通过使用高密度等离子体(HDP)沉积程序沉积介电材料盖而产生锥形表面。 电极和电介质材料盖可以被平坦化以在电介质材料上产生表面段。 可以控制介电材料沉积步骤和平坦化步骤中的至少一个,使得表面和段的长度在选定的尺寸范围内,例如在10nm和100nm之间。
    • 20. 发明授权
    • Methods and apparatus for thermally assisted programming of a magnetic memory device
    • 用于磁存储器件热辅助编程的方法和装置
    • US07457149B2
    • 2008-11-25
    • US11381939
    • 2006-05-05
    • Chiahua HoKuang-Yeu Hsieh
    • Chiahua HoKuang-Yeu Hsieh
    • G11C11/00
    • G11C11/16G11C11/1675
    • A magnetic memory device comprises a magnetic memory cell that includes a pinned layer and a free layer separated from the pinned layer by an insulating layer. The magnetic memory device also comprises a thermal plate in contact with the free layer. The magnetic memory device can be configured so that a first current flows through the thermal plate heating the thermal plate. The magnetic behavior of the free layer can be altered due to the heating caused by the first current, making it easier to switch the orientation and magnetization of the free layer. A second current can then flow through a bit line near the free layer generating a magnetic field sufficient to switch the orientation of magnetization of the free layer.
    • 磁存储器件包括磁存储器单元,其包括被钉扎层和通过绝缘层与被钉扎层分离的自由层。 磁存储装置还包括与自由层接触的热板。 磁存储器件可以被配置成使得第一电流流过加热板的加热板。 由于由第一电流引起的加热,自由层的磁性能可以改变,从而更容易切换自由层的取向和磁化。 然后,第二电流可以流过自由层附近的位线,产生足以切换自由层的磁化取向的磁场。