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11. 发明申请

US20060164136A1 Circuit and method for power-on reset 失效
标题翻译：上电复位电路及方法
公开(公告)号：US20060164136A1
公开(公告)日：2006-07-27
申请号：US11338202
申请日：2006-01-24
申请人： Chang-Ho Shin
发明人： Chang-Ho Shin
IPC分类号： H03L7/00
CPC分类号： H03K17/223
摘要： In a power-on reset circuit and a method of generating a power-on reset signal tolerant of variation of an ambient temperature, the power-on reset circuit includes a first power-on reset unit, a second power-on reset unit and a logic gate. The first power-on reset unit generates a first power-on reset signal that is activated at a first level of a power supply voltage at a first temperature, and is activated at a second level of the power supply voltage at a second temperature. The second power-on reset unit generates a second power-on reset signal that is activated at the second level at the first temperature, and is activated at the first level at the second temperature. The logic gate executes a logical disjunction operation or a logical conjunction operation of the first power-on reset signal and the second power-on reset signal and generates a third power-on reset signal.
摘要翻译：在上电复位电路和产生允许环境温度变化的上电复位信号的方法中，上电复位电路包括第一上电复位单元，第二上电复位单元和第二上电复位单元逻辑门第一上电复位单元产生在第一温度的电源电压的第一电平下被激活的第一上电复位信号，并且在第二温度的电源电压的第二电平下被激活。第二上电复位单元产生在第二温度下在第二电平激活的第二上电复位信号，并且在第二温度下在第一电平激活。逻辑门执行第一上电复位信号和第二上电复位信号的逻辑分离操作或逻辑连接操作，并产生第三上电复位信号。

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