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    • 18. 发明公开
    • BELEUCHTUNGSSYSTEM, INSBESONDERE F R DIE EUV-LITHOGRAPHIE
    • 照明系统,尤其是对于EUV光刻
    • EP1499925A2
    • 2005-01-26
    • EP03724973.7
    • 2003-04-08
    • Carl Zeiss SMT AG
    • MELZER, FrankSINGER, Wolfgang
    • G03F7/20G02B26/08
    • G03F7/70075G02B26/0816G03F7/70141G03F7/702
    • A lighting system, particularly for use in extreme ultraviolet (EUV) lithography, comprising a projection lens for producing semiconductor elements for wavelengths ≤ 193 nm is provided with a light source (1), an object plane (12), an exit pupil (15), a first optical element (5) having first screen elements (6) for producing light channels, and with a second optical element (7) having second screen elements (8). A screen element (8) of the second optical element (7) is assigned to each light channel that is formed by one of the first screen elements (6) of the first optical element (5). The screen elements (6) of the first optical element (5) and of the second optical element (7) can be configured or arranged so that they produce, for each light channel, a continuous beam course from the light source (1) up to the object plane (12). The angles of the first screen elements (6) of the first optical element (5) can be adjusted in order to modify a tilt. The location and/or angles of the second screen elements (8) of the second optical element (7) can be adjusted individually and independently of one another in order to realize another assignment of the first screen elements (6) of the first optical element (5) to the second screen elements (8) of the second optical element (7) by displacing and/or tilting the first and second screen elements (8).