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    • 11. 发明授权
    • Semiconductor memory device implemented with a test circuit
    • 用测试电路实现的半导体存储器件
    • US06529438B1
    • 2003-03-04
    • US09722195
    • 2000-11-22
    • Yoichi SuzukiAkihiro MishimaMitsuhiko KosakaiMakoto SegawaYasuo Naruke
    • Yoichi SuzukiAkihiro MishimaMitsuhiko KosakaiMakoto SegawaYasuo Naruke
    • G11C800
    • G11C8/10G11C29/02
    • An improved semiconductor memory device capable of easily detecting the location of a defective bit line and a defective memory cell as a leakage current path for a short time is provided. A region flowing a leakage current no smaller than a predetermined value is determined by detecting one of a first large region and a remaining second large region, either of said first and second large regions being selected by simultaneously selecting a predetermined number of said column selection lines. Then, a region flowing a leakage current no smaller than a predetermined value is determined by detecting one of a first small region and a remaining second small region, said first and second small regions constituting said one of the first and second large regions, either of said first and second small regions being selected by simultaneously selecting a predetermined number of said column selection lines. For this purpose, an address signal output control circuit is provided within the semiconductor memory device. The address signal output control circuit is supplied with an address output control signal as externally given as a control signal for the purpose of selecting said row selection line by taking control of said row addressing signal in order to perform the control process as described above.
    • 提供一种改进的半导体存储器件,其能够容易地将缺陷位线和缺陷存储器单元的位置检测为短时间的漏电流路径。 通过检测第一大区域和剩余第二大区域中的一个来确定流过不小于预定值的漏电流的区域,通过同时选择预定数量的所述列选择线来选择所述第一和第二大区域中的任一个 。 然后,通过检测构成第一和第二大区域中的一个的第一和第二小区域的第一小区域和第二小区域中的一个来确定流过不小于预定值的漏电流的区域, 通过同时选择预定数量的所述列选择线来选择所述第一和第二小区域。 为此,在半导体存储器件内提供地址信号输出控制电路。 为了通过控制所述行寻址信号来选择所述行选择线,为了执行如上所述的控制处理,地址信号输出控制电路被提供作为外部给定的地址输出控制信号作为控制信号。
    • 17. 发明授权
    • Scanning lens unit and optical scanning apparatus including the same
    • 扫描透镜单元和包括其的光学扫描设备
    • US07075689B2
    • 2006-07-11
    • US11189774
    • 2005-07-27
    • Yoichi SuzukiYoshinori MorimotoKenichi Saito
    • Yoichi SuzukiYoshinori MorimotoKenichi Saito
    • G02B26/08
    • G02B26/125G02B13/0005
    • The scanning lens unit includes lenses located between a optical deflector and a lens having a k-th lens surface Sk from a first lens surface S1 closest to the deflector are disposed such that a height of a lens having the lens surface Sk denoted by πk satisfies the predetermined expression. each of lenses located between the first lens surface S1 and the k-th lens surface Sk is a cylindrical lens having power only in the determined deflection direction. Therefore, the lenses can individually have minimum thicknesses, as a result, the cost reduction of the scanning lens unit is realized. The optical scanning apparatus includes the scanning lens and hence can achieve cost reduction.
    • 扫描透镜单元包括位于光偏转器和具有距离偏转器最近的第一透镜表面S 1> 1的具有第k透镜表面S k的透镜之间的透镜, 使得具有由表示的透镜表面S< k>的透镜的高度满足预定表达式。 位于第一透镜表面S 1和第k透镜表面S SUB之间的每个透镜是仅在确定的偏转方向上具有光焦度的柱面透镜。 因此,透镜可以单独地具有最小的厚度,结果,实现了扫描透镜单元的成本降低。 光学扫描装置包括扫描透镜,因此可以实现成本降低。