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    • 12. 发明授权
    • Display device having defect inspection circuit
    • 具有缺陷检查电路的显示装置
    • US06204836B1
    • 2001-03-20
    • US08239730
    • 1994-05-09
    • Tsuneo YamazakiKunihiro TakahashiHiroaki TakasuAtsushi Sakurai
    • Tsuneo YamazakiKunihiro TakahashiHiroaki TakasuAtsushi Sakurai
    • G09G336
    • G09G3/006G09G3/3677G09G3/3688G09G2310/0281G09G2330/12
    • A dense display may be provided with an internal defect detection circuit to enhance production yield. A plurality of pixels, each including thin film transistors and liquid crystal cells driven by driving electrodes, are arranged in a matrix form and scanned by a plurality of control signal lines and a plurality of image signal lines. A control signal line driving circuit is formed of shift registers having one bit per signal line, and sample-and-hold circuits. An inspection circuit is provided with plural switching elements, each having a first terminal connected to a respective image signal line, a second terminal connected to an inspection output line and a third terminal receptive of an inspection control input signal for controlling an electrical connection between the first and second terminals. In accordance with this configuration, inspection of individual signal lines may be achieved and the inspection control input signal may be internally or externally generated. Moreover, similar detection circuitry may be used to detect defects in the control signal lines and, in this manner, defects may be located to the individual pixel level.
    • 密集显示器可以设置有内部缺陷检测电路,以提高产量。 多个像素,每个包括薄膜晶体管和由驱动电极驱动的液晶单元,以矩阵形式布置并被多个控制信号线和多个图像信号线扫描。 控制信号线驱动电路由每个信号线一位的移位寄存器和采样保持电路构成。 一个检查电路设置有多个开关元件,每个开关元件具有连接到相应图像信号线的第一端子,连接到检查输出线的第二端子和接受检查控制输入信号的第三端子,用于控制第 第一和第二终端。 根据该结构,可以实现各个信号线的检查,并且检查控制输入信号可以在内部或外部产生。 此外,类似的检测电路可以用于检测控制信号线中的缺陷,并且以这种方式,可以将缺陷定位到各个像素级。
    • 14. 发明授权
    • Image processing apparatus
    • 图像处理装置
    • US5841148A
    • 1998-11-24
    • US792191
    • 1997-01-30
    • Masato SomeHiromi ShibataKunihiro Takahashi
    • Masato SomeHiromi ShibataKunihiro Takahashi
    • G01N23/04
    • G01N23/046G01N2223/419
    • An image processing apparatus includes a temporary memory for two-dimensionally mapping and temporarily storing image data containing image data regions corresponding to at least two image regions having similar shape and stored in an image data storing section, a CRT for reproducing an image based on the image data stored in the temporary memory, a pixel specifying section for specifying pixels corresponding to at least two equivalent points in at least two image regions having similar shape in the image displayed on the CRT, a data correcting section for effecting, between micro region image data corresponding to micro regions including coordinates of the at least two pixels specified by the pixel specifying section as center coordinates, rotation and movement correction and enlargement/reduction magnification correction on the micro region image data in the image data corresponding to one image region so that a rotation angle and an enlargement/reduction magnification of the one image region coincide with those of a reference image region which is one of the at least two image regions, a template matching section for effecting template matching on the micro region image data corrected by the data correcting section and the micro region image data in the image data corresponding to the reference image region, and an affine converting section for effecting affine conversion on the image data stored in the temporary memory based on the result of the template matching effected by the template matching section. According to the thus constituted image processing apparatus, it is possible to accurately effect template matching within a short time period.
    • 一种图像处理装置包括一个临时存储器,用于二维地映射和临时存储包含与至少两个具有类似形状的图像区域相对应的图像数据区域的图像数据,并存储在图像数据存储部分中,CRT用于基于 存储在临时存储器中的图像数据,用于指定与在CRT上显示的图像中具有相似形状的至少两个图像区域中的至少两个等效点相对应的像素的像素指定部分,用于在微区域图像 对应于包括由像素指定部分指定的至少两个像素的坐标作为中心坐标的微区域的数据,对应于一个图像区域的图像数据中的微区域图像数据的旋转和移动校正和放大/缩小倍率校正,使得 一个ima的旋转角度和放大/缩小倍率 ge区域与作为至少两个图像区域之一的参考图像区域的Ge区域一致;模板匹配部分,用于对由数据校正部分校正的微区域图像数据和图像中的微区域图像数据进行模板匹配; 对应于参考图像区域的数据,以及仿射变换部分,用于基于由模板匹配部分实现的模板匹配的结果对存储在临时存储器中的图像数据进行仿射转换。 根据这样构成的图像处理装置,能够在短时间内精确地实现模板匹配。
    • 16. 发明授权
    • Insulator substrate for a light valve device having an electrostatic
protection region
    • 具有静电保护区域的光阀装置的绝缘体基板
    • US5534722A
    • 1996-07-09
    • US206768
    • 1994-03-07
    • Hiroaki TakasuKunihiro TakahashiTsuneo Yamazaki
    • Hiroaki TakasuKunihiro TakahashiTsuneo Yamazaki
    • H01L27/06G02F1/1362H01L21/822H01L27/04H01L27/12H01L29/78H01L29/786H01L29/86H01L27/01H01L23/62
    • G02F1/13454H01L27/1203G02F1/136204
    • A semiconductor on insulator substrate has improved electrostatic performance without sacrificing the performance of commonly integrated high-speed integrated circuitry. The semiconductor on insulator substrate includes a single crystal semiconductor thin film having an integrated circuit region and an electrostatic protection region. The thickness of the single crystal semiconductor thin film is greater in the electrostatic protection region than in the integrated circuit region to thereby allow high-speed operation of devices formed in the integrated circuit region. Such a substrate has particular application as a driving substrate for a light valve. In such a device, the integrated circuit region includes thin film switching transistors for selectively applying a voltage to the liquid crystal layer and thin film driving transistors for driving the thin film switching transistors. The electrostatic protection region includes an electrostatic protection device electrically connected to the integrated circuit region, and the electrostatic protection device is effective to protect the driving transistors from exposure to an excess of electrostatic charge.
    • 绝缘体上半导体衬底具有改进的静电性能,而不牺牲普通集成的高速集成电路的性能。 绝缘体上半导体衬底包括具有集成电路区域和静电保护区域的单晶半导体薄膜。 静电保护区域中的单晶半导体薄膜的厚度大于集成电路区域的厚度,从而允许在集成电路区域中形成的器件的高速操作。 这种基板具有作为光阀的驱动基板的特殊应用。 在这种器件中,集成电路区域包括用于选择性地向液晶层施加电压的薄膜开关晶体管和用于驱动薄膜开关晶体管的薄膜驱动晶体管。 静电保护区域包括电连接到集成电路区域的静电保护装置,并且静电保护装置有效地保护驱动晶体管不被暴露于过量的静电电荷。
    • 18. 发明授权
    • Sintered hard metals and the method for producing the same
    • 烧结硬质金属及其制造方法
    • US4973355A
    • 1990-11-27
    • US267644
    • 1988-10-31
    • Kunihiro TakahashiToshio NomuraTakaharu Yamamoto
    • Kunihiro TakahashiToshio NomuraTakaharu Yamamoto
    • C22C29/04C22C29/00
    • C22C29/04
    • The invention relates to sintered hard metals having high cutting properties, particularly plastic deformation resistance at high temperatures, crater resistance and the like, suitable for use as cutting tools, wear resistant tools and materials for dies, and the method for producing the same. The invention has for an object to obtain both sintered hard metals having the aforesaid high properties by sintering metallic components comprising IVa group metals, VIa group metals or metals of both groups substituted by Va group metals up to 60 mol % respectively, a B-1 type solid solution hard phase consisting of non-metallic components of C, N and O, and a metallic bonding phase, in a CO gas atmosphere, and to sintered hard metals in which an uniform hardness is imparted to the surface and interior thereof by the method of sintering the said sintered hard metal in a CO gas atmosphere.
    • 本发明涉及适合用作切削工具,耐磨工具和模具用材料的高切削性,特别是耐高温塑性变形性,耐火蚀性等的烧结硬质金属及其制造方法。 本发明的目的是通过烧结金属组分来获得具有上述高性能的两种烧结硬质金属,所述金属组分包括分别由高达60mol%的Va族金属取代的两组Ⅵ族金属,Ⅵa族金属或金属,B-1 在CO气体气氛中由C,N和O的非金属组分和金属结合相组成的固溶硬质相以及其表面和内部赋予均匀硬度的硬质金属, 在CO气体气氛中烧结所述烧结硬质金属的方法。