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11. 发明申请

WO1989006930A1 OPHTHALMOLOGICAL INSTRUMENT 审中-公开
标题翻译：眼科仪器
公开(公告)号：WO1989006930A1
公开(公告)日：1989-08-10
申请号：PCT/JP1989000097
申请日：1989-01-31
申请人： KABUSHIKI KAISHA TOPCON , KATSURAGI, Kenjirou
发明人： KABUSHIKI KAISHA TOPCON
IPC分类号： A61B03/16
CPC分类号： A61B3/165 , A61B3/107 , A61B3/152
摘要： This invention is intended to provide an ophthalmological instrument capable of measuring in a non-contact way the intraocular pressure of an eye to be examined and capable of measuring the radius of curvature of the cornea of the eye to be examined. The ophthalmological instrument of the invention can measure both the intraocular pressure and the shape of the cornea with a single set of apparatus without using a dedicated ophthalmological instrument for each measurement as has been employed in the prior art technique. The instrument of the invention includes non-contact type intraocular pressure measurement means for measuring the intraocular pressure of the eye to be examined by ejecting fluid onto the cornea of the eye and means for measuring the radius of curvature of cornea by projecting a predetermined index to the cornea of the eye to be examined and measuring the radius of curvature on the basis of the cornea reflection image of the index, whereby both means are assembled integrally in the apparatus.
摘要翻译：本发明旨在提供一种眼科仪器，其能够以非接触方式测量被检眼睛的眼内压并能够测量待检眼睛的角膜的曲率半径。本发明的眼科仪器可以用单组装置测量眼内压和角膜的形状，而不用如现有技术中已经采用的用于各种测量的专用眼科仪器。本发明的仪器包括非接触式眼内压测量装置，用于通过将流体喷射到眼睛的角膜上来测量要检查的眼睛的眼内压，并且用于通过将预定指数投影到眼睛的角度来测量角膜的曲率半径要检查的眼睛的角膜，并且基于指数的角膜反射图像测量曲率半径，由此两个装置被整体地组装在装置中。

12. 发明申请

WO2004019771A1 METHOD AND APPARATUS FOR MEASUREMENT AND CORRECTION OF REFRACTIVE POWER DISTRIBUTION DATA 审中-公开
标题翻译：用于测量和校正电力分配数据的方法和装置
公开(公告)号：WO2004019771A1
公开(公告)日：2004-03-11
申请号：PCT/JP2003/010690
申请日：2003-08-25
申请人： KABUSHIKI KAISHA TOPCON , YAMAGUCHI, Tatsuo , MAEDA, Naoyuki , MIHASHI, Toshifumi , HIROHARA, Yoko
发明人： YAMAGUCHI, Tatsuo , MAEDA, Naoyuki , MIHASHI, Toshifumi , HIROHARA, Yoko
IPC分类号： A61B3/10
CPC分类号： A61B3/1015
摘要： Optical performance in a case where not only higher order aberrations but also lower order aberrations are added, are evaluated, lower order aberration quantities in which for example, a Strehi ratio is large and/or a phase shift is decreased, is calculated, and correction data, such as S, C and A, at that time is obtained, so that a result closer to a subjective value is obtained. An arithmetic part receives measurement data indicating a refractive power distribution of a subject eye and obtains lower order aberrations and higher order aberrations on the basis of the measurement data (S401, S403). The arithmetic part judges whether the higher order aberrations have a specified value or higher (S405). The arithmetic part changes, in a case where the higher order aberrations have the specified values or higher, lower order aberration quantities corresponding to the higher order aberrations having the specified values or higher, obtains appropriate correction data suitable for the subject eye (S407 to S417), and obtains the correction data (S419).
摘要翻译：在不仅增加高阶像差而且增加低阶像差的情况下的光学性能被评估，计算例如Strehi比大和/或相移减小的较低阶像差量，并且校正得到此时的数据S，C和A，从而获得更接近主观值的结果。算术部件接收表示被检眼的屈光度分布的测定数据，根据测定数据求出低阶像差和高阶像差（S401，S403）。运算部判定高阶像差是否具有规定值以上（S405）。在高阶像差具有指定值或更高的情况下，运算部分改变与具有指定值或更高值的较高阶像差对应的低阶像差量，获得适合于被检眼的适当校正数据（S407至S417 ），并获得校正数据（S419）。

13. 发明申请

WO2004017825A1 PORTABLE OPHTHALMIC APPARATUS AND OPHTHALMIC SYSTEM 审中-公开
标题翻译：便携式手术器械和眼科系统
公开(公告)号：WO2004017825A1
公开(公告)日：2004-03-04
申请号：PCT/JP2003/010276
申请日：2003-08-13
申请人： KABUSHIKI KAISHA TOPCON , MAEDA, Naoyuki , HIROHARA, Yoko , MIHASHI, Toshifumi
发明人： MAEDA, Naoyuki , HIROHARA, Yoko , MIHASHI, Toshifumi
IPC分类号： A61B3/14
CPC分类号： A61B3/185 , A61B3/10 , A61B3/107 , A61B3/1208 , A61B3/14 , A61B3/152
摘要： A portable ophthalmic apparatus (1) according to the present invention comprises a supporting part (7) to which a cellular phone (2) having a photographing camera (5) is mounted detachably and a main body (6) which is provided with the supporting part (7) integrally and has an illumination optical system (13) projecting an illumination beam toward photographing objective eyes (E) along an illumination optical axis (O2) intersected at a predetermined angle with a photographing optical axis (O1).
摘要翻译：根据本发明的便携式眼科装置（1）包括支撑部分（7），具有拍摄照相机（5）的便携式电话（2）可拆卸地安装在该支撑部分（7）上，主体（6）设置有支撑一部分（7），并且具有照射光学系统（13），其沿着与拍摄光轴（O1）以预定角度相交的照明光轴（O2）将照明光束投射到拍摄目标眼睛（E）。

14. 发明申请

WO1996037755A1 APPARATUS FOR REFERENCE LASER LEVEL SETTING 审中-公开
标题翻译：参考激光水平设置的装置
公开(公告)号：WO1996037755A1
公开(公告)日：1996-11-28
申请号：PCT/JP1996001325
申请日：1996-05-20
申请人： KABUSHIKI KAISHA TOPCON , SHIBUYA, Hiroto , ADEGAWA, Toshikazu
发明人： KABUSHIKI KAISHA TOPCON
IPC分类号： G01C15/00
CPC分类号： G01C15/002 , E03F3/06
摘要： An apparatus for reference laser level setting, which has a simple structure to automatically adjust a laser beam in both transverse and vertical directions and measure an angle of inclination. The apparatus comprises a laser focusing device and a target. The target has a reflection surface for indicating a predetermined position on the target, and the laser focusing device comprises a laser oscillator including laser beam emission means rotatably supported and means for receiving a reflected laser beam; a driving device for rotating at least the laser beam emission means of the laser oscillator; and a control portion for directing the laser beam to the predetermined position of the target in accordance with the reception state of the reflected laser beam from the reflection surface of the target.
摘要翻译：一种用于参考激光水平设定的装置，其具有在横向和垂直方向上自动调节激光束的简单结构并测量倾斜角度。该装置包括激光聚焦装置和靶。目标具有用于指示目标上的预定位置的反射表面，并且激光聚焦装置包括激光振荡器，其包括可旋转地支撑的激光束发射装置和用于接收反射的激光束的装置; 用于至少旋转激光振荡器的激光束发射装置的驱动装置; 以及控制部分，用于根据来自目标的反射表面的反射激光束的接收状态将激光束引导到目标的预定位置。

15. 发明申请

WO1994011704A1 AUTOMATIC INCLINATION ANGLE COMPENSATOR 审中-公开
标题翻译：自动倾斜角度补偿器
公开(公告)号：WO1994011704A1
公开(公告)日：1994-05-26
申请号：PCT/JP1993001645
申请日：1993-11-11
申请人： KABUSHIKI KAISHA TOPCON , OHTOMO, Fumio , SUGAI, Hiroo , ISHINABE, Ikuo , YAMAZAKI, Takaaki , KODAIRA, Junichi
发明人： KABUSHIKI KAISHA TOPCON
IPC分类号： G01C05/02
CPC分类号： G01C15/105 , G01C5/02 , G01C9/20 , G02B27/64
摘要： The compensator is used for an equipment which requires verticality or horizontality. The compensator comprises a sealed liquid container (4) in which transparent liquid is sealed in such a way that the liquid has a free surface (1); a light projecting system (5 and 6) for projecting a light beam to the free surface at a given angle, the beam being totally reflected at the free surface; and an optical system arranged in a required position in the optical path of the totally reflected light beam outside the sealed liquid container so that the variation of the reflection angle to the optical axis corresponding to the variation of the incident angle to the optical axis is equalized in all the directions. When the sealed liquid container is inclined and consequently the incident angle of the light beam to the free surface varies relatively, the sensitivity depending on the variation of the reflection angle is optically compensated.
摘要翻译：补偿器用于需要垂直度或水平度的设备。补偿器包括密封液体容器（4），其中透明液体以液体具有自由表面（1）的方式被密封; 用于以给定角度将光束投射到自由表面的光投射系统（5和6），所述光束在自由表面处被完全反射; 以及配置在密封容器外侧的全反射光束的光路中的所需位置的光学系统，使得与光轴的入射角的变化对应的与光轴的反射角的变化相等在所有方向。当密封的液体容器倾斜并且因此光束到自由表面的入射角相对变化时，根据反射角的变化的灵敏度被光学补偿。

16. 发明申请

WO1994003777A1 FRAME SHAPE MEASURING INSTRUMENT 审中-公开
标题翻译：框形测量仪器
公开(公告)号：WO1994003777A1
公开(公告)日：1994-02-17
申请号：PCT/JP1993001078
申请日：1993-08-02
申请人： KABUSHIKI KAISHA TOPCON
发明人： KABUSHIKI KAISHA TOPCON , SUZUKI, Yasuo
IPC分类号： G01B21/20
CPC分类号： G01B7/28 , B24B9/144
摘要： An arithmetic control circuit (600) drives and controls a motor (209) on the basis of a measurement result by a measuring portion (300), and a frame holding device (100) is subjected to tilting rotation control so that the center line (503) of the measurement portion of a V-shaped groove (502) of a lens frame (501) is in parallel with a reference measurement plane SO. Coordinates of each point of the V-shaped groove (502) are sequentially measured by the measurement portion (300), and the shape of an eyeglass frame (501) is computed.
摘要翻译：算术控制电路（600）基于测量部（300）的测量结果来驱动和控制电动机（209），并且对框架保持装置（100）进行倾斜旋转控制，使得中心线透镜框（501）的V字形槽（502）的测量部分的基准测量平面SO与参考测量平面SO平行。通过测量部分（300）依次测量V形槽（502）的每个点的坐标，并计算眼镜架（501）的形状。

17. 发明申请

WO1991018258A1 METHOD OF TRIDIMENSIONAL MEASURING, REFERENCE SCALE AND SELF-ILLUMINATING REFERENCE SCALE FOR TRIDIMENSIONAL MEASURING 审中-公开
标题翻译：三维测量方法，三维测量的参考尺寸和自照射参考尺寸
公开(公告)号：WO1991018258A1
公开(公告)日：1991-11-28
申请号：PCT/JP1991000663
申请日：1991-05-17
申请人： KABUSHIKI KAISHA TOPCON , ISAWA, Nobuo , SAKIMURA, Ritsuo , KATSUME, Keikoku
发明人： KABUSHIKI KAISHA TOPCON
IPC分类号： G01B11/00
CPC分类号： G01S17/06 , G01C1/02 , G01C15/00 , G01C15/002 , G01C15/06
摘要： According to the present invention, an observing machine is set at an observing point and collimation targets are disposed at three fixed points. By collimating the three fixed points from the observing machine, horizontal angles and height angles of three types are measured, respectively, and equations of error about the horizontal angles, height angles, distances between the three fixed points and straightnesses between the fixed points are established from these observed data. First, approximate values are obtained from the observed data, and further, by utilizing the method of least squares, the positions of the respective points can be obtained in details. Furthermore, by collimating the three fixed points and points to be sought from the observing machine, the horizontal angles and the height angles of three types are measured, respectively, so that the positions of the points can be obtained in details. Further, by forming three targets on a subtense bar at predetermined distances, at least the positions of the points can be obtained from the observation of the distances between the three points. Furthermore, by setting the observing machine at a known observing point and by positioning a measuring portion specified by the three fixed points at the point to be sought, collimation targets can be disposed at the three fixed points. By collimating the three fixed points from the observing machine, the positions of the three fixed points can be obtained in details. Further, by forming a measuring end portion at the forward end portion of a reference scale, a position of the measuring point can be obtained even when the measuring point cannot be directly observed from the outside. Furthermore, since a plurality of targets are formed of photoconductive optical material such that the internal light is emitted as a diffused flux of light, collimation can be easily performed even in a relatively dark place.

18. 发明专利

TW200849439A 表面檢查方法及裝置 SURFACE INSPECTION METHOD AND APPARATUS OF THE SAME 审中-公开
简体标题：表面检查方法及设备 SURFACE INSPECTION METHOD AND APPARATUS OF THE SAME
公开(公告)号：TW200849439A
公开(公告)日：2008-12-16
申请号：TW096149740
申请日：2007-12-24
申请人：拓普康股份有限公司 KABUSHIKI KAISHA TOPCON
发明人：磯崎久 ISOZAKI, HISASHI , 高瀨壯宏 TAKASE, TAKEHIRO , 柿沼隆司 KAKINUMA, TAKASHI , 前川博之 MAEKAWA, HIROYUKI , 幸田文男 KODA, FUMIO , 山崎倫敬 YAMAZAKI, MICHIHIRO
IPC分类号： H01L , G01N
CPC分类号： G01N21/9501 , G01N21/47 , G01N21/55 , G01N21/8422 , G01N21/94 , G01N21/9505 , G01N2201/06113
摘要：本發明中光源部係將短波長與長波長之2種波長的光束使可變化其强度地射出。使光束對被檢體之被檢面以特定之入射角同時或擇一射入。根據由光源部所射出之光束的種類、及來自第1光强度檢測部之輸出,而調整由光源部所射出之至少長波長之光束的强度。將照射短波長之光束時之第1光强度檢測部的輸出與照射長波長之光束時之第1光强度檢測部的輸出作比較。將僅於照射長波長之光束時之第1光强度檢測部的輸出上顯現之信號判別為來自內部對象物之檢測信號。調整長波長之光束的强度。求出來自該內部對象物之檢測信號消失之附近的消失位準。將長波長之光束的第1强度設定為比消失位準高之位準。根據由第1强度之長波長之光束所獲得之第1光强度檢測部的輸出,測定被檢體內部之對象物。
简体摘要：本发明中光源部系将短波长与长波长之2种波长的光束使可变化其强度地射出。使光束对被检体之被检面以特定之入射角同时或择一射入。根据由光源部所射出之光束的种类、及来自第1光强度检测部之输出,而调整由光源部所射出之至少长波长之光束的强度。将照射短波长之光束时之第1光强度检测部的输出与照射长波长之光束时之第1光强度检测部的输出作比较。将仅于照射长波长之光束时之第1光强度检测部的输出上显现之信号判别为来自内部对象物之检测信号。调整长波长之光束的强度。求出来自该内部对象物之检测信号消失之附近的消失位准。将长波长之光束的第1强度设置为比消失位准高之位准。根据由第1强度之长波长之光束所获得之第1光强度检测部的输出,测定被检体内部之对象物。

19. 发明专利

TW200622234A 外觀檢查方法及其裝置 INSPECTING METHOD AND APPARATUS THEREOF 失效
简体标题：外观检查方法及其设备 INSPECTING METHOD AND APPARATUS THEREOF
公开(公告)号：TW200622234A
公开(公告)日：2006-07-01
申请号：TW094145021
申请日：2005-12-19
申请人：拓普康股份有限公司 KABUSHIKI KAISHA TOPCON
发明人：秋元茂行 AKIMOTO, SHIGEYUKI
IPC分类号： G01N
CPC分类号： G01N21/9501 , G01N21/956 , G01R31/311
摘要：一種可更正確判定缺陷是否在容許內的外觀檢查方法及裝置。藉由與被檢查體11a的圖像21A的檢查區域與樣板(21A)相比較，以判定抽出的缺陷是否在容許內。把檢查區域區分成多個容許度為互不相同的a、b、c不同的區段28a、28b、28c。當檢查區域上抽出的一個缺陷部位27跨容許度互不相同的多個區段28a、28b、28c而存在時，根據缺陷部位27的各缺陷部位部份27a、27b、27c所在位置的該區段28a、28b、28c的容許度a、b、c中被付予最嚴格條件的閥值a，來判定缺陷部位27的缺陷是否在容許內。
简体摘要：一种可更正确判定缺陷是否在容许内的外观检查方法及设备。借由与被检查体11a的图像21A的检查区域与样板(21A)相比较，以判定抽出的缺陷是否在容许内。把检查区域区分成多个容许度为互不相同的a、b、c不同的区段28a、28b、28c。当检查区域上抽出的一个缺陷部位27跨容许度互不相同的多个区段28a、28b、28c而存在时，根据缺陷部位27的各缺陷部位部份27a、27b、27c所在位置的该区段28a、28b、28c的容许度a、b、c中被付予最严格条件的阀值a，来判定缺陷部位27的缺陷是否在容许内。

20. 发明专利

TW200417728A 表面檢查方法及裝置 SURFACE INSPECTION METHOD AND APPARATUS 失效
简体标题：表面检查方法及设备 SURFACE INSPECTION METHOD AND APPARATUS
公开(公告)号：TW200417728A
公开(公告)日：2004-09-16
申请号：TW092128131
申请日：2003-10-09
申请人：拓普康股份有限公司 KABUSHIKI KAISHA TOPCON
发明人：磯崎久 HISASHI ISOZAKI , 山崎倫敬 MICHIHIRO YAMAZAKI , 吉川浩 HIROSHI YOSHIKAWA , 高瀨壯宏 TAKEHIRO TAKASE , 志田裕 YUTAKA SHIDA , 岩陽一郎 YOICHIRO IWA
IPC分类号： G01N
CPC分类号： G01N21/9501
摘要：本發明係揭示檢查晶圓表面之方法及裝置，其可切換或混合兩種或多種類雷射，以在薄膜塗層晶圓上經由一相同入射角而產生雷射入射，其中有關一檢查裝置的檢查資料與有關薄膜的薄膜參數是以彼此有關的狀態而儲存在該檢查機構的儲存裝置，如此可獲得預定的檢查條件。當執行每個測量時，操作員能透過該檢查機構的設定裝置而設定待測晶圓的薄膜參數。因此，該等想要的檢查條件能在該檢查裝置中自動設定。該等於每個測量中能由操作員設定的薄膜參數是一薄膜厚度與一薄膜折射率。
简体摘要：本发明系揭示检查晶圆表面之方法及设备，其可切换或混合两种或多种类激光，以在薄膜涂层晶圆上经由一相同入射角而产生激光入射，其中有关一检查设备的检查数据与有关薄膜的薄膜参数是以彼此有关的状态而存储在该检查机构的存储设备，如此可获得预定的检查条件。当运行每个测量时，操作员能透过该检查机构的设置设备而设置待测晶圆的薄膜参数。因此，该等想要的检查条件能在该检查设备中自动设置。该等于每个测量中能由操作员设置的薄膜参数是一薄膜厚度与一薄膜折射率。

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