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    • 12. 发明申请
    • NOVEL CMOS IMAGE SENSOR STRUCTURE
    • 新型CMOS图像传感器结构
    • US20130020662A1
    • 2013-01-24
    • US13185204
    • 2011-07-18
    • Min-Feng KaoDun-Nian YaungJen-Cheng LiuChun-Chieh ChuangWen-De Wang
    • Min-Feng KaoDun-Nian YaungJen-Cheng LiuChun-Chieh ChuangWen-De Wang
    • H01L31/02
    • H01L27/146H01L27/14632H01L27/14636H01L27/1464H01L27/14687
    • Provided is a method of fabricating an image sensor device. The method includes providing a first substrate having a radiation-sensing region disposed therein. The method includes providing a second substrate having a hydrogen implant layer, the hydrogen implant layer dividing the second substrate into a first portion and a second portion. The method includes bonding the first portion of the second substrate to the first substrate. The method includes after the bonding, removing the second portion of the second substrate. The method includes after the removing, forming one or more microelectronic devices in the first portion of the second substrate. The method includes forming an interconnect structure over the first portion of the second substrate, the interconnect structure containing interconnect features that are electrically coupled to the microelectronic devices.
    • 提供了一种制造图像传感器装置的方法。 该方法包括提供其中设置有辐射感测区域的第一基板。 该方法包括提供具有氢注入层的第二衬底,氢注入层将第二衬底分成第一部分和第二部分。 该方法包括将第二衬底的第一部分接合到第一衬底。 该方法包括在接合之后,去除第二衬底的第二部分。 该方法包括在去除之后,在第二衬底的第一部分中形成一个或多个微电子器件。 该方法包括在第二基板的第一部分上形成互连结构,所述互连结构包含电耦合到微电子器件的互连特征。
    • 15. 发明授权
    • Safety syringe
    • 安全注射器
    • US07927301B2
    • 2011-04-19
    • US12418556
    • 2009-04-03
    • Hsi-Hsun TsengChih-Ming WangPo-Liang LeeChun-Chieh Chuang
    • Hsi-Hsun TsengChih-Ming WangPo-Liang LeeChun-Chieh Chuang
    • A61M5/00
    • A61M5/3234A61M2005/323A61M2005/3241A61M2005/3242
    • A safety syringe includes an outer barrel, a needle unit, an outer barrel plug, an inner barrel, an inner barrel plug, a needle clamper, and a vacuum generating device. The needle unit is disposed within the front end of the outer barrel. The outer barrel plug is disposed within the outer barrel; the outer barrel plug is connected with the needle unit so as to fix the needle unit. The inner barrel plug is disposed within the front end of the inner barrel. The needle clamper is connected with the inner barrel plug. The needle clamper is able to clamp a rear opening of the needle unit. The vacuum generating device is disposed within the inner barrel, and the needle unit can be retracted into the inner barrel by the low pressure which is generated by the vacuum generating device.
    • 安全注射器包括外筒,针单元,外筒塞,内筒,内筒塞,针夹持器和真空产生装置。 针单元设置在外筒的前端内。 外桶塞设置在外筒内; 外筒塞与针单元连接,以固定针单元。 内筒塞设置在内筒的前端内。 针夹持器与内筒塞连接。 针夹具能够夹紧针单元的后开口。 真空发生装置设置在内筒内,并且针单元可以通过由真空发生装置产生的低压缩回到内筒中。
    • 20. 发明授权
    • Backside structure for BSI image sensor
    • BSI图像传感器的背面结构
    • US09356058B2
    • 2016-05-31
    • US13597007
    • 2012-08-28
    • Chun-Chieh ChuangDun-Nian YaungJen-Cheng LiuWen-De WangKeng-Yu ChouShuang-Ji TsaiMin-Feng Kao
    • Chun-Chieh ChuangDun-Nian YaungJen-Cheng LiuWen-De WangKeng-Yu ChouShuang-Ji TsaiMin-Feng Kao
    • H01L21/311H01L27/146
    • H01L27/1462H01L27/1464H01L27/14685
    • An embodiment method for forming an image sensor includes forming an anti-reflective coating over a surface of a semiconductor supporting a photodiode, forming an etching stop layer over the anti-reflective coating, forming a buffer oxide over the etching stop layer, and selectively removing a portion of the buffer oxide through etching, the etching stop layer protecting the anti-reflective coating during the etching. An embodiment image sensor includes a semiconductor disposed in an array region and in a periphery region, the semiconductor supporting a photodiode in the array region, an anti-reflective coating disposed over a surface of the semiconductor, an etching stop layer disposed over the anti-reflective coating, a thickness of the etching stop layer over the photodiode in the array region less than a thickness of the etching stop layer in the periphery region, and a buffer oxide disposed over the etching stop layer in the periphery region.
    • 用于形成图像传感器的实施例方法包括在支撑光电二极管的半导体的表面上形成抗反射涂层,在抗反射涂层上形成蚀刻停止层,在蚀刻停止层上形成缓冲氧化物,并且选择性地去除 通过蚀刻的缓冲氧化物的一部分,在蚀刻期间保护抗反射涂层的蚀刻停止层。 一种实施方式的图像传感器包括:配置在阵列区域和外围区域中的半导体,支撑阵列区域中的光电二极管的半导体,设置在半导体表面上的抗反射涂层, 在阵列区域中的光电二极管上的蚀刻停止层的厚度小于周边区域中的蚀刻停止层的厚度,以及设置在周边区域的蚀刻停止层上的缓冲氧化物。