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    • 123. 发明授权
    • Internal power supply circuit for generating internal power supply
potential by lowering external power supply potential
    • 内部电源电路,通过降低外部电源电位产生内部电源电位
    • US5442277A
    • 1995-08-15
    • US196730
    • 1994-02-15
    • Shigeru MoriTakeshi Kajimoto
    • Shigeru MoriTakeshi Kajimoto
    • G05F1/56G05F1/46G11C11/407G11C11/413H02J1/00G05F3/04
    • G05F1/465
    • An internal power supply circuit includes a main internal power supply potential generating circuit for generating an internal power supply potential based on a prescribed reference potential, and an auxiliary internal power supply potential generating circuit which is activated in response to a control signal and when activated, generating an internal power supply potential together with the main internal power supply potential generating circuit. The auxiliary internal power supply potential generating circuit includes a P channel MOS transistor for driving, a differential amplifying circuit for controlling the driving transistor by comparing the internal power supply potential with the reference potential and a standby potential supplying circuit for applying a standby potential which is slightly higher than the threshold potential at the which the transistor is rendered conductive, to the gate of the driving transistor while the differential amplifying circuit is not activated. In the internal power supply circuit, since a standby potential which is slightly higher than the threshold potential is applied to the gate of the driving transistor at the standby state, charges are immediately supplied to an output node when the auxiliary internal power supply potential generating circuit is activated.
    • 内部电源电路包括:用于产生基于规定参考电位的内部电源电位的主内部电源电位产生电路;以及响应于控制信号而被激活的辅助内部电源电位产生电路, 与主内部电源电位产生电路一起产生内部电源电位。 辅助内部电源电位产生电路包括用于驱动的​​P沟道MOS晶体管,用于通过将内部电源电位与参考电位进行比较来控制驱动晶体管的差分放大电路和用于施加待机电位的备用电位供应电路, 略高于晶体管导通的阈值电位,而差分放大电路未被激活时,驱动晶体管的栅极。 在内部电源电路中,由于在待机状态下将稍微高于阈值电位的待机电位施加到驱动晶体管的栅极,因此当辅助内部电源电位产生电路 被激活。
    • 124. 发明授权
    • Semiconductor memory device comprising a test circuit and a method of
operation thereof
    • 半导体存储器件,包括测试电路及其操作方法
    • US5436911A
    • 1995-07-25
    • US307082
    • 1994-09-16
    • Shigeru Mori
    • Shigeru Mori
    • G11C11/401G11C11/409G11C29/00G11C29/34G11C7/00
    • G11C29/34
    • A semiconductor memory device comprises a memory array. Each bit line pairs connected to a first amplifier. Write buses, read buses and a read/test circuit are provided. A column decoder selects simultaneously every other plurality of bit line pair at the time of testing. The read/test circuit compares the data read out from the selected plurality of bit line pair with the given expected data to provide the comparison result. Then the column decoder selects simultaneously the remaining one other plurality of bit line pairs. The read/test circuit compares data read out from the selected plurality of bit line pair with a given expected data to provide the comparison result.
    • 半导体存储器件包括存储器阵列。 每个位线对连接到第一放大器。 提供写总线,读总线和读/测电路。 列解码器在测试时同时选择其他多个位线对。 读/测试电路将从所选择的多个位线对中读出的数据与给定的预期数据进行比较,以提供比较结果。 然后,列解码器同时选择剩余的另一个多个位线对。 读取/测试电路将从所选择的多个位线对中读出的数据与给定的预期数据进行比较,以提供比较结果。
    • 126. 发明授权
    • Intermediate voltage generating circuit having low output impedance
    • 中压产生电路具有低输出阻抗
    • US5369354A
    • 1994-11-29
    • US107882
    • 1993-08-18
    • Shigeru Mori
    • Shigeru Mori
    • G05F1/618G05F3/24G11C11/407G05F3/16G05F3/20
    • G05F3/24
    • By reducing output impedance of an intermediate voltage generating circuit used in a DRAM and the like, an output voltage quickly recovers to an intermediate voltage even in the case where the output voltage fluctuates heavily. The intermediate voltage generating circuit includes a first reference voltage generating circuit, a second reference voltage generating circuit, a first intermediate voltage output stage, and a second intermediate voltage output stage. An MOS transistor configuring a current mirror is provided with the first and second intermediate voltage output stages. The size of the MOS transistor of the second intermediate voltage output stage is larger than that of a transistor of the first intermediate voltage output stage. As a result, in response to a current flowing in either transistor of the first intermediate voltage output stage, a current having a value equal to or more than that of the current flowing in either transistor of the first intermediate voltage output stage is supplied to an output node, whereby the output impedance is reduced.
    • 通过减少在DRAM等中使用的中间电压产生电路的输出阻抗,即使在输出电压剧烈波动的情况下,输出电压也迅速恢复到中间电压。 中间电压产生电路包括第一参考电压产生电路,第二参考电压产生电路,第一中间电压输出级和第二中间电压输出级。 配置电流镜的MOS晶体管具有第一和第二中间电压输出级。 第二中间电压输出级的MOS晶体管的尺寸大于第一中间电压输出级的晶体管的尺寸。 结果,响应于在第一中间电压输出级的任一晶体管中流动的电流,具有等于或大于在第一中间电压输出级的任一晶体管中流动的电流的电流的电流被提供给 输出节点,从而减小输出阻抗。