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    • 111. 发明授权
    • Capacitance-type displacement measuring apparatus
    • 电容式位移测量装置
    • US06292001B1
    • 2001-09-18
    • US09407865
    • 1999-10-20
    • Kouji SasakiNobuyuki Hayashi
    • Kouji SasakiNobuyuki Hayashi
    • G01R2726
    • G01D5/2415G01B7/003
    • A displacement sensor comprises a first scale (11) and a second scale (12) that are arranged opposing to each other and relatively movable in the measurement axis direction. The first scale (11) includes a transmitting electrode array (13) and a receiving electrode (14). The transmitting electrode array (13) consists of a plurality of transmitting electrode units arranged in a basic period (W1) in the measurement axis direction. Each transmitting electrode unit consists of n transmitting electrodes that are arranged in the measurement axis direction and receive respective phase signals of n-phase transmission signals. The receiving electrode (14) adjoins the transmitting electrode array (13) in the direction perpendicular to the displacement direction. The receiving electrode (14) has a width equal to the basic period (W1) and smaller than a width of the transmitting electrode array (13). The receiving electrode (14) has cut off corners (14a, 14b) at both ends in the width direction and close to the transmitting electrode array. The second scale (12) includes a plurality of coupling electrodes (18) that are formed in the basic period (W1) and capacitively couple with the transmitting electrode array (13) and receiving electrode (14).
    • 位移传感器包括彼此相对布置并且可以在测量轴线方向上相对移动的第一刻度(11)和第二刻度(12)。 第一标尺(11)包括发射电极阵列(13)和接收电极(14)。 发射电极阵列(13)由沿测量轴方向布置在基本周期(W1)中的多个发射电极单元组成。 每个发射电极单元由在测量轴方向上布置的n个发射电极组成,并接收n相传输信号的各个相位信号。 接收电极(14)在垂直于位移方向的方向上与发射电极阵列(13)相邻。 接收电极(14)的宽度等于基本周期(W1),并且小于发送电极阵列(13)的宽度。 接收电极(14)在宽度方向的两端处切断角(14a,14b),并且靠近发射电极阵列。 第二标尺(12)包括在基本周期(W1)中形成并与发射电极阵列(13)和接收电极(14)电容耦合的多个耦合电极(18)。
    • 120. 发明授权
    • Method of preparing yeast for fermentation test
    • 酵母发酵试验方法
    • US07713717B2
    • 2010-05-11
    • US10468295
    • 2002-02-18
    • Nobuyuki Hayashi
    • Nobuyuki Hayashi
    • A23C9/12A23J1/00A23L1/00A23L1/28C12C7/00C12N1/00C12Q1/02C12C3/12
    • C12Q1/24C12N1/18C12Q1/02G01N2333/39
    • A method of preparing a yeast usable in a fermentation test for evaluating malt on the laboratory scale whereby more reproducible test data can be obtained regardless of the operation conditions of a plant, etc.; and a medium to be used therein. A yeast for the fermentation test for evaluating malt is prepared by culturing a yeast in a liquid medium containing 0 to 2.5% by weight of glucose, 6.0 to 9.0% by weight of maltose, 0 to 2.5% by weight of sorbitol, 0 to 1.0% by weight of peptone and 0.3 to 1.0% by weight of yeast extract at 10 to 20° C. for 2 to 4 days under shaking (primary culture), then in the medium in an increased amount compared with the primary culture at 10 to 20° C. for 3 or 4 days under shaking (secondary culture), then in the medium in a further increased amount compared with the secondary culture at 8 to 9° C. for 7 to 9 days under stirring until the plats attains 3.0° P. or less (tertiary culture), allowing to stand in a cold room for 3 to 24 hours and then collecting the yeast.
    • 制备可用于实验室规模的发酵试验用于评价麦芽的酵母的方法,无论植物的操作条件如何,都可以获得更多可再现的测试数据; 和其中使用的介质。 通过在含有0〜2.5重量%葡萄糖,6.0〜9.0重量%麦芽糖,0〜2.5重量%山梨糖醇,0〜1.0重量%的麦芽糖的液体培养基中培养酵母来制备用于评价麦芽发酵试验的酵母 重量百分比的蛋白胨和0.3至1.0重量%的酵母提取物在10至20℃下摇动(原代培养)2-4天,然后在培养基中与原始培养物相比,在10至 20℃下振荡3次或4天(二级培养),然后在培养基中,在8-9℃下与二次培养相比,在搅拌下进一步增加7-9天,直到平板达到3.0° (三级培养物),允许在冷室中放置3至24小时,然后收集酵母。