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    • 114. 发明授权
    • Motor drive device
    • 电机驱动装置
    • US08111027B2
    • 2012-02-07
    • US12092241
    • 2006-10-31
    • Hiroshi Nakayama
    • Hiroshi Nakayama
    • H02P6/08
    • H02P6/34
    • The present motor control device detects from the speed of a motor and a current driving the motor that the motor is overloaded, and exerts control to set a target torque based on the detected overload state of the motor to cause the motor to output a maximal torque that the motor can output, intermittently within a preset allowable speed range. If the motor is overloaded, the motor's output torque is not decreased and a drive circuit can also be protected.
    • 本电动机控制装置根据电动机的速度和驱动电动机过载的电动机进行检测,并且基于检测到的电动机的过载状态进行控制以设定目标转矩,使电动机输出最大转矩 电机可以在预设的允许速度范围内间歇地输出。 如果电机过载,电机的输出转矩不会降低,也可以保护驱动电路。
    • 116. 发明授权
    • Probe card
    • 探针卡
    • US08018242B2
    • 2011-09-13
    • US12086031
    • 2006-12-04
    • Hiroshi NakayamaMitsuhiro NagayaYoshio Yamada
    • Hiroshi NakayamaMitsuhiro NagayaYoshio Yamada
    • G01R1/00
    • G01R31/2889G01R1/07378
    • A probe card includes probes that are made of a conductive material and come into contact with a semiconductor wafer to receive or output an electric signal; a probe head that holds the probes; a substrate that has a wiring pattern corresponding to a circuit structure for generating a signal for a test; a reinforcing member that reinforces the substrate; an interposer that is stacked on the substrate for connection of wires of the substrate; a space transformer that is stacked between the interposer and the probe head and transforms intervals among the wires; and a plurality of first post members that have a height greater than the thickness of the substrate, and are embedded in a portion of the substrate on which the interposer is stacked.
    • 探针卡包括由导电材料制成并与半导体晶片接触以接收或输出电信号的探针; 保持探头的探针头; 具有对应于用于产生测试信号的电路结构的布线图案的基板; 加强基板的加强构件; 叠置在基板上用于连接基板的导线的插入件; 空间变换器,堆叠在插入器和探头之间,并且变换线间的间隔; 以及具有高于基板的厚度的高度的多个第一柱状构件,并且嵌入在其上堆叠有插入件的基板的一部分中。
    • 118. 发明申请
    • WIRING SUBSTRATE AND PROBE CARD
    • 接线基板和探头卡
    • US20100327897A1
    • 2010-12-30
    • US12735929
    • 2009-02-26
    • Toshio KazamaHiroshi NakayamaShinya MiyajiKohei Suzuki
    • Toshio KazamaHiroshi NakayamaShinya MiyajiKohei Suzuki
    • G01R1/073G01R31/26H05K1/00
    • G01R1/07378G01R31/2889H05K3/4605H05K3/467H05K2201/068
    • A wiring substrate that allows wiring at a fine pitch and has a coefficient of thermal expansion close to the coefficient of thermal expansion of silicone, and a probe card that includes the wiring substrate are provided. To this end, there are provided a wiring substrate that includes a ceramic substrate having a coefficient of thermal expansion of 3×10−6 to 5×10−6/° C. and one or more thin-film wiring sheets stacked on one surface of the ceramic substrate, and a probe head on which a plurality of conductive proves are arranged in accordance with wiring on the thin-film wiring sheet, which holds individual probes while preventing the probes from coming off and allowing both ends of each probe to be exposed, and which is stacked on the wiring substrate while one end of each probe is brought into contact with the thin-film wiring sheet.
    • 提供允许以细间距布线并且具有接近硅树脂的热膨胀系数的热膨胀系数的布线基板和包括布线基板的探针卡。 为此,提供一种布线基板,其包括具有3×10-6〜5×10-6 /℃的热膨胀系数的陶瓷基板和在一个面上堆叠的一个以上的薄膜布线片 的陶瓷基板,以及探针头,根据薄膜布线片上的布线布置有多个导电证明物,该探针头保持各个探针,同时防止探针脱落并且允许每个探针的两端为 暴露,并且在每个探针的一端与薄膜布线片接触的同时在布线基板上层叠。
    • 120. 发明授权
    • Probe card
    • 探针卡
    • US07795892B2
    • 2010-09-14
    • US12087244
    • 2006-12-20
    • Yoshio YamadaHiroshi NakayamaMitsuhiro NagayaShogo Imuta
    • Yoshio YamadaHiroshi NakayamaMitsuhiro NagayaShogo Imuta
    • G01R31/02
    • G01R1/07378G01R1/44G01R31/2863G01R31/2874
    • Provided is a probe card capable of surely bringing probes into contact with a contact object regardless of a temperature environment of a test. To achieve the object, the probe card includes a plurality of probes that are made of a conductive material and come into contact with electrode pads of a semiconductor wafer to input or output an electric signal; a probe head that houses and holds the probes; a substrate that has a wiring pattern corresponding to the circuitry; and a space transformer that is stacked on the probe head, changes a space of the wiring pattern of the substrate and thus relays wires, and has electrode pads provided on a surface on a side opposed to the probe head in association with the relayed wires. Both ends of the probes come into contact with portions near the centers of the electrodes pads of the semiconductor wafer and the space transformer under an environment having an average temperature of a lowest temperature and a highest temperature in testing the semiconductor wafer.
    • 提供了一种探针卡,其能够确保使探针与接触物体接触,而与测试的温度环境无关。 为了实现该目的,探针卡包括由导电材料制成并与半导体晶片的电极焊盘接触以输入或输出电信号的多个探针; 探针头,用于容纳和保持探针; 具有对应于所述电路的布线图案的基板; 以及堆叠在探头上的空间变换器,改变基板的布线图案的空间,从而中继线,并且与中继线相关联地具有设置在与探头相对的一侧的表面上的电极焊盘。 在半导体晶片的测试中,在具有最低温度和最高温度的平均温度的环境下,探针的两端与半导体晶片和空间变换器的电极焊盘的中心附近的部分接触。