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    • 105. 发明申请
    • Split Voltage Non-Volatile Latch Cell
    • 分离电压非易失性锁存器
    • US20160217861A1
    • 2016-07-28
    • US14858813
    • 2015-09-18
    • Cypress Semiconductor Corporation
    • Jayant AshokkumarVijay RaghavanVenkatraman PrabhakarSwatilekha Saha
    • G11C16/14G11C14/00G11C11/22G11C16/04
    • G11C16/14G11C11/2275G11C14/00G11C14/0063G11C14/0072G11C16/0408G11C16/0466G11C16/0483
    • A memory including an array of non-volatile latch (NVL) cells and method of operating the same are provided. In one embodiment, each NVL cell includes a non-volatile portion and a volatile portion. The non-volatile portion includes a first non-volatile memory (NVM) device and a first pass gate transistor coupled in series between a first output node and a bitline true, and a second NVM device and a second pass gate transistor coupled in series between a second output node and a bitline complement. The volatile portion includes cross-coupled first and second field effect transistors (FET), the first FET coupled between a supply voltage (VPWR) and the first output node, and the second FET coupled between VPWR and the second output node. A gate of the first FET is coupled to the second output node, and a gate of the second FET is coupled to the first output node.
    • 提供包括非易失性锁存(NVL)单元阵列的存储器及其操作方法。 在一个实施例中,每个NVL单元包括非易失性部分和易失性部分。 非易失性部分包括第一非易失性存储器(NVM)器件和串联耦​​合在第一输出节点和位线真之间的第一非易失性存储器(NVM)器件和第一通过栅极晶体管,以及串联耦合的第二NVM器件和第二通过栅极晶体管 第二输出节点和位线补码。 易失性部分包括交叉耦合的第一和第二场效应晶体管(FET),耦合在电源电压(VPWR)和第一输出节点之间的第一FET以及耦合在VPWR和第二输出节点之间的第二FET。 第一FET的栅极耦合到第二输出节点,并且第二FET的栅极耦合到第一输出节点。
    • 107. 发明授权
    • Semiconductor memory device
    • 半导体存储器件
    • US08804403B2
    • 2014-08-12
    • US13969221
    • 2013-08-16
    • Kabushiki Kaisha Toshiba
    • Keiichi Kushida
    • G11C14/00
    • G11C13/004G11C8/16G11C13/0069G11C14/0072G11C14/0081G11C14/009G11C2013/0073
    • According to one embodiment, there is provided a semiconductor memory device including a memory cell. The memory cell includes a first driving transistor, a first load transistor, a first read transfer transistor, a first write transfer transistor, a second driving transistor, a second load transistor, a second read transfer transistor, a second write transfer transistor, and one or more variable resistance elements. The one or more variable resistance elements has resistance that changes depending on a direction of a bias applied to both terminals. The one or more variable resistance elements are arranged in at least one of a portion between a first storage node and a first write transfer transistor and a portion between a second storage node and a second write transfer transistor.
    • 根据一个实施例,提供了一种包括存储单元的半导体存储器件。 存储单元包括第一驱动晶体管,第一负载晶体管,第一读传输晶体管,第一写传输晶体管,第二驱动晶体管,第二负载晶体管,第二读传输晶体管,第二写传输晶体管和一 或更多的可变电阻元件。 一个或多个可变电阻元件具有根据施加到两个端子的偏压的方向而变化的电阻。 一个或多个可变电阻元件被布置在第一存储节点和第一写入传输晶体管之间的部分中的至少一个以及第二存储节点和第二写入传输晶体管之间的部分中的至少一个中。
    • 110. 发明申请
    • Data Holding Device
    • 数据保持装置
    • US20110199810A1
    • 2011-08-18
    • US13025395
    • 2011-02-11
    • Hiromitsu KimuraJun IidaKoji NigoriikeYoshinobu Ichida
    • Hiromitsu KimuraJun IidaKoji NigoriikeYoshinobu Ichida
    • G11C11/22
    • G11C14/0072H03K3/356008H03K3/45H03K19/0016
    • A data holding device according to the present invention includes a loop structure portion LOOP for holding data using a plurality of logic gates (NAND3 and NAND4) connected in a loop, a nonvolatile storage portion (NVM) for storing in a nonvolatile manner the data held in the loop structure portion (LOOP) by using the hysteresis characteristics of ferroelectric elements, a circuit separating portion (SEP) for electrically separating the loop structure portion (LOOP) and the nonvolatile storage portion (NVM), and a set/reset controller (SRC) for generating a set signal (SNL) and reset signal (RNL) based on data stored in the nonvolatile storage portion (NVM), wherein the plurality of logic gates are each set and reset to an arbitrary output logic level in accordance with the set signal (SNL) and reset signal (RNL).
    • 根据本发明的数据保持装置包括用于使用以循环连接的多个逻辑门(NAND3和NAND4)保存数据的环路结构部分LOOP,用于以非易失性方式存储数据的非易失性存储部分(NVM) 通过使用铁电元件的滞后特性在环路结构部分(LOOP)中,用于使环路结构部分(LOOP)和非易失性存储部分(NVM)电气分离的电路分离部分(SEP)和设置/复位控制器 SRC),用于根据存储在非易失性存储部分(NVM)中的数据产生设置信号(SNL)和复位信号(RNL),其中,多个逻辑门被设置并根据该信号被复位到任意的输出逻辑电平 置位信号(SNL)和复位信号(RNL)。