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    • 101. 发明专利
      JPS6330749A APPARATUS FOR INSPECTING SURFACE FLAW 失效
    • APPARATUS FOR INSPECTING SURFACE FLAW
    • JPS6330749A
    • 1988-02-09
    • JP17528886
    • 1986-07-23
    • TOYOTA MOTOR CORP
    • SAKAKIBARA MASATO
    • G01B11/30 , G01N21/88
    • PURPOSE:To inspect the presence of the surface flaw of a body objectively, quantitatively and automatically, by providing a bright and dark pattern projection apparatus, a medium density part detector and a judge device. CONSTITUTION:A stripe pattern projection apparatus 1 projects a stripe bright and dark pattern to the surface of an article OB to be inspected subjected to the inspection of the presence of a flaw such as unevenness. Subsequently, a medium density part detection apparatus 3 picks up the virtual image of the stripe pattern projected to the surface of the article OB to be inspected and detects a medium density parts not belonging to both of the bright and dark parts of the bright and dark pattern. A judge device 5 extracts the medium density part having a predetermined area or more among the medium density parts detected by the detection apparatus 3 as the surface flaw part of the article OB to be inspected to output an inspection result. By this method, the flaw part such as unevenness on the article to be inspected can be detected automatically and working efficiency can be enhanced.
    • 基本信息 添加关注 加入工作空间 PDF全文 PDF下载 全文下载 相似专利 双屏查看 权利要求书 说明书全文 Espacenet 法律信息 同族专利 专利引用
    • 102. 发明专利
      JPS6138550A Inspecting method of surface defect 失效
    • Inspecting method of surface defect
    • 表面缺陷检查方法
    • JPS6138550A
    • 1986-02-24
    • JP16076084
    • 1984-07-31
    • Toyota Motor Corp
    • SAKAKIBARA MASATO
    • G01B11/30 , G01N21/88 , G01N21/93
    • G01N21/8803
    • PURPOSE:To perform simply and securely the defect inspection of a rough inspection surface by using a lens for an irradiating device and putting an apparent position closer to the inspection surface. CONSTITUTION:The lens 10 is fitted to the aperture end part of the irradiating device 3 and the side of the lens 10 is placed opposite the inspection surface 2. Light from a light source 7 is guided to the lens 10 through a scattering plate 5 and a grating 9. The lens 10 forms a grating image 1 of the grating 9 on the side in the heading direction of the light. Therefore, the apparent position of the grating image 1 is put closer to the inspection surface 2 and the distance l from the inspection surface 2 to the grating image 1 decreases. Consequently, the distance l between the mirror image 1'' of the grating image 1 and inspection surface 2 also decreases and variation of the mirror image also decreases correspondingly. Therefore, unevenness based upon the surface defect in the inspection surface 2 is larger than that based upon the roughness of the inspection surface 2, so only the unevenness based upon the surface defect is captured as variation of the sharp mirror image 1'', so that the surface defect is inspected very easily and securely.
    • 目的：通过使用用于照射装置的透镜并使表观位置更靠近检查表面，简单可靠地执行粗糙检查表面的缺陷检查。 构成：将透镜10安装在照射装置3的开口端部，透镜10的一侧与检查面2相对配置。来自光源7的光通过散射板5被引导到透镜10， 光栅9.透镜10在光的行进方向的一侧形成光栅9的光栅图像1。 因此，光栅图像1的表观位置靠近检查面2，从检查面2到光栅图像1的距离l减小。 因此，光栅图像1的镜像1“和检查表面2之间的距离l也减小，镜像的变化也相应地降低。 因此，基于检查表面2的表面缺陷的不均匀性大于基于检查表面2的粗糙度的不均匀度，因此仅捕获基于表面缺陷的不平坦度作为锐利镜像1“的变化，因此 表面缺陷被非常容易和安全地检查。
    • 基本信息 添加关注 加入工作空间 PDF全文 PDF下载 全文下载 相似专利 双屏查看 权利要求书 说明书全文 Espacenet 法律信息 同族专利 专利引用
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