专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

91. 发明公开

EP1410051A2 VERFAHREN UND VORRICHTUNG ZUR PRÜFUNG VON ELEKTRISCHEN LEITUNGEN UND/ODER ELEKTRISCHEN VERBRAUCHERN IN EINEM FAHRZEUG AUF FEHLER 有权
标题翻译：方法和装置的电线和/或电气消费者对车辆在误差测试
公开(公告)号：EP1410051A2
公开(公告)日：2004-04-21
申请号：EP01969398.5
申请日：2001-07-17
申请人： Volkswagen Aktiengesellschaft , Sentronik GmbH
发明人： MÖHLEN, Hartmut , WATTENBERG, Jörg , SCHRAMM, Hans, Ulrich , JAUNSSEYFRIED, Stefanie , ASCHE, Ralf , NIERAESE, Ralph , SIEGEL, Georg
IPC分类号： G01R31/00
CPC分类号： G01R31/04 , G01R31/007 , G01R31/024 , G01R31/11 , G01R31/2837 , G01R31/2839
摘要： The invention relates to a method and a device for checking for errors in electrical lines and/or electrical consumers in a vehicle, especially defective connections. The device comprises: a unit (5, 6) for producing a frequency signal having a constant or variable frequency and a voltage level producing an essentially idle check; a unit (8) for storing a reference measuring signal detected by feeding the frequency signal into an error-free model of an electrical installation to be checked, said installation being provided in the form of an electrical line and/or an electrical consumer; a unit for recording a measuring signal produced from the supplied frequency signal; a unit (9) for evaluating signals which compares the recorded measurement signal with the stored reference measuring signal in terms of voltage amplitude, running time delay of the frequency, presence of spike pulses, ohmic line resistance and/or frequency-related changes of current; and a unit (12) which indicates the result of the signal comparison.

92. 发明公开

EP0962783A3 Apparatus for measuring electrical characteristics of circuit 有权
标题翻译：装置，用于测量电路的电气特性
公开(公告)号：EP0962783A3
公开(公告)日：2003-04-23
申请号：EP99110804.4
申请日：1999-06-04
申请人： Murata Manufacturing Co., Ltd.
发明人： Ishikawa, Yohei, Murata Manufacturing Co. Ltd. , Tanaka, Hiroaki, Murata Manufacturing Co. Ltd. , Kochi, Tetsuya, Murata Manufacturing Co. Ltd.
IPC分类号： G01R31/28
CPC分类号： G01R27/28 , G01R31/2822 , G01R31/2839
摘要： A multi-carrier measuring apparatus includes a multi-carrier generator (21) for generating a multi-carrier signal composed of signals having plural frequencies and being orthogonal to each other, an output (25) for inputting the multi-carrier signals to a object (12) at the same time, and receiving the multi-carrier signals reflected on or passed through the object (12), a frequency characteristic measuring apparatus (26) for measuring the characteristics for the respective frequencies of the object (12) based on the received signal, and an indicator (10).

93. 发明公开

EP0979416A1 COHERENT SWITCHING POWER SUPPLY FOR AN ANALOG CIRCUIT TESTER 失效
标题翻译：相干电源的模拟电路测试装置
公开(公告)号：EP0979416A1
公开(公告)日：2000-02-16
申请号：EP98920043.1
申请日：1998-04-28
申请人： CREDENCE SYSTEMS CORPORATION
发明人： FERLAND, Michael, R. , CURRIN, Jeffrey, D.
IPC分类号： G01R31/26
CPC分类号： G01R31/2839
摘要： A circuit tester stimulates an analog circuit device under test (DUT) (11) with a test signal generated by waveform synthesizer (12) and periodically digitizes a resulting DUT output signal in digitizer (14) to produce an output data sequence that may be analyzed by host computer (18) to ascertain DUT operating characteristics. The tester is powered by a switching power supply (32) that induces periodic noise spikes in the DUT output signal. To eliminate the influence of the noise spikes on test results, the period of the switching power supply noise is made coherent with the digitization period. The phase of digitization is then adjusted so that the tester avoids digitizing the noise spikes in the DUT output signal.

94. 发明公开

EP0962783A2 Apparatus for measuring electrical characteristics of circuit 有权
标题翻译： Gerätzur Messung der elektrischen Eigenschaften von Schaltungen
公开(公告)号：EP0962783A2
公开(公告)日：1999-12-08
申请号：EP99110804.4
申请日：1999-06-04
申请人： Murata Manufacturing Co., Ltd.
发明人： Ishikawa, Yohei, Murata Manufacturing Co. Ltd. , Tanaka, Hiroaki, Murata Manufacturing Co. Ltd. , Kochi, Tetsuya, Murata Manufacturing Co. Ltd.
IPC分类号： G01R31/28
CPC分类号： G01R27/28 , G01R31/2822 , G01R31/2839
摘要： A multi-carrier measuring apparatus includes a multi-carrier generator (21) for generating a multi-carrier signal composed of signals having plural frequencies and being orthogonal to each other, an output (25) for inputting the multi-carrier signals to a object (12) at the same time, and receiving the multi-carrier signals reflected on or passed through the object (12), a frequency characteristic measuring apparatus (26) for measuring the characteristics for the respective frequencies of the object (12) based on the received signal, and an indicator (10).
摘要翻译：一种多载波测量装置，包括：多载波发生器（21），用于产生由具有多个频率并且彼此正交的信号组成的多载波信号;输出端（25），用于将多载波信号输入到对象（12），并且接收在物体（12）上反射或穿过物体（12）的多载波信号;频率特性测量装置（26），用于基于对象（12）的相应频率的特性来测量接收信号和指示器（10）。

95. 发明申请

WO2016038080A1 METHOD AND SYSTEM FOR TESTING AN ELECTRONIC UNIT 审中-公开
标题翻译：用于测试电子单元的方法和系统
公开(公告)号：WO2016038080A1
公开(公告)日：2016-03-17
申请号：PCT/EP2015/070591
申请日：2015-09-09
申请人： ENICS AG
发明人： FEDERLEY, Kristian , MATTILA, Jukka
IPC分类号： G01R31/28
CPC分类号： G01R31/2834 , G01R31/2839 , G01R31/31703
摘要： The method and system of the invention are intended for testing an electronic unit (3b) by feeding one or more predefined signal shapes created by a signal generator (1 ) of the system as input signals to a known functioning unit (3a) and to a unit to be tested (3b) at corresponding test points (10a, 10b). The resulting signal shapes are measured with a measuring instrument (4) of the system from both units (3a, 3b) at corresponding measurement points (8d, 8e, 8f and 8g, 8h, 8i) simultaneously or separately. At least one resulting signal shape from the good unit (3a) is then compared with the corresponding resulting signal shape from the unit to be tested (3b). A fault in the unit to be tested (3b) is detected on the basis of an existing signal shape distortion in time axis of the resulting signal shape received from the unit to be tested. The electronic unit under test (3b)is comprised in the system simultaneously or interchangeably with the electronic functioning unit (3a). The resulting signal shape is presented by transforming it into discrete values that describe the signal shape. The computer program product of the invention executes the method steps when run in computer readable media in the system. The method of the invention is used for electronics production testing, fault identification in electronics repair, component testing in manufacturing and repair, or counterfeit component identification.
摘要翻译：本发明的方法和系统旨在通过将由系统的信号发生器（1）创建的一个或多个预定义的信号形状作为输入信号馈送到已知的功能单元（3a）来测试电子单元（3b），并且在相应的测试点（10a，10b）处要测试的单元（3b）。所产生的信号形状用系统的测量仪器（4）从相应的测量点（8d，8e，8f和8g，8h，8i）同时或分开地从两个单元（3a，3b）测量。然后将来自良好单元（3a）的至少一个所得到的信号形状与来自待测试单元（3b）的相应的结果信号形状进行比较。基于从被测单元接收到的结果信号形状的时间轴上的现有信号形状失真，检测待测单元（3b）中的故障。被测电子单元（3b）与电子功能单元（3a）同时或互换地包含在系统中。通过将其变换成描述信号形状的离散值来呈现所得到的信号形状。本发明的计算机程序产品在系统中的计算机可读介质中运行时执行方法步骤。本发明的方法用于电子生产测试，电子维修中的故障识别，制造和维修中的部件测试或假冒部件识别。

96. 发明申请

WO2012075123A2 SYSTEM FREQUENCY RESPONSE TEST USING CONTINUOUS SWEEP FREQUENCIES 审中-公开
标题翻译：使用连续扫频频率的系统频率响应测试
公开(公告)号：WO2012075123A2
公开(公告)日：2012-06-07
申请号：PCT/US2011062614
申请日：2011-11-30
申请人： TEXAS INSTRUMENTS INC , TEXAS INSTRUMENTS JAPAN , TARNG TONY J
发明人： TARNG TONY J
IPC分类号： G01R23/16
CPC分类号： G01R31/2837 , G01R31/2839
摘要： A system and method for measuring the frequency response of a system under test using a single swept-frequency chirp signal. A tapered chirp-frequency test signal is created with a bandwidth defined by first and second frequencies (1101). The test signal is routed to a calibration path (1102), and the output of the calibration path is routed to a digitizer (1103). The output of the calibration path is digitized (1104), and a Fourier Transform of the calibration path output is generated (1105). The test signal is then routed to a test system (1106), and the output of the test system is coupled to the digitizer (1107). The output of the test system is digitized (1108), and a Fourier Transform of the test system output is generated (1109). A normalized frequency- domain representation of the test system created by dividing the Fourier Transform of the test system output by the Fourier Transform of the calibration path output (1110).
摘要翻译：一种使用单个扫频啁啾信号测量被测系统的频率响应的系统和方法。利用由第一和第二频率定义的带宽创建锥形啁啾频率测试信号（1101）。测试信号被路由到校准路径（1102），并且校准路径的输出被路由到数字化器（1103）。校准路径的输出被数字化（1104），并且校准路径输出的傅立叶变换被生成（1105）。测试信号然后被路由到测试系统（1106），并且测试系统的输出被耦合到数字化仪（1107）。测试系统的输出被数字化（1108），并且测试系统输出的傅立叶变换被生成（1109）。通过将测试系统输出的傅里叶变换除以校准路径输出（1110）的傅立叶变换而创建的测试系统的归一化频域表示。

97. 发明申请

WO2009025070A1 試験システムおよびドーターユニット审中-公开
标题翻译：测试系统和DAUGHTER单元
公开(公告)号：WO2009025070A1
公开(公告)日：2009-02-26
申请号：PCT/JP2008/002137
申请日：2008-08-06
申请人：株式会社アドバンテスト , 宮内康司 , 渡辺俊幸
发明人：宮内康司 , 渡辺俊幸
IPC分类号： G01R31/26
CPC分类号： G01R31/2822 , G01R1/18 , G01R31/2839 , G01R31/2887
摘要：　被試験デバイスを試験する試験システムであって、被試験デバイスに供給すべき試験信号を発生する試験モジュールを有するテストヘッドと、テストヘッド上に載置され、試験モジュールが発生した試験信号を伝送するパフォーマンスボードと、パフォーマンスボード上に着脱可能に搭載され、パフォーマンスボードから被試験デバイスへと試験信号を伝送するドーターユニットと、を備え、ドーターユニットは、被試験デバイスを搭載するソケットと、ソケットを実装するドーターボードと、ソケットおよびドーターボードを内側に格納し、外部からソケットおよびドーターボードに対するノイズを遮断するドーターユニット側シールドを含む筐体とを有する試験システムを提供する。
摘要翻译：用于测试被测设备的测试单元设置有测试头，其包括用于产生要提供给被测设备的测试信号的测试模块，安装在测试头上的性能板，用于发送由测试产生的测试信号模块和可拆卸地安装在所述性能板上的子单元，用于将所述测试信号从所述性能板发送到所述被测设备，其中所述子单元具有用于设置被测器件的插座，用于安装所述插座的子板，以及壳体，其将插座和子板存储在内部，并且在子单元的侧面上包括屏蔽，以屏蔽插座和子板从外部的噪音。

98. 发明申请

WO2008086908A1 A METHOD FOR DETERMINING THE CURRENT RETURN PATH INTEGRITY IN AN ELECTRIC DEVICE CONNECTED OR CONNECTABLE TO A FURTHER DEVICE 审中-公开
标题翻译：一种用于确定连接或连接到另一设备的电气设备中的电流返回路径完整性的方法
公开(公告)号：WO2008086908A1
公开(公告)日：2008-07-24
申请号：PCT/EP2007/062542
申请日：2007-11-20
申请人： INTERNATIONAL BUSINESS MACHINES CORPORATION , FRECH, Roland , KLINK, Erich , SAALMÜLLER, Jürgen
发明人： FRECH, Roland , KLINK, Erich , SAALMÜLLER, Jürgen
IPC分类号： G01R31/28 , G01R31/02 , G01R31/3185 , H04B3/46 , H04M3/34
CPC分类号： G01R27/28 , G01R27/16 , G01R31/025 , G01R31/046 , G01R31/2839 , G01R31/31855 , H04B3/487
摘要： A method for determining current return path integrity in an electric device (10) with a plurality of signal lines (22, 26) and supply lines (24). A library with at least one reference signal pattern (50) of a near end crosstalk signal on a defined signal line (26) arising from an input signal (18) on another defined signal line (22) is provided, a predetermined signal (18) to a selected signal line (22) of the electric device (10) is applied, the near end crosstalk signal (20) on at least one further signal line (26) of the electric device (10) is detected, said near end crosstalk signal (20) is compared with the corresponding reference signal pattern (50) from the library, and if there is a deviation between the near end crosstalk signal (20) and the corresponding reference signal pattern (50), an information that there is any defect in the electric device (10) is displayed.
摘要翻译：一种用于确定具有多个信号线（22,26）和电源线（24）的电气设备（10）中的当前返回路径完整性的方法。提供了在另一个限定的信号线（22）上由输入信号（18）产生的在限定的信号线（26）上具有近端串扰信号的至少一个参考信号模式（50）的库，预定信号）到电气设备（10）的选定信号线（22），检测到电气设备（10）的至少一个其它信号线（26）上的近端串扰信号（20），所述近端将串扰信号（20）与来自库的相应的参考信号模式（50）进行比较，并且如果近端串扰信号（20）和对应的参考信号模式（50）之间存在偏差，则存在信息显示电气设备（10）中的任何缺陷。

99. 发明申请

WO2004113936A1 LOSS-COMPENSATING CIRCUIT 审中-公开
标题翻译：损耗补偿电路
公开(公告)号：WO2004113936A1
公开(公告)日：2004-12-29
申请号：PCT/NL2004/000400
申请日：2004-06-04
申请人： TECHNISCHE UNIVERSITEIT DELFT , DE VREEDE, Leo , PELK, Marco, Johannes
发明人： DE VREEDE, Leo , PELK, Marco, Johannes
IPC分类号： G01R1/067
CPC分类号： G01R31/2822 , G01R27/32 , G01R31/2839
摘要： Loss-compensating circuit for use when analysing electrical properties, such as largesignal properties, of an electronic device to be tested (1) by means of an impedance tuner (6; 7). The loss-compensating circuit (15) comprises two symmetrically positioned negative impedance elements (26, 27) separated by a phase shift network (17; 28; 30). By this means the losses between the tuner (6; 7) and the electronic device (1) are at least compensated in a predetermined frequency band around an operating frequency of the loss-compensating circuit (15).
摘要翻译：损耗补偿电路，用于通过阻抗调谐器（6; 7）分析要测试的电子设备（1）的电气特性（例如大规模性能）时使用。损耗补偿电路（15）包括由相移网络（17; 28; 30）分开的两个对称位置的负阻抗元件（26,27）。通过这种方式，调谐器（6; 7）和电子设备（1）之间的损耗至少在围绕损耗补偿电路（15）的工作频率的预定频带中被补偿。

100. 发明申请

WO2003076958A1 半導体試験装置审中-公开
标题翻译：半导体测试设备
公开(公告)号：WO2003076958A1
公开(公告)日：2003-09-18
申请号：PCT/JP2003/002723
申请日：2003-03-07
申请人：株式会社アドバンテスト , 磯部勝美
发明人：磯部勝美
IPC分类号： G01R31/28
CPC分类号： G01R31/2839 , G01R31/2832
摘要： A semiconductor test device capable of testing a test device by driver-outputting a high voltage without increasing power consumption of a high-speed driver. The semiconductor test device switches between a high-speed voltage of high voltage (VH) and low voltage (VL) and another high voltage (VHH >VH) higher than the high voltage (VH) for driver output, thereby testing the test device. The semiconductor test device includes a first buffer unit for outputting the high speed voltage (VH/VL) by push-pull of an emitter follower serving as a source and an emitter follower serving as a sink, and a second buffer unit for outputting the high voltage (VHH) by push-pull of an emitter follower serving as a sink of the first buffer unit and an emitter follower serving as a source of the high voltage.
摘要翻译：一种能够通过驱动器测试测试装置的半导体测试装置，其输出高电压而不增加高速驱动器的功率消耗。半导体测试装置在高电压（VH）和低电压（VL）的高速电压和高于用于驱动器输出的高电压（VH）的高电压（VHH> VH）之间切换，从而测试测试装置。半导体测试装置包括：第一缓冲单元，用于通过作为源的射极跟随器和作为宿的射极跟随器的推挽输出高速电压（VH / VL），以及用于输出高电平的第二缓冲单元用作第一缓冲单元的吸收器的射极跟随器的推挽电压（VHH）和作为高电压源的射极跟随器。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式