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    • 91. 发明申请
    • NON-VOLATILE, ELECTRICALLY-PROGRAMMABLE MEMORY
    • 非易失性,电可编程存储器
    • US20080052458A1
    • 2008-02-28
    • US11844465
    • 2007-08-24
    • Rino MicheloniRoberto Ravasio
    • Rino MicheloniRoberto Ravasio
    • G06F12/00
    • G11C11/5628G11C16/0483G11C16/3418G11C2211/5641
    • A solid-state mass storage device is provided. The solid-state mass storage device defines a storage area adapted to store data; the storage area is adapted to be exploited for storing data with a first storage density at a first data transfer speed. The storage area includes at least a first storage area portion and a second storage area portion. The solid-state mass storage device further includes accessing logic adapted to exploit the first storage area portion for storing data with a second storage density at a second data transfer speed, and adapted to exploit the second storage area portion for storing data with a third storage density and a third data transfer speed. The second storage density is lower than the third storage density, which is in turn lower than or equal to the first storage density; the second data transfer speed is higher than the third data transfer speed, which is in turn higher than or equal to the first data transfer speed.
    • 提供固态大容量存储装置。 固态大容量存储装置定义适于存储数据的存储区域; 存储区域适于被利用以以第一数据传送速度存储具有第一存储密度的数据。 存储区域至少包括第一存储区域部分和第二存储区域部分。 固体大容量存储装置还包括访问逻辑,其适于利用第一存储区域部分以第二数据传输速度存储具有第二存储密度的数据,并且适于利用第二存储区域部分来存储具有第三存储器的数据 密度和第三数据传输速度。 第二储存密度低于第三储存密度,其又低于或等于第一储存密度; 第二数据传送速度高于第三数据传送速度,其又高于或等于第一数据传送速度。
    • 92. 发明申请
    • METHOD FOR COMPACTING THE ERASED THRESHOLD VOLTAGE DISTRIBUTION OF FLASH MEMORY DEVICES DURING WRITING OPERATIONS
    • 写入操作期间闪存存储器件的擦除阈值电压分配方法
    • US20080049521A1
    • 2008-02-28
    • US11844480
    • 2007-08-24
    • Rino MicheloniLuca CrippaRoberto RavasioFederico Pio
    • Rino MicheloniLuca CrippaRoberto RavasioFederico Pio
    • G11C16/04
    • G11C16/344
    • A method for operating a flash memory device. The memory device includes a matrix of memory cells each one having a programmable threshold voltage defining a value stored in the memory cell. The method includes the steps of erasing a block of memory cells, and compacting the threshold voltages of the memory cells of the block within a predefined compacting range, wherein the step of compacting includes: selecting at least one first memory cell of the block for writing a target value; restoring the threshold voltage of a subset of the memory cells of the block to the compacting range, the subset including the at least one first memory cell and/or at least one second memory cell of the block being adjacent to the at least one first memory cell; and at least partially writing the target value into the at least one first memory cell.
    • 一种用于操作闪存设备的方法。 存储器件包括存储器单元矩阵,每个存储器单元具有限定存储在存储器单元中的值的可编程阈值电压。 该方法包括以下步骤:擦除存储器单元块,以及在预定的压缩范围内压缩块的存储单元的阈值电压,其中压缩步骤包括:选择块写入的至少一个第一存储单元 目标值 将块的存储器单元的子集的阈值电压恢复到压缩范围,该子集包括与至少一个第一存储器相邻的块的至少一个第一存储器单元和/或至少一个第二存储器单元 细胞; 并且至少部分地将目标值写入至少一个第一存储单元。
    • 93. 发明授权
    • Data bus architecture for a semiconductor memory
    • 半导体存储器的数据总线架构
    • US07260005B2
    • 2007-08-21
    • US11281932
    • 2005-11-17
    • Luca CrippaMiriam SangalliRino Micheloni
    • Luca CrippaMiriam SangalliRino Micheloni
    • G11C7/00
    • G11C7/10G11C7/08G11C7/1048
    • A semiconductor memory device is provided that includes memory cells, sense amplifiers, signal lines, isolating circuits, and a precharging circuit. Each signal line is coupled to an output of at least one of the sense amplifiers and each of the isolating circuits isolates an associated signal line from the output of the corresponding sense amplifier at least during an evaluating phase of the datum stored in the memory cell. The signal lines include at least two groups of signal lines, arranged such that coupling capacitances between the lines of the first group and the lines of the second group are substantially negligible. The precharging circuit precharges the first group of signal lines to a first voltage level and the second group of signal lines to a second voltage level.
    • 提供了包括存储单元,读出放大器,信号线,隔离电路和预充电电路的半导体存储器件。 每个信号线耦合到读出放大器中的至少一个的输出,并且每个隔离电路至少在存储在存储单元中的数据的评估阶段期间将相关联的信号线与对应的读出放大器的输出隔离。 信号线包括至少两组信号线,其布置成使得第一组的线和第二组的线之间的耦合电容基本上可忽略。 预充电电路将第一组信号线预充电到第一电压电平,将第二组信号线预充电到第二电压电平。
    • 94. 发明申请
    • MULTISTAGE REGULATOR FOR CHARGE-PUMP BOOSTED VOLTAGE APPLICATIONS, NOT REQUIRING INTEGRATION OF DEDICATED HIGH VOLTAGE HIGH SIDE TRANSISTORS
    • 用于充电泵升压电压应用的多级稳压器,不需要集成高压高压侧晶体管
    • US20070164811A1
    • 2007-07-19
    • US11460370
    • 2006-07-27
    • Luca CrippaMiriam SangalliGiancarlo RagoneRino Micheloni
    • Luca CrippaMiriam SangalliGiancarlo RagoneRino Micheloni
    • G05F1/10
    • G11C5/145G11C16/30
    • A multistage circuit for regulating the charge voltage or the discharge current of a capacitance of an integrated device at a certain charge-pump generated boosted voltage is implemented without integrating high voltage transistor structures having a type of conductivity corresponding to the same sign of the boosted voltage (high-side transistors). The multistage circuit current includes at least a first stage, and an output stage in cascade to the first stage and coupled to the capacitance. The first stage is supplied at an unboosted power supply voltage of the integrated device, and the output stage is supplied at an unregulated charge-pump generated boosted voltage. The first stage includes a transistor having a type of conductivity corresponding to an opposite sign of the boosted voltage and of the power supply voltage. The drain of the output stage transistor is coupled to the boosted voltage either through a resistive pull-up or a voltage limiter.
    • 在一定的电荷泵产生的升压电压下,用于调节集成器件的电容的充电电压或放电电流的多级电路被实现,而不需要集成具有对应于升压电压相同符号的导电类型的高压晶体管结构 (高侧晶体管)。 多级电路电流包括至少第一级和级联到第一级并耦合到电容的输出级。 第一级是在集成器件的未升压的电源电压下提供的,并且输出级以未调节的电荷泵产生的升压电压供电。 第一级包括具有对应于升压电压和电源电压的相反符号的导电类型的晶体管。 输出级晶体管的漏极通过电阻上拉或电压限制器耦合到升压电压。
    • 97. 发明申请
    • Double page programming system and method
    • 双页编程系统和方法
    • US20070030732A1
    • 2007-02-08
    • US11495876
    • 2006-07-28
    • Rino MicheloniLuca CrippaRoberto Ravasio
    • Rino MicheloniLuca CrippaRoberto Ravasio
    • G11C16/04
    • G11C16/12G11C11/5628G11C16/0483G11C2211/5621G11C2211/5642G11C2216/14
    • A method for programming an electrically programmable memory including a plurality of memory cells arranged in individually-selectable memory cell sets each including at least one memory cell. The programming method includes causing the memory cells of a selected memory cells set to be brought into a predetermined, starting programming state. Receiving a target value for the first data bits groups of the memory cells of the selected memory cells set. Receiving a target value for the second data bits groups of the memory cells of the selected memory cells set. After having received the target values of both the first and the second data bits groups, applying to the memory cells of the selected memory cells set a programming sequence adapted to cause the memory cells of the selected memory cells sets to be brought into a target programming state jointly determined by the target values of the first and second data bits groups.
    • 一种用于编程电可编程存储器的方法,包括布置在各自包括至少一个存储单元的可单独选择的存储单元组中的多个存储单元。 编程方法包括使所设置的选定存储单元的存储单元进入预定的开始编程状态。 接收所选存储器单元的存储单元的第一数据位组的目标值。 接收所选存储器单元的存储单元的第二数据位组的目标值。 在接收到第一和第二数据位组两者的目标值之后,将所选择的存储器单元的存储单元应用到所设置的编程顺序,以使所选择的存储单元组的存储器单元进入目标编程 状态由第一和第二数据位组的目标值联合确定。