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    • 94. 发明申请
    • Alignment System and Method for a Substrate in a Nano-Imprint Process
    • 纳米压印过程中基体的对准系统和方法
    • US20090026657A1
    • 2009-01-29
    • US12175258
    • 2008-07-17
    • Pawan Kumar NimmakayalaByung-Jin Choi
    • Pawan Kumar NimmakayalaByung-Jin Choi
    • B28B11/10G01B11/00
    • G03F7/0002B82Y10/00B82Y40/00G03F9/7049G03F9/7088
    • A transparent imprint template mold is configured with gratings surrounding the active imprint area. The gratings are fabricated at the same time as the active area and thus accurately define the active area with respect to the gratings. The substrate is positioned in tool coordinates under the template mold. A sensor system generates a beam of optical energy and receives reflected energy only at a specific angular window and is used to locate the template mold. The sensor system is scanned to locate the substrate and the gratings in tool coordinates. In this manner, the relative position of the template mold is determined with respect to the substrate in tool coordinates. The substrate is then accurately positioned with respect to the template mold. The system may be used to track imprinted pattern position relative to the substrate and to determine concentricity of patterns to substrates.
    • 透明压印模板模具配置有围绕活动印记区域的光栅。 光栅在有效面积的同时被制造,从而准确地限定相对于光栅的有效面积。 基板位于模具模具下的工具坐标下。 传感器系统产生光能束,仅在特定的角度窗口处接收反射能量,并用于定位模板模具。 扫描传感器系统以确定工件坐标中的基板和光栅。 以这种方式,模具模具的相对位置以工具坐标相对于基板确定。 然后基板相对于模板模具被精确地定位。 该系统可以用于跟踪相对于衬底的印迹图案位置并且确定图案与衬底的同心度。