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    • 93. 发明专利
    • MASS SPECTROMETER
    • HK1113857A1
    • 2008-10-17
    • HK08109510
    • 2008-08-26
    • MICROMASS LTD
    • BATEMAN ROBERT HAROLDBROWN JEFFERY MARKGREEN MARTINWILDGOOSE JASON LEE
    • H01J20060101H01J49/02
    • A method of mass spectrometry is disclosed wherein voltage signals from an ion detector are analyzed. A second differential of each voltage signal is obtained and the start and end times of observed voltage peaks are determined. The intensity and average time of each voltage peak is then determined and the intensity and time values are stored. An intermediate composite mass spectrum is then formed by combining the intensity and time values which relate to each voltage peak observed from multiple experimental runs. The various pairs of time and intensity data are then integrated to produce a smooth continuum mass spectrum. The continuum mass spectrum may then be further processed by determining the second differential of the continuum mass spectrum. The start and end times of mass peaks observed in the continuum mass spectrum may be determined. The intensity and mass to charge ratio of each mass peak observed in the continuum mass spectrum may then determined. A final discrete mass spectrum comprising just of an intensity value and mass to charge ratio per species of ion may then be displayed or output.
    • 97. 发明专利
    • Axial ion ejection from a segmented linear ion trap
    • GB2436201A
    • 2007-09-19
    • GB0625621
    • 2006-12-21
    • MICROMASS LTD
    • GREEN MARTIN
    • H01J49/42
    • An ion trap mass analyzer is disclosed comprising a segmented rod set. Ions are trapped radially within the mass analyzer by a radial pseudo-potential well. The ions are also confined axially within the ion trap by an axial electric field. The axial electric field is substantially linear across the central section of the ion trap, i.e. has a quadratic potential profile, but the electric field is distorted across both ends of the ion trap (see Figures 7 & 12). A supplemental AC voltage or potential is applied to the electrodes comprising the ion trap mass analyser in order to resonantly or parametrically excite ions within the ion trap 1. The distortions in the electric field at the ends of the ion trap cause the resonant frequency of ions within the ion trap to shift to either a higher or lower frequency (see Figures 8, 10, 13 & 15). If the frequency of the supplemental AC voltage or potential is scanned appropriately then ions are ejected from the ion trap in a shorter/longer period of time leading to an improvement in mass resolution (see Figures 9,11,14 & 16).
    • 98. 发明专利
    • MASS SPECTROMETER
    • CA2609594A1
    • 2006-12-07
    • CA2609594
    • 2006-06-01
    • MICROMASS LTD
    • BATEMAN ROBERT HAROLDBROWN JEFFERY MARKGREEN MARTINWILDGOOSE JASON LEE
    • H01J49/02
    • A method of mass spectrometry is disclosed wherein voltage signals from an ion detector are analyzed. A second differential of each voltage signal is obtained and the start and end times of observed voltage peaks are determined. The intensity and average time of each voltage peak is then determined and the intensity and time values are stored. An intermediate composite mass spectrum is then formed by combining the intensity and time values which relate to each voltage peak observed from multiple experimental runs. The various pairs of time and intensity data are then integrated to produce a smooth continuum mass spectrum. The continuum mass spectrum may then be further processed by determining the second differential of the continuum mass spectrum. The start and end times of mass peaks observed in the continuum mass spectrum may be determined. The intensity and mass to charge ratio of each mass peak observed in the continuum mass spectrum may then determined. A final discrete mass spectrum comprising just of an intensity value and mass to charge ratio per species of ion may then be displayed or output.