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    • 92. 发明申请
    • MAGNETORESISTIVE LOGIC CELL AND METHOD OF USE
    • 磁性逻辑单元及其使用方法
    • US20130215672A1
    • 2013-08-22
    • US13402123
    • 2012-02-22
    • Yuchen ZhouZihui WangYiming HuaiYadav RanjanRoger K. Malmhall
    • Yuchen ZhouZihui WangYiming HuaiYadav RanjanRoger K. Malmhall
    • G11C11/16
    • G11C11/00G11C11/161G11C11/1673H01L27/222H01L43/08
    • A magnetoresistive logic cell (MRLC) is described that includes two MTJs in series that share a common free layer (CFL). The relative magnetization orientations of the CFL and the switchable reference layer (SRL) in MTJ-1 dominate the overall resistance of the MRLC without regard to the fixed magnetization orientation of the nonswitchable reference layer in MTJ-2. The high resistance state of the MRLC occurs when the switchable reference and common free layers have opposite magnetization orientations. The low resistance state occurs when the orientations are the same. This behavior allows the MRLC to be used as a logical comparator. The CFL is switched by STT effect by application of selected relatively short voltage pulses that do not switch the SRL. The SRL is switched with reference to the CFL by a voltage effect generated by a selected longer voltage pulse that does not switch the CFL.
    • 描述了包含共享共同自由层(CFL)的两个串联MTJ的磁阻逻辑单元(MRLC)。 MTJ-1中CFL和可切换参考层(SRL)的相对磁化取向主导了MRLC的总体电阻,而不考虑MTJ-2中不可切换参考层的固定磁化方向。 当可切换参考和公共自由层具有相反的磁化方向时,MRLC的高电阻状态发生。 当取向相同时,发生低电阻状态。 此行为允许将MRLC用作逻辑比较器。 通过施加不切换SRL的选定的相对较短的电压脉冲,通过STT效应来切换CFL。 通过由不会切换CFL的选定的较长电压脉冲产生的电压效应,SRL将根据CFL进行切换。
    • 94. 发明申请
    • METHOD FOR MAGNETIC SCREENING OF ARRAYS OF MAGNETIC MEMORIES
    • 磁性记忆棒的磁屏蔽方法
    • US20130148417A1
    • 2013-06-13
    • US13314470
    • 2011-12-08
    • Yuchen ZhouEbrahim AbedifardYiming Huai
    • Yuchen ZhouEbrahim AbedifardYiming Huai
    • G11C11/16
    • G11C11/161G11C11/165
    • A testing method is described that applies a sequence external magnetic fields of varying strength to MRAM cells (such as those with MTJ memory elements) in chips or wafers to selectively screen out cells with low or high thermal stability factor. The coercivity (Hc) is used as a proxy for thermal stability factor (delta). In the various embodiments the sequence, direction and strength of the external magnetic fields is used to determine the high coercivity cells that are not switched by a normal field and the low coercivity cells that are switched by a selected low field. In some embodiment the MRAM's standard internal electric current can be used to switch the cells. Standard circuit-based resistance read operations can be used to determine the response of each cell to these magnetic fields and identify the abnormal high and low coercivity cells.
    • 描述了一种测试方法,其将具有不同强度的序列外部磁场施加到芯片或晶片中的MRAM单元(例如具有MTJ存储元件的那些),以选择性地筛选具有低或高热稳定性因子的单元。 矫顽力(Hc)用作热稳定因子(delta)的代表。 在各种实施例中,外部磁场的顺序,方向和强度用于确定不被正常场切换的高矫顽力单元以及通过选定的低场切换的低矫顽力单元。 在一些实施例中,MRAM的标准内部电流可用于切换电池。 可以使用标准的基于电路的电阻读取操作来确定每个单元对这些磁场的响应并识别异常的高和低矫顽力单元。
    • 95. 发明申请
    • MAGNETIC RANDOM ACCESS MEMORY (MRAM) WITH ENHANCED MAGNETIC STIFFNESS AND METHOD OF MAKING SAME
    • 具有增强磁力的MAGNETIC RANDOM ACCESS MEMORY(MRAM)及其制造方法
    • US20130071954A1
    • 2013-03-21
    • US13341826
    • 2011-12-30
    • Yuchen ZhouYiming Huai
    • Yuchen ZhouYiming Huai
    • H01L21/02
    • G11C11/161H01L43/12
    • A spin toque transfer magnetic random access memory (STTMRAM) element and a method of manufacturing the same is disclosed having a free sub-layer structure with enhanced internal stiffness. A first free sub-layer is deposited, the first free sub-layer being made partially of boron (B). Annealing is performed of the STTMRAM element at a first temperature after depositing the first free sub-layer to reduce the B content at an interface between the first free sub-layer and the barrier layer. Cooling down of the STTMRAM element to a second temperature that is lower than the first temperature is performed and a third free sub-layer is directly deposited on top of the second free layer, with the third free sub-layer being made partially of boron (B), wherein the amount of B in the third sub-free layer is less than the amount of B in the second free sub-layer.
    • 公开了具有增强的内部刚度的自由子层结构的自旋转矩磁性随机存取存储器(STTMRAM)元件及其制造方法。 沉积第一自由子层,第一自由子层部分由硼(B)制成。 在沉积第一自由子层之后,在第一温度下对STTMRAM元件进行退火,以降低第一自由子层与势垒层之间的界面处的B含量。 执行STTMRAM元件的冷却到低于第一温度的第二温度,并且第三自由子层直接沉积在第二自由层的顶部上,第三自由子层部分地由硼制成( B),其中第三子自由层中的B的量小于第二自由子层中的B的量。
    • 97. 发明申请
    • MAGNETIC RANDOM ACCESS MEMORY (MRAM) WITH ENHANCED MAGNETIC STIFFNESS AND METHOD OF MAKING SAME
    • 具有增强磁力的MAGNETIC RANDOM ACCESS MEMORY(MRAM)及其制造方法
    • US20120148735A1
    • 2012-06-14
    • US12965733
    • 2010-12-10
    • Yuchen Zhou
    • Yuchen Zhou
    • G11C15/02
    • H01L43/02G11C11/161H01L43/08H01L43/12
    • A spin toque transfer magnetic random access memory (STTMRAM) element and a method of manufacturing the same is disclosed having a free sub-layer structure with enhanced internal stiffness. A first free sub-layer is deposited, the first free sub-layer being made partially of boron (B), annealing is performed of the STTMRAM element at a first temperature after depositing the first free sub-layer to reduce the B content at an interface between the first free sub-layer and the barrier layer, the annealing causing a second free sub-layer to be formed on top of the first free sub-layer and being made partially of B, the amount of B of the second free sub-layer being greater than the amount of B in the first free sub-layer. Cooling down the STTMRAM element to a second temperature that is lower than the first temperature and depositing a third free sub-layer directly on top of the second free layer, with the third free sub-layer being made partially of boron (B), wherein the amount of B in the third sub-free layer is less than the amount of B in the second free sub-layer.
    • 公开了具有增强的内部刚度的自由子层结构的自旋转矩磁性随机存取存储器(STTMRAM)元件及其制造方法。 沉积第一自由子层,第一自由子层部分由硼(B)制成,在沉积第一自由子层之后,在第一温度下对STTMRAM元素进行退火,以降低B 在第一自由子层和阻挡层之间的界面,退火使第二自由子层形成在第一自由子层的顶部上并且部分地由B构成,第二自由子层的B的量 层大于第一自由子层中的B的量。 将STTMRAM元件冷却至低于第一温度的第二温度,并将第三自由子层直接沉积在第二自由层的顶部上,第三自由子层部分由硼(B)制成,其中 第三子自由层中的B的量小于第二自由子层中的B的量。