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    • 91. 发明授权
    • Memory cell having improved read stability
    • 具有改善的读稳定性的存储单元
    • US07106620B2
    • 2006-09-12
    • US11069018
    • 2005-02-28
    • Leland ChangRobert H. DennardRobert Kevin Montoye
    • Leland ChangRobert H. DennardRobert Kevin Montoye
    • G11C11/00
    • G11C11/413H01L27/11H01L27/1104
    • A memory cell for use in a memory array includes a storage element for storing a logical state of the memory cell, a write circuit and a read circuit. The write circuit is operative to selectively connect a first node of the storage element to at least a first write bit line in the memory array in response to a write signal for selectively writing the logical state of the memory cell. The read circuit includes a substantially high impedance input node connected to the storage element and an output node connectable to a read bit line of the memory array. The read circuit is configured to generate an output signal at the output node which is representative of the logical state of the storage element in response to a read signal applied to the read circuit. The memory cell is configured such that the write circuit is disabled during a read operation of the memory cell so as to substantially isolate the storage element from the first write bit line during the read operation. A strength of at least one transistor device in the storage element is separately optimized relative to a strength of at least one transistor device in the write circuit and/or the read circuit.
    • 用于存储器阵列的存储单元包括用于存储存储单元的逻辑状态的存储元件,写入电路和读取电路。 写入电路用于响应于用于选择性地写入存储器单元的逻辑状态的写入信号,有选择地将存储元件的第一节点连接到存储器阵列中的至少第一写入位线。 读取电路包括连接到存储元件的基本上高阻抗的输入节点和可连接到存储器阵列的读取位线的输出节点。 读取电路被配置为响应于施加到读取电路的读取信号而在输出节点处产生代表存储元件的逻辑状态的输出信号。 存储单元被配置为使得在存储单元的读取操作期间禁止写入电路,以便在读取操作期间基本上将存储元件与第一写入位线隔离。 存储元件中的至少一个晶体管器件的强度相对于写入电路和/或读取电路中的至少一个晶体管器件的强度分别优化。
    • 93. 发明申请
    • SLAB INDUCTOR DEVICE PROVIDING EFFICIENT ON-CHIP SUPPLY VOLTAGE CONVERSION AND REGULATION
    • 提供有效的片上电源电压转换和调节的SLAB电感器器件
    • US20140049934A1
    • 2014-02-20
    • US13589280
    • 2012-08-20
    • Leland ChangDavid GorenNaigang Wang
    • Leland ChangDavid GorenNaigang Wang
    • H05K9/00
    • H02M3/158G06F1/26H02M3/155H02M3/156
    • A voltage conversion circuit such as a buck regulator circuit has a plurality of switches coupled to a voltage source; a slab inductor having a length, a width and a thickness, where the slab inductor is coupled between the plurality of switches and a load and carries a load current during operation of the plurality of switches. The voltage conversion circuit can also include means to reduce or cancel a detrimental effect of other wires on same chip, such as a power grid, that conduct a return current and thereby degrading the functionality of this slab inductor. In one embodiment the wires can be moved further away from the slab inductor and in another embodiment magnetic materials can be used to shield the slab inductor from at least one such interfering conductor.
    • 诸如降压调节器电路的电压转换电路具有耦合到电压源的多个开关; 具有长度,宽度和厚度的板式电感器,其中所述扁平电感器耦合在所述多个开关之间,并且在所述多个开关的操作期间负载并承载负载电流。 电压转换电路还可以包括用于减少或消除导致回流的同一芯片(例如电网)上的其它导线的有害影响并由此降低该扁平电感器的功能性的装置。 在一个实施例中,电线可以进一步远离板式电感器,并且在另一个实施例中,磁性材料可用于屏蔽平板电感器与至少一个这样的干扰导体。
    • 94. 发明授权
    • Low voltage signaling
    • 低电压信号
    • US08629705B2
    • 2014-01-14
    • US12794995
    • 2010-06-07
    • Leland ChangRobert H. DennardBrian L. JiWing K. LukRobert K. Montoye
    • Leland ChangRobert H. DennardBrian L. JiWing K. LukRobert K. Montoye
    • H03L5/00
    • H02M3/07H02M2003/072
    • A low voltage signaling system for integrated circuits includes a first voltage domain operating at a nominal integrated circuit (IC) power supply voltage (Vdd) swing level at a signal transmitting end of a first chip, a second voltage domain having one or more transmission interconnect lines operating at a reduced voltage swing level with respect to the first voltage domain, and a third voltage domain at a signal receiving end of a second chip, the third voltage domain operating at the Vdd swing level; wherein an input signal originating from the first voltage domain is down converted to operate at the reduced voltage swing level for transmission over the second voltage domain, and wherein the third voltage domain senses the input signal transmitted over the second voltage domain and generates an output signal operating back up at the Vdd swing level.
    • 用于集成电路的低电压信号系统包括在第一芯片的信号发射端处以标称集成电路(IC)电源电压(Vdd)摆幅电平操作的第一电压域,具有一个或多个传输互连的第二电压域 以相对于第一电压域的降低的电压摆动电平工作的线路,以及在第二芯片的信号接收端的第三电压域,以Vdd摆动电平工作的第三电压域; 其中源自所述第一电压域的输入信号被降频转换以在所述降低的电压摆幅电平下工作以在所述第二电压域上传输,并且其中所述第三电压域检测在所述第二电压域上传输的输入信号,并产生输出信号 以Vdd摆动水平运行。
    • 97. 发明申请
    • 8-TRANSISTOR SRAM CELL DESIGN WITH OUTER PASS-GATE DIODES
    • 具有外部门极二极管的8晶体管SRAM单元设计
    • US20130176771A1
    • 2013-07-11
    • US13345636
    • 2012-01-06
    • Leland ChangIsaac LauerChung-Hsun LinJeffrey W. Sleight
    • Leland ChangIsaac LauerChung-Hsun LinJeffrey W. Sleight
    • G11C11/40
    • G11C16/24G11C11/412H01L27/0207H01L27/1104H01L27/1116
    • An 8-transistor SRAM cell which includes two pull-up transistors and two pull-down transistors in cross-coupled inverter configuration for storing a single data bit; first and second pass-gate transistors having a gate terminal coupled to a write word line and a source or drain of each of the pass-gate transistors coupled to a write bit line through a series outer diode between the pass-gate and the write bit line oriented to block charge transfer from the write bit line into the cell; and first and second read transistors coupled to the two pull-up and two pull-down transistors, one of the read transistors having a gate terminal coupled to a read word line and a source or a drain coupled to a read bit line. The 8-transistor SRAM cell is adapted to prevent the value of the bit stored in the cell from changing state.
    • 一个8晶体管SRAM单元,包括两个上拉晶体管和两个交叉耦合的反相器配置的下拉晶体管,用于存储单个数据位; 第一和第二栅极晶体管具有耦合到写入字线的栅极端子和耦合到通过栅极和写入位之间的串联外部二极管的写入位线的每个通过栅极晶体管的源极或漏极 线路阻止从写入位线进入电池的电荷转移; 以及耦合到所述两个上拉和两个下拉晶体管的第一和第二读取晶体管,所述读取晶体管中的一个具有耦合到读取字线的栅极端子和耦合到读取位线的源极或漏极。 8晶体管SRAM单元适于防止存储在单元中的位的值改变状态。