会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 92. 发明申请
    • Methods and Systems for Enhancing Wireless Coverage
    • 增强无线覆盖的方法和系统
    • US20120184242A1
    • 2012-07-19
    • US13499194
    • 2010-08-31
    • Adam H. LiNing Nicholas ChenEly TsernMichael Farmwald
    • Adam H. LiNing Nicholas ChenEly TsernMichael Farmwald
    • H04W12/06H04W4/26
    • H04W12/06H04L63/0815H04L63/0892H04W40/02H04W88/06
    • Described are methods, devices, and systems to provide enhanced wireless coverage for wireless mobile stations by facilitating centralized authentication for a variety of unrelated networks. The mobile stations can then access Internet and telephony resources via the various networks for improved coverage and bandwidth. Some embodiments support the extension of network coverage using wireless-access points that can be partitioned into multiple virtual access points, one associated with an enterprise and another with an overlay network that facilitates mobile communication over multiple networks. One physical access point can support an enterprise network using one virtual access point and the overlay network using another. Users unaffiliated with an enterprise can access the overlay network via the enterprise's physical access point without gaining access to the enterprise network.
    • 描述了通过促进各种不相关网络的集中认证来为无线移动站提供增强的无线覆盖的方法,设备和系统。 然后,移动台可以经由各种网络访问因特网和电话资源,以改善覆盖和带宽。 一些实施例支持使用可以被划分成多个虚拟接入点的无线接入点来扩展网络覆盖范围,一个与企业相关联,另一个具有促进多个网络上的移动通信的覆盖网络。 一个物理接入点可以使用一个虚拟接入点和使用另一个的覆盖网络来支持企业网络。 与企业无关的用户可以通过企业的物理接入点访问覆盖网络,无需访问企业网络。
    • 93. 发明授权
    • Method and apparatus for test and characterization of semiconductor components
    • 用于半导体元件测试和表征的方法和装置
    • US07592824B2
    • 2009-09-22
    • US10768443
    • 2004-01-30
    • Frederick WareScott BestTimothy ChangRichard PeregoEly TsernJeff Mitchell
    • Frederick WareScott BestTimothy ChangRichard PeregoEly TsernJeff Mitchell
    • G01R31/02G01R31/28
    • G11C29/56004G01R31/31707G06F11/24G11C2029/5602
    • A method and apparatus for testing and characterizing circuits is provided. In one embodiment, a high-speed interface of a semiconductor component includes high-speed test circuitry. The high-speed test circuitry obviates the need for an external high-speed testing system for testing and characterization. In one embodiment, the high-speed test circuitry includes a test pattern generation circuit, and various differential comparators to compare low bandwidth reference signals with interface signals during testing and characterization. In one embodiment, an interface that includes the test circuitry can test itself or another interface. In one embodiment, a timing reference signal decouples the individual parameters of two interfaces testing each other to avoid any errors introduced by the combination of individual interface circuit parameters, such as receiver parameters and transmitter parameters. The testing can be performed at the wafer stage, at the component stage, and in a system.
    • 提供了用于测试和表征电路的方法和装置。 在一个实施例中,半导体部件的高速接口包括高速测试电路。 高速测试电路无需外部高速测试系统进行测试和表征。 在一个实施例中,高速测试电路包括测试图形生成电路和各种差分比较器,用于在测试和表征期间将低带宽参考信号与接口信号进行比较。 在一个实施例中,包括测试电路的接口可以测试自身或另一接口。 在一个实施例中,定时参考信号使彼此测试的两个接口的各个参数解耦,以避免由诸如接收机参数和发射机参数的各个接口电路参数的组合引入的任何错误。 测试可以在晶片级,元件级和系统中执行。
    • 95. 发明授权
    • Buffered memory having a control bus and dedicated data lines
    • 具有控制总线和专用数据线的缓冲存储器
    • US07526597B2
    • 2009-04-28
    • US11868242
    • 2007-10-05
    • Richard PeregoFred WareEly Tsern
    • Richard PeregoFred WareEly Tsern
    • G06F12/00
    • G06F13/1684G11C5/04G11C7/10G11C29/02G11C29/028G11C29/50012G11C2029/1806H05K1/181
    • A memory system architecture/interconnect topology includes a configurable width buffered module having a configurable width buffer device. The configurable width buffer device is coupled to at least one memory device on the configurable width memory module. The configurable width buffer device includes an interface and a configurable serialization circuit capable of varying a data path width or a number of contacts used at the interface of the configurable width buffer device in accessing the at least one memory device. In an alternate embodiment of the present invention, a multiplexer/demultiplexer circuit is provided. A state storage provides a data width for the configurable width buffer and a SPD provides the configurable width buffer and/or module capabilities to the memory system.
    • 存储器系统架构/互连拓扑包括具有可配置宽度缓冲器件的可配置宽度缓冲模块。 可配置宽度缓冲器设备耦合到可配置宽度存储器模块上的至少一个存储器件。 可配置宽度缓冲器装置包括接口和可配置串行化电路,其能够改变在可配置宽度缓冲器装置的接口处使用的数据路径宽度或数量的接触访问至少一个存储器件。 在本发明的另一个实施例中,提供了多路复用器/解复用器电路。 状态存储器为可配置的宽度缓冲器提供数据宽度,并且SPD向存储器系统提供可配置的宽度缓冲器和/或模块功能。
    • 97. 发明申请
    • Clocked Memory System with Termination Component
    • 带终端组件的定时存储系统
    • US20070247935A1
    • 2007-10-25
    • US11767983
    • 2007-06-25
    • Frederick WareEly TsernRichard PeregoCraig Hampel
    • Frederick WareEly TsernRichard PeregoCraig Hampel
    • G11C7/00
    • G11C7/1039G11C5/04G11C5/063G11C7/1048
    • A memory system having first and second memory devices and a termination component. A first signal line is coupled to the first memory device to provide first data, associated with a write command, to the first memory device, and a second signal line coupled to the second memory device to provide second data, associated with the write command, to the second memory device. A control signal path is coupled to the first and second memory devices and the termination component such that the write command propagating on the control signal path propagates past the first memory device and the second memory device before reaching the termination component. A third signal line is provided to convey a clock signal that indicates when the write command propagating on the control signal path is to be sampled by the first and second memory devices.
    • 一种具有第一和第二存储器件和终端部件的存储器系统。 第一信号线耦合到第一存储器设备,以向第一存储器设备提供与写命令相关联的第一数据,以及耦合到第二存储器设备以提供与写命令相关联的第二数据的第二信号线, 到第二存储设备。 控制信号路径被耦合到第一和第二存储器件和终端部件,使得在到达终端部件之前,在控制信号路径上传播的写入命令传播通过第一存储器件和第二存储器件。 提供第三信号线来传送时钟信号,该时钟信号指示在控制信号路径上传播的写入命令何时被第一和第二存储器件采样。