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    • 91. 发明申请
    • MIMO TESTER
    • US20090251153A1
    • 2009-10-08
    • US12195380
    • 2008-08-20
    • GUO-JUN XIECHO-JU CHUNG
    • GUO-JUN XIECHO-JU CHUNG
    • G01R31/28
    • H04B17/0085H04B17/21
    • A multiple input multiple output (MIMO) tester tests various communication parameters of a MIMO device. The MIMO tester includes a first attenuation circuit, a switch circuit, a controlling circuit, and a divider circuit. The first attenuation circuit adjusts an equivalent resistance of the MIMO tester, wherein the first attenuation circuit is electronically connected to the MIMO device. The switch circuit comprises a plurality of switch elements, wherein each switch element comprises an input end, a first output end and a second output end, wherein the switch circuit is electronically connected to the first attenuation circuit. The controlling circuit controls operation of the switch circuit, wherein the controlling circuit is electronically connected to the switch circuit. The divider circuit electronically connected to the switch circuit receives electronic signals from the MIMO device, divides each electronic signal into a plurality of sub-signals, and sends the sub-signals to at least one test device.
    • 多输入多输出(MIMO)测试仪测试MIMO设备的各种通信参数。 MIMO测试器包括第一衰减电路,开关电路,控制电路和分频器电路。 第一衰减电路调整MIMO测试器的等效电阻,其中第一衰减电路电连接到MIMO器件。 开关电路包括多个开关元件,其中每个开关元件包括输入端,第一输出端和第二输出端,其中开关电路电连接到第一衰减电路。 控制电路控制开关电路的操作,其中控制电路电连接到开关电路。 电连接到开关电路的分频器电路从MIMO装置接收电子信号,将每个电子信号分成多个子信号,并将子信号发送到至少一个测试装置。
    • 96. 发明授权
    • Methods and apparatus for processing insulating substrates
    • 用于处理绝缘基板的方法和装置
    • US06228429B1
    • 2001-05-08
    • US09495545
    • 2000-02-01
    • Terry BluckJames H. RogersJun XieEric C. Lawson
    • Terry BluckJames H. RogersJun XieEric C. Lawson
    • B05D140
    • C23C14/345B05D3/145C23C14/50C23C14/568G11B5/8404
    • A disk gripper for gripping an insulating disk, such as a glass disk, at its edge during processing includes a contact device for contacting the edge of the insulating disk and a mechanism for moving the contact device between a contact position, in contact with the edge of the disk, and a retracted position. In a first processing station, a conductive coating is applied to a disk held by the gripper, with the contact device in the retracted position. In a second processing station, ions are generated in a plasma adjacent to the surface of the disk held by the gripper. The contact device is in the contact position in contact with the conductive coating, and a bias voltage is applied to the contact device in the second processing station. The ions are accelerated from the plasma toward the disk by the bias voltage applied to the conductive coating.
    • 用于在加工过程中在其边缘处夹持诸如玻璃盘的绝缘盘的盘夹持器包括用于接触绝缘盘的边缘的接触装置和用于使接触装置在与边缘接触的接触位置之间移动的机构 的缩回位置。 在第一处理站中,将导电涂层施加到由夹持器保持的盘上,其中接触装置处于缩回位置。 在第二处理站中,在由夹持器保持的盘的表面附近的等离子体中产生离子。 接触装置处于与导电涂层接触的接触位置,并且偏压被施加到第二处理站中的接触装置。 通过施加到导电涂层的偏置电压将离子从等离子体加速到盘。