专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明申请

US20100204196A1 2-[2--1H-Pyrrolo[2,3-D]Pyrimidin-4-YL)Amino] Benzamide Derivatives As IGF-1R Inhibitors For The Treatment Of Cancer 有权
标题翻译： 2- [2- [1H-吡咯并[2,3-D]嘧啶-4-基）氨基]苯甲酰胺衍生物作为IGF-1R抑制剂治疗癌症
公开(公告)号：US20100204196A1
公开(公告)日：2010-08-12
申请号：US12671960
申请日：2008-08-06
申请人： Stanley Dawes Chamberlain , Felix Deanda, JR. , Roseanne Gerding , Masaichi Hasegawa , Kevin Kuntz , Huangshu Lei , Yasushi Miyazaki , Naohiko Nishigaki , Samarjit Patnaik , Aniko Redman , John Brad Shotwell , Kirk Stevens , Joseph Wilson , Bin Yang
发明人： Stanley Dawes Chamberlain , Felix Deanda, JR. , Roseanne Gerding , Masaichi Hasegawa , Kevin Kuntz , Huangshu Lei , Yasushi Miyazaki , Naohiko Nishigaki , Samarjit Patnaik , Aniko Redman , John Brad Shotwell , Kirk Stevens , Joseph Wilson , Bin Yang
IPC分类号： A61K31/397 , C07D487/04 , A61K31/519 , A61K31/496 , A61K31/5377 , A61K31/551 , A61P35/00
CPC分类号： C07D487/04 , C07D487/14
摘要： Novel pyrrolopyrimidines as shown in formula (I): and pharmaceutically acceptable derivatives thereof. The compounds are useful in the inhibition of IGF-1R.
摘要翻译：式（I）所示的新型吡咯并嘧啶及其药学上可接受的衍生物。该化合物可用于抑制IGF-1R。

2. 发明授权

US07981903B2 2-[2-{phenylamino}-1H-pyrrolo[2,3-D]pyrimidin-4-yl)amino] benzamide derivatives as IGF-1R inhibitors for the treatment of cancer 有权
标题翻译： 2- [2- {苯基氨基} -1H-吡咯并[2,3-D]嘧啶-4-基）氨基]苯甲酰胺衍生物作为治疗癌症的IGF-1R抑制剂
公开(公告)号：US07981903B2
公开(公告)日：2011-07-19
申请号：US12671960
申请日：2008-08-06
申请人： Stanley Dawes Chamberlain , Felix Deanda, Jr. , Roseanne Gerding , Masaichi Hasegawa , Kevin Kuntz , Huangshu Lei , Yasushi Miyazaki , Naohiko Nishigaki , Samarjit Patnaik , Aniko Redman , John Brad Shotwell , Kirk Stevens , Joseph Wilson , Bin Yang
发明人： Stanley Dawes Chamberlain , Felix Deanda, Jr. , Roseanne Gerding , Masaichi Hasegawa , Kevin Kuntz , Huangshu Lei , Yasushi Miyazaki , Naohiko Nishigaki , Samarjit Patnaik , Aniko Redman , John Brad Shotwell , Kirk Stevens , Joseph Wilson , Bin Yang
IPC分类号： A01N43/90 , A61K31/519 , C07D487/00
CPC分类号： C07D487/04 , C07D487/14
摘要： Novel pyrrolopyrimidines as shown in formula (I): and pharmaceutically acceptable derivatives thereof. The compounds are useful in the inhibition of IGF-1R.
摘要翻译：式（I）所示的新型吡咯并嘧啶及其药学上可接受的衍生物。该化合物可用于抑制IGF-1R。

3. 发明授权

US07238813B2 Chemical compounds 失效
标题翻译：化合物
公开(公告)号：US07238813B2
公开(公告)日：2007-07-03
申请号：US10433128
申请日：2001-11-28
申请人： Mui Cheung , Philip Anthony Harris , Masaichi Hasegawa , Satoru Ida , Kazuya Kano , Naohiko Nishigaki , Hideyuki Sato , James Marvin Veal , Yoshiaki Washio , Rob I. West
发明人： Mui Cheung , Philip Anthony Harris , Masaichi Hasegawa , Satoru Ida , Kazuya Kano , Naohiko Nishigaki , Hideyuki Sato , James Marvin Veal , Yoshiaki Washio , Rob I. West
IPC分类号： A61K31/4184 , C07D235/30
CPC分类号： C07D249/08 , C07D231/12 , C07D233/56 , C07D235/30 , C07D235/32 , C07D263/58 , C07D277/82 , C07D401/12 , C07D403/12 , C07D405/12 , C07D405/14 , C07D409/12 , C07D413/12 , C07D413/14 , C07D417/12 , C07D417/14 , C07D471/04 , C07D471/14 , C07D487/04
摘要： Benzimidazole derivatives, which are useful as TIE-2 and/or VEGFR2 inhibitors are described herein. The described invention also includes methods of making such benzimidazole derivatives as well as methods of using the same in the treatment of hyperproliferative diseases.
摘要翻译：本文描述了可用作TIE-2和/或VEGFR2抑制剂的苯并咪唑衍生物。所述的发明还包括制备这种苯并咪唑衍生物的方法以及使用它们在治疗过度增殖性疾病中的方法。

4. 发明申请

US20070249600A1 CHEMICAL COMPOUNDS 审中-公开
标题翻译：化学化合物
公开(公告)号：US20070249600A1
公开(公告)日：2007-10-25
申请号：US11763524
申请日：2007-06-15
申请人： Mui Cheung , Philip Harris , Masaichi Hasegawa , Satoru Ida , Kazuya Kano , Naohiko Nishigaki , Hideyuki Sato , James Veal , Yoshiaki Washio , Rob West
发明人： Mui Cheung , Philip Harris , Masaichi Hasegawa , Satoru Ida , Kazuya Kano , Naohiko Nishigaki , Hideyuki Sato , James Veal , Yoshiaki Washio , Rob West
IPC分类号： A61K31/4184 , A61K31/41 , A61K31/428 , A61K31/437 , A61K31/4439 , A61K31/496 , A61K31/519 , A61K31/5377 , C07D235/30 , C07D277/82 , C07D401/12 , C07D403/06 , C07D413/06 , C07D417/10 , C07D471/04 , C07D487/14
CPC分类号： C07D249/08 , C07D231/12 , C07D233/56 , C07D235/30 , C07D235/32 , C07D263/58 , C07D277/82 , C07D401/12 , C07D403/12 , C07D405/12 , C07D405/14 , C07D409/12 , C07D413/12 , C07D413/14 , C07D417/12 , C07D417/14 , C07D471/04 , C07D471/14 , C07D487/04
摘要： Benzimidazole derivatives, which are useful as TIE-2 and/or VEGFR2 inhibitors are described herein. The described invention also includes methods of making such benzimidazole derivatives as well as methods of using the same in the treatment of hyperproliferative diseases.
摘要翻译：本文描述了可用作TIE-2和/或VEGFR2抑制剂的苯并咪唑衍生物。所述的发明还包括制备这种苯并咪唑衍生物的方法以及使用它们在治疗过度增殖性疾病中的方法。

5. 发明申请

US20080222470A1 SCAN TEST CIRCUIT, SEMICONDUCTOR INTEGRATED CIRCUIT AND SCAN ENABLE SIGNAL TIME CONTROL CIRCUIT 有权
标题翻译：扫描测试电路，半导体集成电路和扫描信号时间控制电路
公开(公告)号：US20080222470A1
公开(公告)日：2008-09-11
申请号：US12042783
申请日：2008-03-05
申请人： Tomoki Satoi , Naohiko Nishigaki
发明人： Tomoki Satoi , Naohiko Nishigaki
IPC分类号： G01R31/28
CPC分类号： G01R31/318591
摘要： A SCAN test circuit for giving a semiconductor integration circuit a scan test includes a scan enable signal generating device that generates scan enable signals based on a scan enable external input signal, a clock generator that generate launch and capture clocks for collectively detecting a delay malfunction at a practical operation speed, and a controller configured to control the clock generator based on the scan enable signals.
摘要翻译：用于向半导体积分电路提供扫描测试的扫描测试电路包括：扫描使能信号产生装置，其基于扫描使能外部输入信号产生扫描使能信号;时钟发生器，其产生发射和捕获时钟，以集体检测延迟故障实际操作速度，以及被配置为基于扫描使能信号来控制时钟发生器的控制器。

6. 发明授权

US08028255B2 Semiconductor integrated circuit, semiconductor integrated circuit design support device, and semiconductor integrated circuit manufacturing method 有权
标题翻译：半导体集成电路，半导体集成电路设计支持器件和半导体集成电路制造方法
公开(公告)号：US08028255B2
公开(公告)日：2011-09-27
申请号：US12035281
申请日：2008-02-21
申请人： Tomoki Satoi , Naohiko Nishigaki
发明人： Tomoki Satoi , Naohiko Nishigaki
IPC分类号： G06F17/50
CPC分类号： G06F17/505 , G06F2217/14 , Y10T29/49002
摘要： A semiconductor integrated circuit including a user logic circuit is disclosed in which circuit parts for shifting data are composed of registers other than scan cells except for the circuit part right after a combinational circuit, and the parts configured of the registers other than the scan cells are used as a scan path.
摘要翻译：公开了一种包括用户逻辑电路的半导体集成电路，其中用于移位数据的电路部分由除组合电路之后的电路部分以外的扫描单元以外的寄存器构成，并且由扫描单元以外的寄存器构成的部件用作扫描路径。

7. 发明授权

US5706294A Method of finding DC test point of an integrated circuit 失效
标题翻译：找到集成电路的DC测试点的方法
公开(公告)号：US5706294A
公开(公告)日：1998-01-06
申请号：US670367
申请日：1996-06-25
申请人： Toshihiro Takahashi , Toshiya Murota , Naohiko Nishigaki
发明人： Toshihiro Takahashi , Toshiya Murota , Naohiko Nishigaki
IPC分类号： G01R31/26 , G01R31/28 , G01R31/3183 , H01L21/66 , H03K19/00
CPC分类号： G01R31/31919 , G01R31/31712
摘要： A DC test point finding method includes steps of: displaying a list of all input and output terminals of an integrated circuit; inputting selected terminals among the terminals of the list; inputting a selected test pattern file among a number of stored test pattern files, each test pattern file including a plurality of sequentially occurred test vectors and identified by a name of the test pattern file, the test vectors identified by respective vector numbers; inputting a test point finding condition related to a DC test point; finding the DC test point of the circuit among the selected terminals by using the test vectors of the selected test pattern file and the test point finding condition; and inserting test point data of the DC test point into the list so that the resulting list including the test point data is displayed.
摘要翻译： DC测试点发现方法包括以下步骤：显示集成电路的所有输入和输出端子的列表; 在列表的终端之间输入所选择的终端; 在多个存储的测试模式文件中输入所选择的测试模式文件，每个测试模式文件包括多个顺序发生的测试向量，并由测试模式文件的名称识别，由各个矢量数字标识的测试向量; 输入与直流测试点相关的测试点发现条件; 通过使用所选测试模式文件的测试向量和测试点发现条件，在所选择的终端中找到电路的DC测试点; 并将DC测试点的测试点数据插入列表，以便显示包含测试点数据的结果列表。

8. 发明授权

US07836370B2 Scan test circuit, semiconductor integrated circuit and scan enable signal time control circuit 有权
标题翻译：扫描测试电路，半导体集成电路和扫描使能信号时间控制电路
公开(公告)号：US07836370B2
公开(公告)日：2010-11-16
申请号：US12042783
申请日：2008-03-05
申请人： Tomoki Satoi , Naohiko Nishigaki
发明人： Tomoki Satoi , Naohiko Nishigaki
IPC分类号： G01R31/28
CPC分类号： G01R31/318591
摘要： A SCAN test circuit for giving a semiconductor integration circuit a scan test includes a scan enable signal generating device that generates scan enable signals based on a scan enable external input signal, a clock generator that generate launch and capture clocks for collectively detecting a delay malfunction at a practical operation speed, and a controller configured to control the clock generator based on the scan enable signals.
摘要翻译：用于向半导体积分电路提供扫描测试的扫描测试电路包括：扫描使能信号产生装置，其基于扫描使能外部输入信号产生扫描使能信号;时钟发生器，其产生发射和捕获时钟，以集体检测延迟故障实际操作速度，以及被配置为基于扫描使能信号来控制时钟发生器的控制器。

9. 发明申请

US20080222592A1 SEMICONDUCTOR INTEGRATED CIRCUIT, SEMICONDUCTOR INTEGRATED CIRCUIT DESIGN SUPPORT DEVICE, AND SEMICONDUCTOR INTEGRATED CIRCUIT MANUFACTURING METHOD 有权
标题翻译：半导体集成电路，半导体集成电路设计支持器件和半导体集成电路制造方法
公开(公告)号：US20080222592A1
公开(公告)日：2008-09-11
申请号：US12035281
申请日：2008-02-21
申请人： Tomoki Satoi , Naohiko Nishigaki
发明人： Tomoki Satoi , Naohiko Nishigaki
IPC分类号： G06F17/50 , H03K19/00 , H01S4/00
CPC分类号： G06F17/505 , G06F2217/14 , Y10T29/49002
摘要： A semiconductor integrated circuit including a user logic circuit is disclosed in which circuit parts for shifting data are composed of registers other than scan cells except for the circuit part right after a combinational circuit, and the parts configured of the registers other than the scan cells are used as a scan path.
摘要翻译：公开了一种包括用户逻辑电路的半导体集成电路，其中用于移位数据的电路部分由除组合电路之后的电路部分以外的扫描单元以外的寄存器构成，并且由扫描单元以外的寄存器构成的部件用作扫描路径。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式