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    • 4. 发明授权
    • Intrusion protection using stress changes
    • 使用压力变化的入侵保护
    • US08330191B2
    • 2012-12-11
    • US12997576
    • 2009-05-26
    • Romano HoofmanRemco Henricus Wilhelmus PijnenburgYouri Victorovitch Ponomarev
    • Romano HoofmanRemco Henricus Wilhelmus PijnenburgYouri Victorovitch Ponomarev
    • H01L29/84G08B13/14
    • H01L23/576G06F21/87H01L2924/0002H01L2924/00
    • The invention relates to a integrated circuit comprising an electronic circuit integrated on a substrate (5), and further comprising protections means for protection of the electronic circuit (25). The protection means comprise: i) a first strained encapsulation layer (10) being provided on a first side of the substrate (5), wherein the first strained encapsulation layer (10) has a strain (S1) in a direction parallel to the substrate (5), and ii) disabling means (20) arranged for at least partially disabling the electronic circuit (25) under control of a strain change in the substrate (5). The invention further relates to a method of manufacturing such integrated circuit, and to a system comprising such integrated circuit. Such system is selected from a group comprising: a bank-card, a smart-card, a contact-less card and an RFID. All embodiments of the integrated circuit in accordance with the invention provide essentially an alternative tamper protection to the data stored or present in the electronic circuit therein. A first main group of embodiments concerns an integrated circuit wherein tamper protection is obtained by detecting a strain change during tampering and subsequently disabling the electronic circuit. A second main group of embodiments concerns an integrated circuit wherein tamper protection is obtained by designing a stack of strained encapsulation layers, such that tampering causes releasing of strain and thereby mechanical disintegrate (break, delaminate, etc) of the integrated circuit, and thus disabling the electronic circuit.
    • 本发明涉及一种集成电路,其包括集成在基板(5)上的电子电路,并且还包括用于保护电子电路(25)的保护装置。 保护装置包括:i)第一应变封装层(10),设置在基板(5)的第一侧上,其中第一应变封装层(10)在平行于基板的方向上具有应变(S1) (5),以及ii)布置成在所述衬底(5)中的应变变化的控制下至少部分地禁用所述电子电路(25)的禁用装置(20)。 本发明还涉及一种制造这种集成电路的方法,以及包括这种集成电路的系统。 这样的系统从包括银行卡,智能卡,无接触卡和RFID的组中选择。 根据本发明的集成电路的所有实施例基本上为存储或存在于其中的电子电路中的数据提供了替代的篡改保护。 第一主要实施例涉及集成电路,其中通过在篡改期间检测应变变化并随后禁用电子电路来获得篡改保护。 第二主要实施例涉及一种集成电路,其中通过设计应变封装层的堆叠来获得防篡改,使得篡改导致应变释放,从而导致集成电路的机械分解(破坏,分层等),从而导致无效 电子电路。
    • 6. 发明申请
    • INTRUSION PROTECTION USING STRESS CHANGES
    • 使用压力变化的侵入保护
    • US20110089506A1
    • 2011-04-21
    • US12997576
    • 2009-05-26
    • Romano HoofmanRemco Henricus Wilhelmus PijnenburgYouri Victorovitch Ponomarev
    • Romano HoofmanRemco Henricus Wilhelmus PijnenburgYouri Victorovitch Ponomarev
    • H01L29/84G06K19/073H01L21/56
    • H01L23/576G06F21/87H01L2924/0002H01L2924/00
    • The invention relates to a integrated circuit comprising an electronic circuit integrated on a substrate (5), and further comprising protections means for protection of the electronic circuit (25). The protection means comprise: i) a first strained encapsulation layer (10) being provided on a first side of the substrate (5), wherein the first strained encapsulation layer (10) has a strain (S1) in a direction parallel to the substrate (5), and ii) disabling means (20) arranged for at least partially disabling the electronic circuit (25) under control of a strain change in the substrate (5). The invention further relates to a method of manufacturing such integrated circuit, and to a system comprising such integrated circuit. Such system is selected from a group comprising: a bank-card, a smart-card, a contact-less card and an RFID. All embodiments of the integrated circuit in accordance with the invention provide essentially an alternative tamper protection to the data stored or present in the electronic circuit therein. A first main group of embodiments concerns an integrated circuit wherein tamper protection is obtained by detecting a strain change during tampering and subsequently disabling the electronic circuit. A second main group of embodiments concerns an integrated circuit wherein tamper protection is obtained by designing a stack of strained encapsulation layers, such that tampering causes releasing of strain and thereby mechanical disintegrate (break, delaminate, etc) of the integrated circuit, and thus disabling the electronic circuit.
    • 本发明涉及一种集成电路,其包括集成在基板(5)上的电子电路,并且还包括用于保护电子电路(25)的保护装置。 保护装置包括:i)第一应变封装层(10),设置在基板(5)的第一侧上,其中第一应变封装层(10)在平行于基板的方向上具有应变(S1) (5),以及ii)布置成在所述衬底(5)中的应变变化的控制下至少部分地禁用所述电子电路(25)的禁用装置(20)。 本发明还涉及一种制造这种集成电路的方法,以及包括这种集成电路的系统。 这样的系统从包括银行卡,智能卡,无接触卡和RFID的组中选择。 根据本发明的集成电路的所有实施例基本上为存储或存在于其中的电子电路中的数据提供了替代的篡改保护。 第一主要实施例涉及集成电路,其中通过在篡改期间检测应变变化并随后禁用电子电路来获得篡改保护。 第二主要实施例涉及一种集成电路,其中通过设计应变封装层的堆叠来获得防篡改,使得篡改导致应变释放,从而导致集成电路的机械分解(破坏,分层等),从而导致无效 电子电路。
    • 9. 发明授权
    • Electrochemical potentiometric sensing without reference electrode
    • 无参考电极的电化学电位传感
    • US08801917B2
    • 2014-08-12
    • US13061110
    • 2009-08-24
    • Matthias MerzYouri Victorovitch PonomarevGilberto Curatola
    • Matthias MerzYouri Victorovitch PonomarevGilberto Curatola
    • G01N27/327
    • G01N27/4148G01N27/4145
    • The invention relates to a method of determining a charged particle concentration in an analyte (100), the method comprising steps of: i) determining at least two measurement points of a surface-potential versus interface-temperature curve (c1, c2, c3, c4), wherein the interface temperature is obtained from a temperature difference between a first interface between a first ion-sensitive dielectric (Fsd) and the analyte (100) and a second interface between a second ion-sensitive dielectric (Ssd) and the analyte (100), and wherein the surface-potential is obtained from a potential difference between a first electrode (Fe) and a second electrode (Se) onto which said first ion-sensitive dielectric (Fsd) and said second ion-sensitive dielectric (Ssd) are respectively provided, And ii) calculating the charged particle concentration from locations of the at least two measurement points of said curve (c1, c2, c3, c4). This method, which still is a potentiometric electrochemical measurement, exploits the temperature dependency of a surface-potential of an ion-sensitive dielectric in an analyte. The invention further provides an electrochemical sensor for determining a charged particle concentration in an analyte. The invention also provides various sensors which can be used to determine the charged particle concentration, i.e. EGFET's and EIS capacitors.
    • 本发明涉及一种测定分析物(100)中带电粒子浓度的方法,所述方法包括以下步骤:i)确定表面电位对界面温度曲线(c1,c2,c3,c3)的至少两个测量点, c4),其中所述界面温度是由第一离子敏感电介质(Fsd)和分析物(100)之间的第一界面与第二离子敏感电介质(Ssd)与分析物之间的第二界面 (100),并且其中所述表面电位由所述第一离子敏感电介质(Fsd)和所述第二离子敏感电介质(Ssd)上的第一电极(Fe)和第二电极(Se)之间的电位差获得, ),和ii)从所述曲线(c1,c2,c3,c4)的至少两个测量点的位置计算带电粒子浓度。 这种仍然是电位电化学测量的方法利用分析物中离子敏感电介质的表面电位的温度依赖性。 本发明还提供了一种用于测定分析物中带电粒子浓度的电化学传感器。 本发明还提供可用于确定带电粒子浓度的各种传感器,即EGFET和EIS电容器。