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    • 2. 发明授权
    • Low-voltage content addressable memory cell with a fast tag-compare capability using partially-depleted SOI CMOS dynamic-threshold techniques
    • 低电压内容可寻址存储单元,具有使用部分耗尽的SOI CMOS动态阈值技术的快速标签比较能力
    • US06240004B1
    • 2001-05-29
    • US09597275
    • 2000-06-19
    • James B. KuoSheng-Che Liu
    • James B. KuoSheng-Che Liu
    • G11C1500
    • G11C15/04
    • This invention discloses a content addressable memory (CAM) cell having a SRAM portion and a tag-compare portion. The tag-compare portion includes six NMOS transistors, designated as M7 to M12, wherein a source of M7 is connected to a drain of M8, a drain of M7 is connected to a match line ML, a source of M8 is grounded; a body of M7 and a body of M8 are tied together at a source of M11, a gate of M7 and a gate of M11 are tied together to a first node n1, a gate of M8 and a drain of M11 are connected to a first digit line DLB; and a source of M9 is connected to a drain of M10, a drain of M9 is connected to said match line ML, a source of M10 is grounded; a body of M9 and a body of M10 are tied together at a source of M12, a gate of M9 and a gate of M12 are tied together to a second node n2, a gate of M10 and a drain of M12 are connected to a second digit line DL. The first and second nodes n1 and n2 are internal storage nodes of the SRAM portion.
    • 本发明公开了一种具有SRAM部分和标签比较部分的内容寻址存储器(CAM)单元。 标签比较部分包括六个称为M7至M12的NMOS晶体管,其中M7的源极连接到M8的漏极,M7的漏极连接到匹配线ML,M8的源极接地; M7的主体和M8的主体在M11的源处连接在一起,M7的门和M11的门被连接到第一节点n1,M8的门和M11的漏极连接到第一节点 数字线DLB; 并且M9的源极连接到M10的漏极,M9的漏极连接到所述匹配线ML,M10的源极接地; M9的主体和M10的主体在M12的源极处连接在一起,M9的门和M12的门被连接在一起到第二节点n2,M10的门和M12的漏极连接到第二个 数字线DL。 第一和第二节点n1和n2是SRAM部分的内部存储节点。