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    • 3. 发明授权
    • Method and apparatus for monitoring layer erosion in a dry-etching
process
    • 用于在干法蚀刻工艺中监测层侵蚀的方法和装置
    • US4948259A
    • 1990-08-14
    • US373883
    • 1989-06-30
    • Knut EnkeIngo HusslaGerhard Lorenz
    • Knut EnkeIngo HusslaGerhard Lorenz
    • G01B11/06H01J37/32
    • H01J37/32935G01B11/0683
    • A method and apparatus for monitoring layer erosion in a dry-etching process. The apparatus has a first electrode that is electrically connected to a substrate to be etched, as well as a second electrode that is located above the first electrode. Both electrodes are situated inside a process chamber. An optical photometer is positioned outside of the process chamber and directed onto the substrate in the process chamber. Signals received from the optical photometer are amplified by an electrical circuit and are edited and displayed with a Fourier transformation. The etching process can be automatically interrupted when received periodic signals having essentially constant amplitude and frequency undergo a significant change during the etching process of the upper layer. That is, they are received as signals signficantly deviating from one another, this being identified by the electrical circuit as the passage from one layer to another layer of the substrate during the dry-etching process.
    • 用于在干蚀刻工艺中监测层侵蚀的方法和装置。 该装置具有电连接到待蚀刻的基板的第一电极以及位于第一电极上方的第二电极。 两个电极位于处理室内。 光学光度计位于处理室的外部并且被引导到处理室中的衬底上。 从光学光度计接收到的信号由电路放大并用傅里叶变换进行编辑和显示。 当在上层的蚀刻工艺期间具有基本上恒定幅度和频率的接收周期信号经历显着变化时,可以自动中断蚀刻工艺。 也就是说,它们作为显着偏离的信号被接收,这被电路识别为在干蚀刻工艺期间从衬底的一层到另一层的通道。