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    • 7. 发明专利
    • Semiconductor stack comprising plurality of phase-change memory (PCM) cells and performing a logic operation
    • GB2505429A
    • 2014-03-05
    • GB201215340
    • 2012-08-29
    • IBM
    • KREBS DANIELSEBASTIAN ABU
    • G11C13/00H01L45/00H01L49/00
    • The present invention relates to a semiconductor slack 1 for performing at least a logic operation comprising: adjacent layers 2, 2' arranged in a stacked configuration with each layer 2, 2' comprising at least a phase-change memory (PCM) cell in which a phase-change material 3 is provided between a heater electrical terminal T2, T9 and at least two further heater electrical terminals T5, T6, the phase-change material 3 between the heater electrical terminal T2, T9 and each of the two further heater electrical terminals T5, T6 being operable in one of at least two reversibly transformable phases, an amorphous phase 3' and a crystalline phase 3", wherein the semiconductor stack, when in use, is configurable to store information by way of an electrical resistance R2, R8, R3, R9 of the phase 3", 3' of the phase-change material 3 between each heater electrical terminal T2, T9 and each of the two further heater electrical terminals T5, T6 in each layer 2, 2', and the logic operation is performed on the basis of the information stored in the adjacent layers 2, 2'. Depending on the read process pursued the logic operation may comprise a logic AND or a logic OR function. A method of operation of the semiconductor stack is also disclosed. There is further disclosure (figure 2) of a multi-terminal embodiment having for example seven heater electrical terminals allowing for complex logic operation on the multi-terminals. Further embodiments may include more than two stacked phase change memory cells in both two (2D) and three (3D) dimensions.
    • 8. 发明专利
    • Trainieren künstlicher neuronaler Netze
    • DE112018004223T5
    • 2020-05-07
    • DE112018004223
    • 2018-10-23
    • IBM
    • LE-GALLO-BOURDEAU MANUELSEBASTIAN ABUBOYBAT KARA IREMELEFTHERIOU EVANGELOS STAVROSSASIDHARAN RAJALEKSHMI NANDAKUMAR
    • G06N3/08G06N3/063
    • Es werden Verfahren und Vorrichtungen zum Trainieren eines künstlichen neuronalen Netzes mit einer Folge von Schichten von Neuronen mit dazwischen geschalteten Schichten von Synapsen bereitgestellt. Ein Satz von Kreuzschienenanordnungen memristiver Einheiten, die zwischen Zeilen- und Spaltenleitungen geschaltet sind, implementiert die Schichten von Synapsen. Jede memristive Einheit speichert ein Gewicht Ŵ für eine Synapse, die ein entsprechendes Paar von Neuronen in aufeinanderfolgenden Neuronenschichten miteinander verbindet. Das Trainingsverfahren weist Ausführen von Vorwärtsausbreitungs-, Rückwärtsausbreitungs- und Gewichtsaktualisierungsvorgängen eines sich wiederholenden Trainingsschemas auf, indem in mindestens einem der Vorwärtsausbreitungs- und Rückwärtsausbreitungsvorgänge einer von Zeilen- und Spaltenleitungen des Satzes von Anordnungen Eingangssignale zugeführt werden, die entsprechenden Neuronen zugehörig sind, um auf der anderen der Zeilen- und Spaltenleitungen Ausgangssignale zu erhalten, und digitale Signalwerte, die den Eingangs- und Ausgangssignalen entsprechen, in einer digitalen Verarbeitungseinheit gespeichert werden, die funktionsmäßig mit dem Satz von Anordnungen verbunden ist. Der Gewichtsaktualisierungsvorgang des Schemas wird durch Berechnen von digitalen Gewichtskorrekturwerten ΔW für entsprechende memristive Einheiten in Abhängigkeit von den gespeicherten digitalen Signalwerten in der digitalen Verarbeitungseinheit und Zuführen von Programmiersignalen zu diesen Einheiten ausgeführt, um die gespeicherten Gewichte W in Abhängigkeit von den entsprechenden digitalen Gewichtskorrekturwerten ΔW zu aktualisieren.
    • 9. 发明专利
    • Device and method for determining a cell level of a resistive memory cell
    • GB2525397A
    • 2015-10-28
    • GB201407089
    • 2014-04-22
    • IBM
    • KREBS DANIELGALLO MANUEL LESEBASTIAN ABU
    • G11C13/00G11C11/56
    • The invention relates a device and method for determining an actual level (L) of a multi level resistive memory cell having a plurality of programmable levels. The device comprises an estimator unit 110 and a detection unit 120 . The estimator unit 110 is adapted to receive a time input signal, t and a temperature input signal T and to estimate changes of a read-out signal of the levels of the resistive memory cell based on a time and temperature dependent model of the resistance changes, the received time input signal t and the received temperature input signal T. The detection unit is adapted to receive an actual read-out signal from the resistive memory cell and the estimated changes from the estimator unit. Further, the detection unit is adapted to determine the actual level of the resistive memory cell based on the received read-out signal and the received estimated changes. The estimator unit may be based on a model of a combination of a structural relaxation model and an electrical transport model. The structural relaxation model may be based on transitions between neighbouring states of the resistive memory corresponding to local minima.
    • 10. 发明专利
    • Determining a cell state of a resistive memory cell
    • GB2524534A
    • 2015-09-30
    • GB201405374
    • 2014-03-26
    • IBM
    • PAPANDREOU NIKOLAOSPOZIDIS CHARALAMPOSSTANISAVLJEVIC MILOSSEBASTIAN ABU
    • G11C13/00G11C11/56
    • A device and method for determining the cell state of a resistive memory cell (such as a phase change memory PCM cell) having a plurality M of programmable cell states. The device comprises a sensing circuit 110, a settling circuit (S2,150) a prebiasing circuit 130, 131 S1 150, and a resistor Ro, 150 coupled in parallel to the resistive memory cell 200, wherein the resistor is configured to reduce the effective resistance seen by the pre biasing circuit, hence reducing the effective RC time constant of the line and reducing the overall settling time. The sensing circuit is configured to sense a sensing voltage of the resistive memory cell and output a resultant value in response to the sensing voltage which is indicative for the actual cell state. The settling circuit is configured to rapidly settle the sensing voltage to a certain target voltage representing one of the M programmable cell states. The pre biasing circuit 130 is configured to rapidly pre bias a bitline capacitance of the resistive memory cell such that the sensing voltage is close to the certain target voltage. The resistance Ro 150 may be between five and fifteen times smaller than the highest resistance value of the resistive memory cell or PCM cell. A controller (5 figure 1) activates switches S1,S2,S3 to enable pre-bias, settling and sampling modes. The controller also feeds, during the pre bias phase, a number N of gradually rising biasing voltages Vo to the pre bias circuit and bitline by means of a source follower clamping or limiter circuit 131.