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1. 发明授权

US09028090B2 LED lamp 有权
标题翻译：点灯
公开(公告)号：US09028090B2
公开(公告)日：2015-05-12
申请号：US13590449
申请日：2012-08-21
申请人： Yoshiaki Nagashima , Masaru Igaki
发明人： Yoshiaki Nagashima , Masaru Igaki
IPC分类号： F21V1/00 , F21V21/00 , F21K99/00 , H05B33/08 , H05B37/02 , F21V23/04 , F21V3/02 , F21Y101/02 , F21Y103/00
CPC分类号： H05B37/0227 , F21K9/23 , F21K9/278 , F21V3/02 , F21V23/0471 , F21Y2103/10 , F21Y2115/10 , H01L2224/48091 , H01L2224/48247 , H01L2924/181 , H05B33/0803 , H01L2924/00012 , H01L2924/00014
摘要： An LED lamp includes LED chips, a translucent cover housing the LED chips, a motion sensor unit, a condensing lens, and a power unit. The motion sensor unit includes a light receiving element for light of a predetermined wavelength. The lens condenses light of the predetermined wavelength onto the light receiving element. The power unit controls the state of operation of the LED chips based on an output from the motion sensor unit. The motion sensor unit includes a light shielding member disposed to overlap the light receiving element in an optical axis direction of the condensing lens and also to surround the light receiving element as viewed in the optical axis direction. The light shielding member is made of a material having a lower light transmissivity than that of the condensing lens for a range of wavelengths including the predetermined wavelength.
摘要翻译： LED灯包括LED芯片，容纳LED芯片的半透明盖，运动传感器单元，聚光透镜和功率单元。运动传感器单元包括用于预定波长的光的光接收元件。透镜将预定波长的光会聚到光接收元件上。功率单元基于来自运动传感器单元的输出来控制LED芯片的操作状态。运动传感器单元包括遮光构件，其设置成在聚光透镜的光轴方向上与光接收元件重叠，并且还围绕光轴方向观察受光元件。遮光构件由对于包括预定波长的波长范围具有比聚光透镜低的透光率的材料制成。

2. 发明申请

US20130049598A1 LED LAMP 有权
公开(公告)号：US20130049598A1
公开(公告)日：2013-02-28
申请号：US13590449
申请日：2012-08-21
申请人： Yoshiaki NAGASHIMA , Masaru IGAKI
发明人： Yoshiaki NAGASHIMA , Masaru IGAKI
IPC分类号： H05B37/02
CPC分类号： H05B37/0227 , F21K9/23 , F21K9/278 , F21V3/02 , F21V23/0471 , F21Y2103/10 , F21Y2115/10 , H01L2224/48091 , H01L2224/48247 , H01L2924/181 , H05B33/0803 , H01L2924/00012 , H01L2924/00014
摘要： An LED lamp includes LED chips, a translucent cover housing the LED chips, a motion sensor unit, a condensing lens, and a power unit. The motion sensor unit includes a light receiving element for light of a predetermined wavelength. The lens condenses light of the predetermined wavelength onto the light receiving element. The power unit controls the state of operation of the LED chips based on an output from the motion sensor unit. The motion sensor unit includes a light shielding member disposed to overlap the light receiving element in an optical axis direction of the condensing lens and also to surround the light receiving element as viewed in the optical axis direction. The light shielding member is made of a material having a lower light transmissivity than that of the condensing lens for a range of wavelengths including the predetermined wavelength.

3. 发明授权

US07171854B2 Nondestructive inspection apparatus and nondestructive inspection method using elastic guided wave 有权
标题翻译：无损检测装置和弹性导波无损检测方法
公开(公告)号：US07171854B2
公开(公告)日：2007-02-06
申请号：US10780751
申请日：2004-02-19
申请人： Yoshiaki Nagashima , Masahiro Koike , Tetsuya Matsui
发明人： Yoshiaki Nagashima , Masahiro Koike , Tetsuya Matsui
IPC分类号： G01N29/04
CPC分类号： G01N29/4436 , G01N29/221 , G01N2291/011 , G01N2291/0258 , G01N2291/02827 , G01N2291/02854 , G01N2291/0421 , G01N2291/0422 , G01N2291/044 , G01N2291/102 , G01N2291/2634
摘要： A nondestructive inspection apparatus using a guided wave having waveform forming part that form a transmission waveform; a transmitting element for generating a guided wave within an object under inspection; a receiving element for receiving a reflection wave of the guided wave from an inspection region of the object under inspection; an analyzing element for outputting inspection information which is acquired based upon the reception waveform of the reflection wave received by the receiving element; and a display for displaying the inspection information.
摘要翻译：一种使用具有形成发送波形的波形形成部的导波的非破坏性检查装置，用于在被检查物体内产生导波的发射元件; 接收元件，用于从被检查物体的检查区域接收导波的反射波; 用于输出基于由所述接收元件接收的反射波的接收波形获取的检查信息的分析元件; 以及用于显示检查信息的显示器。

4. 发明申请

US20110308316A1 NONDESTRUCTIVE INSPECTION APPARATUS AND NONDESTRUCTIVE INSPECTION METHOD USING GUIDED WAVE 有权
标题翻译：非导体检查装置和使用引导波的非结构检查方法
公开(公告)号：US20110308316A1
公开(公告)日：2011-12-22
申请号：US13218920
申请日：2011-08-26
申请人： Masahiro MIKI , Yoshiaki NAGASHIMA , Masao ENDOU , Kojiro KODAIRA , Mitsuru ODAKURA
发明人： Masahiro MIKI , Yoshiaki NAGASHIMA , Masao ENDOU , Kojiro KODAIRA , Mitsuru ODAKURA
IPC分类号： G01N29/04
CPC分类号： G01N29/2462 , G01N29/07 , G01N29/4436 , G01N2291/02827 , G01N2291/02854 , G01N2291/2634
摘要： A nondestructive inspection apparatus includes a pair of guided wave sensors disposed on an outer surface of a piping and a guided wave inspection device connected to the pair of guided wave sensors which, outputs a transmitting signal for propagating a guided wave to the guided wave sensors, and obtains a receiving signal by receiving a propagated signal by the guided wave sensors. An inspection-result storage device stores the guided wave as a digitized signal of the received wave and an inspection-result diagnostic device performs arithmetic processing of judging whether or not a signal associated with a defect exists.
摘要翻译：非破坏性检查装置包括配置在配管的外表面上的一对导波传感器和与该对导波传感器连接的导波检测装置，其向导波传感器输出用于传播导波的发送信号，并且通过由导波传感器接收传播的信号来获得接收信号。检查结果存储装置将导波存储为接收波的数字化信号，检查结果诊断装置进行判断与缺陷有关的信号是否存在的运算处理。

5. 外观设计

USD701630S1 Light emitting diode lamp 有权
公开(公告)号：USD701630S1
公开(公告)日：2014-03-25
申请号：US29417669
申请日：2012-04-06
申请人： Yoshiaki Nagashima
设计人： Yoshiaki Nagashima

6. 发明申请

US20090031813A1 NONDESTRUCTIVE INSPECTION APPARATUS AND NONDESTRUCTIVE INSPECTION METHOD USING GUIDED WAVE 有权
标题翻译：非导体检查装置和使用引导波的非结构检查方法
公开(公告)号：US20090031813A1
公开(公告)日：2009-02-05
申请号：US12176671
申请日：2008-07-21
申请人： Masahiro MIKI , Yoshiaki Nagashima , Masao Endou , Kojiro Kodaira , Mitsuru Odakura
发明人： Masahiro MIKI , Yoshiaki Nagashima , Masao Endou , Kojiro Kodaira , Mitsuru Odakura
IPC分类号： G01N29/04
CPC分类号： G01N29/2462 , G01N29/07 , G01N29/4436 , G01N2291/02827 , G01N2291/02854 , G01N2291/2634
摘要： Disclosed herein are an apparatus and a technique for quickly detecting a defective portion including wastage, which has occurred in piping having a straight piping portion or a bending zone, in the nondestructive inspection using a guided wave.A guided wave sensor 3 included in a guided wave inspection device 4 is mounted to the outer surface of piping 1. A guided wave is propagated to an inspection area of the piping 1. If a defective portion exists, the guided wave sensor 3 receives the guided wave that has been reflected from the defective portion. As a result, the guided wave inspection device 4 can acquire receive information including receive information derived from the defect. On the other hand, receive information acquired when piping, whose kind and shape are the same as those of the piping 1, and which has no defect to be detected, is inspected by the guided wave inspection device under the same conditions as those of the inspection of the piping 1 is stored in an inspection result storage device 12 as reference receive information. An inspection-result diagnostic device 13 compares the receive information acquired when the piping 1 to be inspected has been inspected with the reference receive information, which has been stored in the inspection result storage device 12, so that significant receive information derived from the defect is extracted.
摘要翻译：这里公开了一种用于在使用导波的非破坏性检查中快速检测包括在具有直的管道部分或弯曲区域的管道中发生的损耗的缺陷部分的装置和技术。包括在导波检测装置4中的导波传感器3安装在管道1的外表面。导波传播到管道1的检查区域。如果存在缺陷部分，则导波传感器3接收已经从缺陷部分反射的导波。结果，导波检查装置4可以获取包括从缺陷导出的接收信息的接收信息。另一方面，在与导管1的类型和形状相同的管道1中获得的并且没有被检测到缺陷的管道的接收信息在与波导管的相同的条件下由导波检查装置进行检查管道1的检查作为参考接收信息存储在检查结果存储装置12中。检查结果诊断装置13将检查出的被检查管道1所获取的接收信息与已经存储在检查结果存储装置12中的参考接收信息进行比较，使得从缺陷得到的有效的接收信息为提取。

7. 发明授权

US5663502A Method and apparatus for measuring thickness of layer using acoustic waves 失效
标题翻译：使用声波测量层厚度的方法和装置
公开(公告)号：US5663502A
公开(公告)日：1997-09-02
申请号：US544932
申请日：1995-10-18
申请人： Yoshiaki Nagashima , Kenichi Fujiwara , Masao Sato , Fuminobu Takahashi , Masahiro Koike , Hajime Umehara , Yoshihiro Michiguchi
发明人： Yoshiaki Nagashima , Kenichi Fujiwara , Masao Sato , Fuminobu Takahashi , Masahiro Koike , Hajime Umehara , Yoshihiro Michiguchi
IPC分类号： G01B17/02 , G01N29/11 , G01N29/46 , G01N29/08 , G01N29/10
CPC分类号： G01N29/46 , G01B17/025 , G01N29/11 , G01N2291/014 , G01N2291/015 , G01N2291/0231 , G01N2291/02854 , G01N2291/0421 , G01N2291/0422 , G01N2291/0428 , G01N2291/044 , G01N2291/048
摘要： Ultrasonic waves from a transmit device are transmitted to an object subject to measurement. A surface reflected wave propagated in a contact medium and reflected at the surface of a tube and bottom surface reflected waves passing through an oxidation layer on the tube and reflected at the inner surface of the tube are convened into electric signals. A feature extracting part 5, in consideration of a correlation relationship of energy with respect to the frequency of a received signal, based on the received signal of ultrasonic waves converted to electric signals, extracts a signal feature data determined beforehand which has a strong correlation relationship with the thickness of a measured part. Based on the extracted signal feature data, a thickness conversion part references a relationship storage part which has stored therein beforehand a function that shows a relationship between the signal feature data and the thickness of the oxidation layer, and obtains the thickness of the oxidation layer.
摘要翻译：来自发送装置的超声波被发送到被测物体。在接触介质中传播并在管表面反射的表面反射波和底面反射通过管上的氧化层并在管的内表面反射的反射波被转换为电信号。考虑到能量相对于接收信号的频率的相关关系的特征提取部分5，基于被转换为电信号的超声波的接收信号，提取预先确定的具有强相关关系的信号特征数据具有测量部分的厚度。基于所提取的信号特征数据，厚度转换部分参考预先存储在其中的信息特征数据与氧化层的厚度之间的关系的函数的关系存储部分，并获得氧化层的厚度。

8. 发明授权

US08820163B2 Nondestructive inspection apparatus and nondestructive inspection method using guided wave 有权
标题翻译：无损检测仪器和无损检测方法使用导波
公开(公告)号：US08820163B2
公开(公告)日：2014-09-02
申请号：US13218920
申请日：2011-08-26
申请人： Masahiro Miki , Yoshiaki Nagashima , Masao Endou , Kojiro Kodaira , Mitsuru Odakura
发明人： Masahiro Miki , Yoshiaki Nagashima , Masao Endou , Kojiro Kodaira , Mitsuru Odakura
IPC分类号： G01N29/04
CPC分类号： G01N29/2462 , G01N29/07 , G01N29/4436 , G01N2291/02827 , G01N2291/02854 , G01N2291/2634
摘要： A nondestructive inspection apparatus includes a pair of guided wave sensors disposed on an outer surface of a piping and a guided wave inspection device connected to the pair of guided wave sensors which, outputs a transmitting signal for propagating a guided wave to the guided wave sensors, and obtains a receiving signal by receiving a propagated signal by the guided wave sensors. An inspection-result storage device stores the guided wave as a digitized signal of the received wave and an inspection-result diagnostic device performs arithmetic processing of judging whether or not a signal associated with a defect exists.
摘要翻译：非破坏性检查装置包括配置在配管的外表面上的一对导波传感器和与该对导波传感器连接的导波检测装置，其向导波传感器输出用于传播导波的发送信号，并且通过由导波传感器接收传播的信号来获得接收信号。检查结果存储装置将导波存储为接收波的数字化信号，检查结果诊断装置进行判断与缺陷有关的信号是否存在的运算处理。

9. 发明授权

US08091427B2 Nondestructive inspection apparatus and nondestructive inspection method using guided wave 有权
标题翻译：无损检测仪器和无损检测方法使用导波
公开(公告)号：US08091427B2
公开(公告)日：2012-01-10
申请号：US12176671
申请日：2008-07-21
申请人： Masahiro Miki , Yoshiaki Nagashima , Masao Endou , Kojiro Kodaira , Mitsuru Odakura
发明人： Masahiro Miki , Yoshiaki Nagashima , Masao Endou , Kojiro Kodaira , Mitsuru Odakura
IPC分类号： G01N29/04
CPC分类号： G01N29/2462 , G01N29/07 , G01N29/4436 , G01N2291/02827 , G01N2291/02854 , G01N2291/2634
摘要： Disclosed herein are an apparatus and a technique for quickly detecting a defective portion including wastage, which has occurred in piping having a straight piping portion or a bending zone, in the nondestructive inspection using a guided wave. A guided wave sensor 3 included in a guided wave inspection device 4 is mounted to the outer surface of piping 1. A guided wave is propagated to an inspection area of the piping 1. If a defective portion exists, the guided wave sensor 3 receives the guided wave that has been reflected from the defective portion. As a result, the guided wave inspection device 4 can acquire receive information including receive information derived from the defect.
摘要翻译：这里公开了一种用于在使用导波的非破坏性检查中快速检测包括在具有直的管道部分或弯曲区域的管道中发生的损耗的缺陷部分的装置和技术。包括在导波检测装置4中的导波传感器3安装在管道1的外表面。导波传播到管道1的检查区域。如果存在缺陷部分，则导波传感器3接收已经从缺陷部分反射的导波。结果，导波检查装置4可以获取包括从缺陷导出的接收信息的接收信息。

10. 发明授权

US4371550A Process for brewing beer 失效
标题翻译：啤酒酿造工艺
公开(公告)号：US4371550A
公开(公告)日：1983-02-01
申请号：US234138
申请日：1981-02-13
申请人： Yoshiaki Nagashima , Yoshiomi Kimura , Naoki Hashimoto
发明人： Yoshiaki Nagashima , Yoshiomi Kimura , Naoki Hashimoto
IPC分类号： C12C11/00 , C12C7/047 , C12C12/00 , C12C9/00 , C12C11/04
CPC分类号： C12C7/047 , C12C12/00
摘要： Beer is brewed by a process which comprises mixing a high-gravity liquor comprising a fermenting wort of an original gravity of 14 to 21 degrees of plato after the high kraeusen period and a low-gravity liquor comprising a fermenting wort or wort of an original gravity of 3 to 6 degrees of plato and subjecting the resulting mixture to fermentation thereby to obtain a beer of an original gravity of 6 to 9 degrees of plato.
摘要翻译：通过一种方法酿造啤酒，该方法包括将高重力液体与高重量液体混合，所述高重液体包含在高克赖翁时期之后的原始重力为14至21度的发酵麦芽汁和包含发酵麦芽汁或原始重力的麦芽汁的低重力液体的3至6度的柏拉图，并使所得混合物发酵，从而获得原始重力为6至9度的柏拉图啤酒。

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