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1. 发明申请

WO2011082180A3 TEST SYSTEMS AND METHODS FOR TESTING ELECTRONIC DEVICES 审中-公开
标题翻译：用于测试电子设备的测试系统和方法
公开(公告)号：WO2011082180A3
公开(公告)日：2011-10-27
申请号：PCT/US2010062256
申请日：2010-12-28
申请人： FORMFACTOR INC , BERRY TOMMIE E , BREINLINGER KEITH J , HOBBS ERIC D , LORANGER MARC , SLOCUM ALEXANDER H , WILSON ADRIAN S
发明人： BERRY TOMMIE E , BREINLINGER KEITH J , HOBBS ERIC D , LORANGER MARC , SLOCUM ALEXANDER H , WILSON ADRIAN S
IPC分类号： G01R31/26 , H01L21/66
CPC分类号： G01R31/2891
摘要： Devices under test (DUTs) can be tested in a test system that includes an aligner and test cells. A DUT can be moved into and clamped in an aligned position on a carrier in the aligner. In the align position, electrically conductive terminals of the DUT can be in a predetermined position with respect to carrier alignment features of the carrier. The DUT/carrier combination can then be moved from the aligner into one of the test cells, where alignment features of the carrier are mechanically coupled with alignment features of a contactor in the test cell. The mechanical coupling automatically aligns terminals of the DUT with probes of the contactor. The probes thus contact and make electrical connections with the terminals of the DUT. The DUT is then tested. The aligner and each of the test cells can be separate and independent devices so that a DUT can be aligned in the aligner while other DUTs, having previously been aligned to a carrier in the aligner, are tested in a test cell.
摘要翻译：被测设备（DUT）可以在包括对准器和测试单元的测试系统中进行测试。 DUT可以被移动并被夹持在对准器中的载体上的对准位置。在对准位置，DUT的导电端子可以相对于载体的载体对准特征处于预定位置。然后可以将DUT /载体组合从对准器移动到测试单元之一中，其中载体的对准特征与测试单元中的接触器的对准特征机械耦合。机械联轴器将DUT的端子自动对准接触器的探头。探头因此与DUT的端子接触并进行电气连接。然后测试DUT。对准器和每个测试单元可以是分离和独立的器件，使得DUT可以在对准器中对准，而在测试单元中测试已经与对准器中的载体对准的其它DUT。

2. 发明申请

WO2011082180A2 TEST SYSTEMS AND METHODS FOR TESTING ELECTRONIC DEVICES 审中-公开
标题翻译：用于测试电子设备的测试系统和方法
公开(公告)号：WO2011082180A2
公开(公告)日：2011-07-07
申请号：PCT/US2010/062256
申请日：2010-12-28
申请人： FORMFACTOR, INC. , BERRY, Tommie E. , BREINLINGER, Keith J. , HOBBS, Eric D. , LORANGER, Marc , SLOCUM, Alexander H. , WILSON, Adrian S.
发明人： BERRY, Tommie E. , BREINLINGER, Keith J. , HOBBS, Eric D. , LORANGER, Marc , SLOCUM, Alexander H. , WILSON, Adrian S.
IPC分类号： G01R31/26 , H01L21/66
CPC分类号： G01R31/2891
摘要： Devices under test (DUTs) can be tested in a test system that includes an aligner and test cells. A DUT can be moved into and clamped in an aligned position on a carrier in the aligner. In the align position, electrically conductive terminals of the DUT can be in a predetermined position with respect to carrier alignment features of the carrier. The DUT/carrier combination can then be moved from the aligner into one of the test cells, where alignment features of the carrier are mechanically coupled with alignment features of a contactor in the test cell. The mechanical coupling automatically aligns terminals of the DUT with probes of the contactor. The probes thus contact and make electrical connections with the terminals of the DUT. The DUT is then tested. The aligner and each of the test cells can be separate and independent devices so that a DUT can be aligned in the aligner while other DUTs, having previously been aligned to a carrier in the aligner, are tested in a test cell.
摘要翻译：被测器件（DUT）可以在包括对准器和测试单元的测试系统中进行测试。被测设备可以被移入和对准在对准器中的载体上的对准位置。在对准位置，DUT的导电端子可以相对于载体的载体对准特征处于预定位置。然后可以将DUT /载体组合从对准器移动到其中一个测试单元中，其中载体的对准特征与测试单元中的接触器的对准特征机械耦合。机械耦合自动将DUT的端子与接触器的探针对齐。探头因此接触并与DUT的端子电连接。然后测试DUT。对准器和每个测试单元可以是分离的和独立的器件，以便DUT可以在对准器中对准，而先前已经与对准器中的载体对准的其他DUT在测试单元中进行测试。

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