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1. 发明授权

US5691990A Hybrid partial scan method 失效
标题翻译：混合部分扫描法
公开(公告)号：US5691990A
公开(公告)日：1997-11-25
申请号：US759286
申请日：1996-12-02
申请人： Rohit Kapur , Thomas J. Snethen , Kamran K. Zarrineh
发明人： Rohit Kapur , Thomas J. Snethen , Kamran K. Zarrineh
IPC分类号： G01R31/3185 , G06F11/00
CPC分类号： G01R31/318586
摘要： An efficient method of selecting flip-flops to be made scannable in a digital integrated circuit design for purposes of improving testability without incurring the overhead of full-scan, comprising the steps of (a) partitioning the faults in the circuit into a first fault type and a second fault type, (b) selecting a static characterization algorithm for characterizing the first and second fault types, (c) determining the relationship between attainable fault coverage and the characterized values for the first and second fault types, (d) characterizing the first and second fault types for each candidate flip-flop for scan in the digital integrated circuit with the static characterization algorithm, (e) determining the first and second fault types that are the closest together in value, (f) selecting the flip-flop associated with the first and second fault types determined in step (e), (g) forming a shift register with flip-flop selected in step (f), (h) repeating steps (d)-(g) until the attainable fault coverage determined in step (c) is attained, and (i) generating test data for the network with the shift register configured in step (h).
摘要翻译：为了提高可测试性而不引起全扫描的开销，选择在数字集成电路设计中可扫描的触发器的有效方法包括以下步骤：（a）将电路中的故障划分为第一故障类型和第二故障类型，（b）选择表征第一和第二故障类型的静态表征算法，（c）确定可达到的故障覆盖与第一和第二故障类型的特征值之间的关系，（d）使用静态表征算法在数字集成电路中扫描每个候选触发器的第一和第二故障类型，（e）确定在值中最接近的第一和第二故障类型，（f）选择触发器与在步骤（e）中确定的第一和第二故障类型相关联，（g）在步骤（f）中形成具有触发器的移位寄存器，（h）重复步骤（d） - （g）获得在步骤（c）中确定的可达到的故障覆盖范围，并且（i）利用在步骤（h）中配置的移位寄存器生成网络的测试数据。

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