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1. 发明授权

US5691669A Dual adjust current controlled phase locked loop 失效
标题翻译：双调节电流控制锁相环
公开(公告)号：US5691669A
公开(公告)日：1997-11-25
申请号：US585053
申请日：1996-01-11
申请人： Li Ching Tsai , Hugh S. C. Wallace
发明人： Li Ching Tsai , Hugh S. C. Wallace
IPC分类号： H03K3/0231 , H03L7/099
CPC分类号： H03L7/0995 , H03K3/0231 , H03L2207/06 , Y10S331/02
摘要： A dual adjust current-controlled phase locked loop is provided for allowing multiple-gain frequency acquisition of a signal. The dual adjust current-controlled phase locked loop includes a phase detector responsive to a reference signal and a synthesized signal for producing a phase error signal; a controller responsive to the phase error signal for generating coarse and fine adjust control signals; and a dual adjust current-controlled oscillator responsive to the coarse and fine adjust control signals for adjusting the oscillating frequency of the synthesized signal. The dual adjust current controlled oscillator includes a differential current controlled ring oscillator comprising a series of delay elements. Each delay element includes a high gain circuit responsive to the coarse adjust control signal and a low gain circuit responsive to the fine adjust control signal.
摘要翻译：提供双调节电流控制锁相环，用于允许信号的多增益频率采集。双调节电流控制锁相环包括响应于参考信号的相位检测器和用于产生相位误差信号的合成信号; 控制器，响应于相位误差信号，用于产生粗调和微调的控制信号; 以及响应于粗调和精细调节控制信号的双调节电流控制振荡器，用于调整合成信号的振荡频率。双调节电流控制振荡器包括包括一系列延迟元件的差动电流控制环形振荡器。每个延迟元件包括响应于粗略调节控制信号的高增益电路和响应于微调控制信号的低增益电路。

2. 发明授权

US07590903B2 Re-configurable architecture for automated test equipment 有权
标题翻译：自动化测试设备的可重构架构
公开(公告)号：US07590903B2
公开(公告)日：2009-09-15
申请号：US11435064
申请日：2006-05-15
申请人： Erik Volkerink , Hugh S. C. Wallace , Klaus-Dieter Hilliges , Ajay Khoche , Jochen Rivoir
发明人： Erik Volkerink , Hugh S. C. Wallace , Klaus-Dieter Hilliges , Ajay Khoche , Jochen Rivoir
IPC分类号： G01R31/28 , G11C29/00 , G06F11/00
CPC分类号： G01R31/31907
摘要： An adaptive test system includes one or more reconfigurable test boards, with each test board including at least one re-configurable test processor. The re-configurable test processors can transmit communicate with one another using an inter-processor communications controller associated with each re-configurable test processor. The communications include configuration information, control information, communication protocols, stimulus data, and responses. Configuration information and stimulus data can also be read from a memory. Configuration information is used to configure one or more re-configurable test processors. Once configured, the re-configurable test processor or processors process the data in order to generate one or more test signals. The one or more test signals are then used to test a DUT.
摘要翻译：自适应测试系统包括一个或多个可重新配置的测试板，每个测试板包括至少一个可重新配置的测试处理器。可重新配置的测试处理器可以使用与每个可重新配置的测试处理器相关联的处理器间通信控制器彼此进行通信。通信包括配置信息，控制信息，通信协议，刺激数据和响应。还可以从存储器读取配置信息和激励数据。配置信息用于配置一个或多个可重新配置的测试处理器。一旦配置，可重新配置的测试处理器或处理器处理数据，以产生一个或多个测试信号。然后使用一个或多个测试信号来测试DUT。

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