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1. 发明授权

US07846396B2 Sample holder for surface plasmon resonance measuring instruments 有权
标题翻译：表面等离子体共振测量仪器的样品架
公开(公告)号：US07846396B2
公开(公告)日：2010-12-07
申请号：US11141167
申请日：2005-05-31
申请人： Daniel B. Roitman , Gregory D. VanWiggeren
发明人： Daniel B. Roitman , Gregory D. VanWiggeren
IPC分类号： B01L3/00
CPC分类号： G01N21/553 , B01L3/5085 , B01L3/5088 , B01L2300/0822 , B01L2300/161 , B82Y20/00 , G02B5/008 , Y10T436/24 , Y10T436/25
摘要： A droplet sample holder, especially a sample holder for use in a measuring instrument utilizing surface plasmon resonance. The sample holder reduces or minimizes the measurement distortion result of the droplet “pherpheral concentration effect” by surrounding the analysis zone with a wettable (hydrophilic) zone that captures the periphery of the droplet to keep the pheriphery of the droplet and the increased concentration of the analyte out of the analysis zone. The wettable zone is surrounded by a nonwettable (hydrophobic) zone that restricts the periphery of the droplet to analysis zone and the wettable zone.
摘要翻译：液滴样品架，特别是用于使用表面等离子体共振的测量仪器中的样品架。样品架通过用可捕获液滴的周边的可湿性（亲水性）区围绕分析区来降低或最小化液滴“pherpheral浓度效应”的测量失真结果，以保持液滴的浓度，并且增加浓度分析出分析区。可湿润区域被不可润湿（疏水）区域围绕，该区域将液滴的周边限制到分析区域和可湿性区域。

2. 发明授权

US07737947B2 Tracking motion using an interference pattern 有权
标题翻译：使用干涉图案跟踪运动
公开(公告)号：US07737947B2
公开(公告)日：2010-06-15
申请号：US10687431
申请日：2003-10-16
申请人： Dale W. Schroeder , Marshall T. DePue , Ramakrishna Kakarala , Tong Xie , Gregory D. VanWiggeren
发明人： Dale W. Schroeder , Marshall T. DePue , Ramakrishna Kakarala , Tong Xie , Gregory D. VanWiggeren
IPC分类号： G09G5/08
CPC分类号： G06F3/0317 , G06F3/03545
摘要： A system, method, and device for tracking motion across a surface by creating an interference pattern by reflecting light from the surface. There is produced, as a result of sensor moving across the surface, at least one signal pattern corresponding to a detection of a dimension of the interference pattern. This detected dimension is associated with an assumed dimensional value to determine a distance traveled by the sensor.
摘要翻译：一种用于通过反射来自表面的光产生干涉图案来跟踪表面上的运动的系统，方法和装置。由于传感器在整个表面上移动，所产生的至少一个信号模式对应于干涉图案尺寸的检测。该检测尺寸与假设的尺寸值相关联，以确定传感器行进的距离。

3. 发明授权

US07009691B2 System and method for removing the relative phase uncertainty in device characterizations performed with a polarimeter 失效
公开(公告)号：US07009691B2
公开(公告)日：2006-03-07
申请号：US10157682
申请日：2002-05-29
申请人： Gregory D. VanWiggeren , Douglas M. Baney
发明人： Gregory D. VanWiggeren , Douglas M. Baney
IPC分类号： G01B9/02
CPC分类号： G01M11/331 , G01M11/31 , G01M11/338
摘要： By making combined interferometric and polarimetric measurements on a device under test, the relative phase uncertainty in device characterizations performed with a polarimeter or polarization analyzer alone is removed. This allows determination of the group delay to within a constant offset and the chromatic dispersion of the device under test.

4. 发明授权

US06914681B2 Interferometric optical component analyzer based on orthogonal filters 失效
标题翻译：基于正交滤波器的干涉光学元件分析仪
公开(公告)号：US06914681B2
公开(公告)日：2005-07-05
申请号：US09938100
申请日：2001-08-22
申请人： Bogdan Szafraniec , Gregory D. Vanwiggeren , Ali Motamedi
发明人： Bogdan Szafraniec , Gregory D. Vanwiggeren , Ali Motamedi
IPC分类号： G01J9/04 , G01B9/02 , G01M11/00 , G01M11/02
CPC分类号： G01M11/3172 , G01B2290/60
摘要： A system and method for measuring optical characteristics of an optical device under test (DUT) is provided. The system includes a light source for generating an optical signal applied to the optical DUT. A reference interferometer and a test interferometer are optically coupled to the light source. A computing unit is coupled to the interferometers, and utilizes amplitude and phase computing components, such as orthogonal filters, in determining optical characteristics of the optical DUT.
摘要翻译：提供了一种用于测量被测光学器件（DUT）的光学特性的系统和方法。该系统包括用于产生施加到光学DUT的光信号的光源。参考干涉仪和测试干涉仪光耦合到光源。计算单元耦合到干涉仪，并且在确定光学DUT的光学特性时利用幅度和相位计算组件，例如正交滤波器。

5. 发明授权

US06900896B2 Method and system for measuring optical characteristics of a sub-component within a composite optical system 失效
标题翻译：用于测量复合光学系统内的子部件的光学特性的方法和系统
公开(公告)号：US06900896B2
公开(公告)日：2005-05-31
申请号：US10098702
申请日：2002-03-15
申请人： Ali Motamedi , Bogdan Szafraniec , Gregory D. VanWiggeren
发明人： Ali Motamedi , Bogdan Szafraniec , Gregory D. VanWiggeren
IPC分类号： G01J9/04 , G01B9/02 , G01M11/00 , G01M11/02 , G01B11/02 , G01N21/00
CPC分类号： G01M11/3172 , G01B2290/60
摘要： A method and system for measuring optical characteristics of a sub-component within a composite optical system is disclosed. In one embodiment, the present invention generates an optical response from a composite optical system. The present embodiment then separates an optical response of a sub-component from the optical response of the composite optical system. The present embodiment then determines the optical characteristics of the sub-component by utilizing at least one portion of the optical response of the sub-component.
摘要翻译：公开了一种用于测量复合光学系统内的子部件的光学特性的方法和系统。在一个实施例中，本发明从复合光学系统产生光学响应。然后，本实施例将子部件的光学响应与复合光学系统的光学响应分离。然后，本实施例通过利用子部件的光学响应的至少一部分来确定子部件的光学特性。

6. 发明授权

US07474404B2 Voltage sensor capable of contactless voltage measurement 失效
标题翻译：电压传感器可进行非接触式电压测量
公开(公告)号：US07474404B2
公开(公告)日：2009-01-06
申请号：US11741567
申请日：2007-04-27
申请人： Gregory D. VanWiggeren
发明人： Gregory D. VanWiggeren
IPC分类号： G01N21/55
CPC分类号： G01N21/553
摘要： A voltage sensor capable of single-point or simultaneous multi-point contactless voltage measurement has an electro-optic transducer, a surface plasmon resonance (SPR) and an optical system. The electro-optic transducer is operable to translate an electric field dependent on the voltage in a device under test field to a variation in refractive index. The surface plasmon resonance (SPR) transducer is juxtaposed with the electro-optic transducer and is operable to translate the variation in the refractive index of the electro-optic transducer to a variation in reflectivity. The optical system is configured to illuminate the SPR transducer with incident light at a surface plasmon resonance-inducing angle of incidence and to detect light reflected by the SPR transducer at a single point or at multiple points within a region.
摘要翻译：能够进行单点或同时多点非接触电压测量的电压传感器具有电光换能器，表面等离子体共振（SPR）和光学系统。电光换能器可操作以将取决于被测装置中的装置的电压的电场平移到折射率的变化。表面等离子体共振（SPR）传感器与电光换能器并置并且可操作以将电光换能器的折射率的变化转换为反射率的变化。光学系统被配置为用表面等离子体共振引起入射角的入射光照射SPR传感器，并且在单个点或在一个区域内的多个点处检测由SPR换能器反射的光。

7. 发明申请

US20080266568A1 Voltage Sensor Capable of Contactless Voltage Measurement 失效
标题翻译：具有非接触电压测量功能的电压传感器
公开(公告)号：US20080266568A1
公开(公告)日：2008-10-30
申请号：US11741567
申请日：2007-04-27
申请人： Gregory D VanWiggeren
发明人： Gregory D VanWiggeren
IPC分类号： G01N21/55
CPC分类号： G01N21/553
摘要： A voltage sensor capable of single-point or simultaneous multi-point contactless voltage measurement has an electro-optic transducer, a surface plasmon resonance (SPR) and an optical system. The electro-optic transducer is operable to translate an electric field dependent on the voltage in a device under test field to a variation in refractive index. The surface plasmon resonance (SPR) transducer is juxtaposed with the electro-optic transducer and is operable to translate the variation in the refractive index of the electro-optic transducer to a variation in reflectivity. The optical system is configured to illuminate the SPR transducer with incident light at a surface plasmon resonance-inducing angle of incidence and to detect light reflected by the SPR transducer at a single point or at multiple points within a region.
摘要翻译：能够进行单点或同时多点非接触电压测量的电压传感器具有电光换能器，表面等离子体共振（SPR）和光学系统。电光换能器可操作以将取决于被测装置中的装置的电压的电场平移到折射率的变化。表面等离子体共振（SPR）传感器与电光换能器并置并且可操作以将电光换能器的折射率的变化转化为反射率的变化。光学系统被配置为用表面等离子体共振引起入射角的入射光照射SPR传感器，并且在单个点或在一个区域内的多个点处检测由SPR换能器反射的光。

8. 发明授权

US07317519B2 Swept-angle SPR measurement system 有权
标题翻译：扫频SPR测量系统
公开(公告)号：US07317519B2
公开(公告)日：2008-01-08
申请号：US10977669
申请日：2004-10-29
申请人： Gregory D. VanWiggeren , Douglas M. Baney
发明人： Gregory D. VanWiggeren , Douglas M. Baney
IPC分类号： G01N21/41 , G01N21/55
CPC分类号： G01N21/553
摘要： A swept-angle SPR measurement system deflects an optical beam over a range of deflection angles according to a control signal and maps the deflected beam to a target within a range of incidence angles that corresponds to the range of deflection angles.
摘要翻译：扫掠角SPR测量系统根据控制信号使光束偏转在偏转角范围上，并将偏转光束映射到对应于偏转角范围的入射角范围内的目标。

9. 发明授权

US06977720B2 Characterization of active and passive optical properties of an optical device 失效
标题翻译：光学器件的有源和无源光学特性的表征
公开(公告)号：US06977720B2
公开(公告)日：2005-12-20
申请号：US10634952
申请日：2003-08-05
申请人： Douglas M. Baney , Gregory D. VanWiggeren
发明人： Douglas M. Baney , Gregory D. VanWiggeren
IPC分类号： G01M11/00 , G01N21/00 , H04B3/46 , H04B10/08 , H04B17/00
CPC分类号： G01M11/336 , G01M11/331 , G01M11/335 , G01M11/337
摘要： Characterizing active and passive properties of an optical device involves applying a local oscillator signal to a device under test (DUT) and providing a portion of the local oscillator signal (referred to as the reference local oscillator signal) directly to the an optical analyzer. Providing the reference local oscillator signal to the optical analyzer enables interferometric measurements associated with the DUT to be obtained along with direct measurements, where the interferometric measurements result from combining the portion of the local oscillator signal that is applied to the DUT with the reference local oscillator signal. The interferometric measurements are used to characterize passive properties of the DUT while the direct measurements are used to characterize active properties of the DUT.
摘要翻译：表征光学器件的有源和无源特性包括将本地振荡器信号施加到被测器件（DUT），并将本地振荡器信号（称为参考本地振荡器信号）的一部分直接提供给光学分析器。将参考本地振荡器信号提供给光学分析器，可以实现与DUT直接测量相关联的干涉测量，其中干涉测量结果是将施加到DUT的本地振荡器信号的部分与参考本地振荡器信号。干涉测量用于表征DUT的被动特性，而直接测量用于表征DUT的有源特性。

10. 发明申请

US20090180105A1 Swept-Angle SPR Measurement System 有权
标题翻译：扫频角SPR测量系统
公开(公告)号：US20090180105A1
公开(公告)日：2009-07-16
申请号：US11941769
申请日：2007-11-16
申请人： Gregory D. VanWiggeren , Douglas M. Baney
发明人： Gregory D. VanWiggeren , Douglas M. Baney
IPC分类号： G01N21/41 , G01N21/55
CPC分类号： G01N21/553
摘要： A swept-angle SPR measurement system deflects an optical beam over a range of deflection angles according to a control signal and maps the deflected beam to a target within a range of incidence angles that corresponds to the range of deflection angles.
摘要翻译：扫掠角SPR测量系统根据控制信号在一定范围的偏转角度偏转光束，并将偏转光束映射到对应于偏转角范围的入射角范围内的目标。

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