发明申请
WO2023088665A1 TRAINING PREDICTION MODELS FOR PREDICTING UNDESIRED EVENTS DURING EXECUTION OF A PROCESS
审中-公开
基本信息:
- 专利标题: TRAINING PREDICTION MODELS FOR PREDICTING UNDESIRED EVENTS DURING EXECUTION OF A PROCESS
- 申请号:PCT/EP2022/080267 申请日:2022-10-28
- 公开(公告)号:WO2023088665A1 公开(公告)日:2023-05-25
- 发明人: ABUKWAIK, Hadil , SHARMA, Divyasheel , KLOEPPER, Benjamin , KOTRIWALA, Arzam Muzaffar , RODRIGUEZ, Pablo , SCHMIDT, Benedikt , TAN, Ruomu , K R, Chandrika , BORRISON, Reuben , DIX, Marcel , DOPPELHAMER, Jens
- 申请人: ABB SCHWEIZ AG
- 申请人地址: Bruggerstrasse 66
- 专利权人: ABB SCHWEIZ AG
- 当前专利权人: ABB SCHWEIZ AG
- 当前专利权人地址: Bruggerstrasse 66
- 代理机构: MAIWALD GMBH
- 优先权: EP21209620.0 2021-11-22
- 主分类号: G05B23/02
- IPC分类号: G05B23/02 ; G06N3/08
摘要:
A method (100) for training a prediction model (1) for predicting the likelihood that at least one predetermined undesired event will occur during execution of a process (2) using training samples (3), wherein each training sample (3) comprises data that characterizes a state of the process (2), and the method (100) comprises the steps of: obtaining (110) training samples (3) representing states of the process (2) that do not cause the undesired event, and labelling these training samples with a pre-set low likelihood of the undesired event occurring; obtaining (120), based at least in part on a process model (2a) and a set of predetermined rules (2b) that stipulate in which states of the process (2) there is an increased likelihood of the undesired event occurring, further training samples (4) representing states of the process (2) with an increased likelihood to cause the undesired event, and labelling these training samples (4) with said increased likelihood; providing (130) training samples (3, 4) to the to-be-trained prediction model (1), so as to obtain, from the prediction model (1), a prediction (5) of the likelihood for occurrence of the undesired event in a state of the process (2) represented by the respective sample (3, 4); rating (140) a difference between the prediction (5) and the label of the respective sample (3, 4) by means of a predetermined loss function (6); and optimizing (150) parameters (1a) that characterize the behavior of the prediction model (1), such that, when predictions (5) on further samples (3, 4) are made, the rating (6a) by the loss function (6) is likely to improve.
IPC结构图谱:
G | 物理 |
--G05 | 控制;调节 |
----G05B | 一般的控制或调节系统;这种系统的功能单元;用于这种系统或单元的监视或测试装置 |
------G05B23/00 | 控制系统或其部件的检验或监视 |
--------G05B23/02 | .电检验式监视 |