基本信息:
- 专利标题： FEATURE INSPECTION SYSTEM
- 申请号：PCT/US2022/042491 申请日：2022-09-02
- 公开(公告)号：WO2023034585A1 公开(公告)日：2023-03-09
- 发明人： HAYNES, Mark Davis , CORK, Glen Paul , RAO, Bharath Achyutha , BAUMFALK-LEE, John Thomas , MCKENNA, Matthew W. , GABEL, Bruce E. , BISHOP, Scott , BALANDRAN, Gregorio
- 申请人： SPIRIT AEROSYSTEMS, INC. , HAYNES, Mark Davis , CORK, Glen Paul , RAO, Bharath Achyutha , BAUMFALK-LEE, John Thomas , MCKENNA, Matthew W. , GABEL, Bruce E. , BISHOP, Scott , BALANDRAN, Gregorio
- 申请人地址： 3801 South Oliver Street; 118 W. Willow Road; 2718 Spring Meadow Circle; 3801 South Oliver Street; 3801 South Oliver Street; 3801 South Oliver Street; 10130 Bella Vista Ct.; 3801 South Oliver Street; 2117 S. Ironstone St.
- 专利权人： SPIRIT AEROSYSTEMS, INC.,HAYNES, Mark Davis,CORK, Glen Paul,RAO, Bharath Achyutha,BAUMFALK-LEE, John Thomas,MCKENNA, Matthew W.,GABEL, Bruce E.,BISHOP, Scott,BALANDRAN, Gregorio
- 当前专利权人： SPIRIT AEROSYSTEMS, INC.,HAYNES, Mark Davis,CORK, Glen Paul,RAO, Bharath Achyutha,BAUMFALK-LEE, John Thomas,MCKENNA, Matthew W.,GABEL, Bruce E.,BISHOP, Scott,BALANDRAN, Gregorio
- 当前专利权人地址： 3801 South Oliver Street; 118 W. Willow Road; 2718 Spring Meadow Circle; 3801 South Oliver Street; 3801 South Oliver Street; 3801 South Oliver Street; 10130 Bella Vista Ct.; 3801 South Oliver Street; 2117 S. Ironstone St.
- 代理机构： LUEBBERING, Thomas B.
- 优先权： US17/465,967 2021-09-03
- 主分类号： G06T7/00
- IPC分类号： G06T7/00 ; G01C11/02 ; G01C11/04 ; G01N21/88 ; G06T7/73 ; G06T7/292 ; H04N5/247 ; B64C39/02
摘要：
A system for inspecting features of an airframe, the system including a feature inspection device configured to measure an aspect of a first feature and a tracking subsystem configured to determine a position of the feature inspection device when the feature inspection device measures the aspect of the first feature. The system is configured to determine a position of the first feature on the airframe via the feature inspection device and the tracking subsystem, the determination of the position of the first feature being independent from the measurement of the aspect of the first feature.
IPC结构图谱:
| G | 物理 |
| --G06 | 计算；推算；计数 |
| ----G06T | 一般的图像数据处理或产生 |
| ------G06T7/00 | 图像分析，例如从位像到非位像 |