基本信息:
- 专利标题： ELECTRO-CONDUCTIVE CONTACT PIN AND VERTICAL PROBE CARD HAVING SAME
- 申请号：PCT/KR2022/012563 申请日：2022-08-23
- 公开(公告)号：WO2023033433A1 公开(公告)日：2023-03-09
- 发明人： AHN, Bum Mo , PARK, Seung Ho , HONG, Chang Hee
- 申请人： POINT ENGINEERING CO., LTD.
- 申请人地址： 89, Asanvalley-ro, Dunpo-myeon
- 专利权人： POINT ENGINEERING CO., LTD.
- 当前专利权人： POINT ENGINEERING CO., LTD.
- 当前专利权人地址： 89, Asanvalley-ro, Dunpo-myeon
- 代理机构： CHOI, Kwang Seok
- 优先权： KR10-2021-0114416 2021-08-30
- 主分类号： G01R1/073
- IPC分类号： G01R1/073 ; G01R1/067
摘要：
Proposed are an electro-conductive contact pin capable of effectively testing the electrical characteristics of a test object without a body thereof being elastically bent or curved in a convex shape in the horizontal direction by pressure applied to opposite ends thereof, and a vertical probe card having the same.