基本信息:
- 专利标题: METROLOGY SYSTEM AND COHERENCE ADJUSTERS
- 申请号:PCT/EP2021/084043 申请日:2021-12-02
- 公开(公告)号:WO2022122560A1 公开(公告)日:2022-06-16
- 发明人: SOKOLOV, Sergei , HUISMAN, Simon, Reinald , LIAN, Jin , GOORDEN, Sebastianus, Adrianus , ERALP, Muhsin , PELLEMANS, Henricus, Petrus, Maria , KREUZER, Justin, Lloyd
- 申请人: ASML NETHERLANDS B.V. [NL]/[NL] , ASML HOLDING N.V. [NL]/[NL]
- 专利权人: ASML NETHERLANDS B.V. [NL]/[NL],ASML HOLDING N.V. [NL]/[NL]
- 当前专利权人: ASML NETHERLANDS B.V. [NL]/[NL],ASML HOLDING N.V. [NL]/[NL]
- 代理机构: ASML NETHERLANDS B.V.
- 优先权: US63/122,619 2020-12-08
- 主分类号: G01N21/95
- IPC分类号: G01N21/95 ; G01N21/956 ; G02B6/36 ; G02B6/00
摘要:
A metrology system (400) includes a multi-source radiation system. The multi-source radiation system includes a waveguide device (502) and the multi-source radiation system is configured to generate one or more beams of radiation. The metrology system (400) further includes a coherence adjuster (500) including a multimode waveguide device (504). The multimode waveguide device (504) includes an input configured to receive the one or more beams of radiation from the multi-source radiation system (514) and an output (518) configured to output a coherence adjusted beam of radiation for irradiating a target (418). The metrology system (400) further includes an actuator (506) coupled to the waveguide device (502) and configured to actuate the waveguide device (502) so as to change an impingement characteristic of the one or more beams of radiation at the input of the multimode waveguide device (504).
IPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01N | 借助于测定材料的化学或物理性质来测试或分析材料 |
------G01N21/00 | 利用光学手段,即利用红外光、可见光或紫外光来测试或分析材料 |
--------G01N21/01 | .便于进行光学测试的装置或仪器 |
----------G01N21/88 | ..测试瑕疵、缺陷或污点的存在 |
------------G01N21/95 | ...特征在于待测物品的材料或形状 |