基本信息:
- 专利标题: IMAGE DISTORTION CORRECTION FOR X-RAY DETECTOR
- 申请号:PCT/US2020/063119 申请日:2020-12-03
- 公开(公告)号:WO2021113518A1 公开(公告)日:2021-06-10
- 发明人: GLATZMAIER, Michael , SCHLECHT, Joseph , FERLEY, Eric
- 申请人: ILLINOIS TOOL WORKS INC.
- 申请人地址: 155 Harlem Avenue
- 专利权人: ILLINOIS TOOL WORKS INC.
- 当前专利权人: ILLINOIS TOOL WORKS INC.
- 当前专利权人地址: 155 Harlem Avenue
- 代理机构: YOUNG, Joseph E.
- 优先权: US16/950,765 2020-11-17
- 主分类号: G01N23/04
- IPC分类号: G01N23/04 ; G06T5/00 ; G01N23/046
摘要:
Techniques are disclosed for identifying and reducing pixel-specific image distortion of an x-ray detector. In one example, an x-ray detector obtains, for various calibration positions, two-dimensional (2D) images of a calibration object. The calibration object comprises reference points that comprise spatial characteristics. Processing circuitry computes an image distortion field across a plurality of pixels of the x-ray detector based on imaged characteristics of the reference points in each of the 2D images, the spatial characteristics of the reference points, and the calibration positions. The processing circuitry computes, based on the computed image distortion field, a correction transform for correcting image distortion across the x-ray detector. The processing circuitry applies the correction field to a preliminary image obtained by the x-ray detector to obtain a corrected image exhibiting reduced pixel-specific image distortion.
IPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01N | 借助于测定材料的化学或物理性质来测试或分析材料 |
------G01N23/00 | 利用未包括在G01N21/00或G01N22/00组内的波或粒子辐射来测试或分析材料,例如X射线、中子 |
--------G01N23/02 | .通过使辐射透过材料 |
----------G01N23/04 | ..并形成图像 |