基本信息:
- 专利标题： ANTI-REFLECTIVE SURFACE STRUCTURES
- 申请号：PCT/IB2018/060527 申请日：2018-12-21
- 公开(公告)号：WO2019130198A1 公开(公告)日：2019-07-04
- 发明人： HEBRINK, Timothy J. , PETT, Todd G. , DAVID, Moses M. , BURKE, James P. , JONES, Vivian W. , ZHANG, Haiyan
- 申请人： 3M INNOVATIVE PROPERTIES COMPANY
- 申请人地址： 3M Center Post Office Box 33427 Saint Paul, Minnesota 55133-3427 US
- 专利权人： 3M INNOVATIVE PROPERTIES COMPANY
- 当前专利权人： 3M INNOVATIVE PROPERTIES COMPANY
- 当前专利权人地址： 3M Center Post Office Box 33427 Saint Paul, Minnesota 55133-3427 US
- 代理机构： ALLEN, Gregory D., et al.
- 优先权： US62/611,636 20171229
- 主分类号： H01L31/048
- IPC分类号： H01L31/048 ; B32B3/30 ; G02B1/118
摘要：
Anti-reflective article includes a layer defining an anti-reflective surface. The anti-reflective surface includes a series of alternating micro-peaks and micro-spaces extending along an axis. The surface also includes a series of nano-peaks extending along an axis. The nano-peaks are disposed at least on the micro-spaces and, optionally, the micro-peaks. The article may be disposed on a photovoltaic module or skylight to reduce reflections and resist the collection of dust and dirt.
IPC结构图谱:
| H | 电学 |
| --H01 | 基本电气元件 |
| ----H01L | 半导体器件；其他类目未包含的电固体器件 |
| ------H01L31/00 | 对红外辐射、光、较短波长的电磁辐射，或微粒辐射敏感的，并且专门适用于把这样的辐射能转换为电能的，或者专门适用于通过这样的辐射进行电能控制的半导体器件；专门适用于制造或处理这些半导体器件或其部件的方法或设备；其零部件 |
| --------H01L31/02 | .零部件 |
| ----------H01L31/042 | ..包括光电池板或阵列，如太阳电池板或阵列 |
| ------------H01L31/048 | ...封装的或有外壳的 |