基本信息:
- 专利标题： SYSTEM FOR ANALYZING IMPACT AND PUNCTURE RESISTANCE
- 申请号：PCT/US2018/030298 申请日：2018-04-30
- 公开(公告)号：WO2019027522A1 公开(公告)日：2019-02-07
- 发明人： MCCARTY II, Donald L. , SUTANTO, Erick , LUND, John , GLAD, Brayden E. , SINGH, Hitendra
- 申请人： DOW GLOBAL TECHNOLOGIES LLC , ROHM AND HAAS COMPANY
- 申请人地址： 2040 Dow Center Midland, Michigan 48674 US
- 专利权人： DOW GLOBAL TECHNOLOGIES LLC,ROHM AND HAAS COMPANY
- 当前专利权人： DOW GLOBAL TECHNOLOGIES LLC,ROHM AND HAAS COMPANY
- 当前专利权人地址： 2040 Dow Center Midland, Michigan 48674 US
- 代理机构： SCHWARZ, Steven J.
- 优先权： US62/539,381 20170731
- 主分类号： G01N3/42
- IPC分类号： G01N3/42
摘要：
A method and a system for analyzing a physical characteristic of a film sample are described herein. The system includes a material holder system configured to hold the film sample; a dart testing system configured to test a physical characteristic of the film sample; and a moving system configured to move the held film sample to be analyzed or tested between stations. The moving system is configured to move the held film sample in the material holder system to the dart testing system.
IPC结构图谱:
| G | 物理 |
| --G01 | 测量；测试 |
| ----G01N | 借助于测定材料的化学或物理性质来测试或分析材料 |
| ------G01N3/00 | 用机械应力测试固体材料的强度特性 |
| --------G01N3/30 | .用一次冲击力 |
| ----------G01N3/42 | ..用压头在稳定载荷下压印，例如球形压头，棱锥形压头 |